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Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460067
EISBN: 978-1-62708-285-3
... – 71 10.1016/S0257-8972(98)00709-9 3.8 Li W.Y. , Zhang D.D. , Huang C.J. , Yin S. , Yu M. , Wang F.F. , and Liao H.L. , Modelling of Impact Behaviour of Cold Spray Particles: Review , Surf. Eng. , Vol 30 ( No. 5 ), 2014 , p 299 – 308 10.1179...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410163
EISBN: 978-1-62708-265-5
... and Control of Steel Cleanliness , ISIJ Int. , Vol 43 , 2003 , p 271 – 291 10.2355/isijinternational.43.271 9.6 Kaushik P. and Yin H. , Thermodynamics, Engineering and Chracterization of Inclusions in Advanced High-Strength Steels , Iron and Steel Technology , December 2012 , p...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 30 April 2020
DOI: 10.31399/asm.tb.bpapp.t59290009
EISBN: 978-1-62708-319-5
... and Deflection of Nonconventional Droplet Streams Formed from Capillary Stream Breakup , Phys. Fluids , Vol 12 ( No. 9 ), 2000 , p 2224 – 2235 10.1063/1.1287653 2. Yin J. , Dattani R. , Clayton J. , Bai Y. , Reidy J.P. , Craven C. , Hudelson S. , Winter G. , Gibson...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110016
EISBN: 978-1-62708-247-1
... to acknowledge following people for their contributions to this publication: Joseph Vu, Jose Hulog, Mario Vargas, Edita Madriaga-Berry, Rei Fang, and Max Sidorov from Cypress San Jose FA and MCL Labs for sharing device analysis data and images TK Lim, Hoi-Yin Go and Lai-Seng Yeoh from Cypress Penang FA...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110335
EISBN: 978-1-62708-247-1
... Sectioning for Examination of Photoreceptor Cell Architecture by Focused Ion Beam Technology. ” Journal of Neuroscience Methods 198 , no. 1 ( 2011 ): 70 – 76 . 10.1016/j.jneumeth.2011.03.013 [60] Kidd Grahame J. , Avishai Amir , Yin Xinghua , and Trapp Bruce D. . “ Three...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110228
EISBN: 978-1-62708-247-1
... International Symposium for Testing and Failure Analysis: November 13-17, 2011 , San Jose Convention Center, San Jose, California, USA (p. 158 ). ASM International . [14] Shaw J. , Christopher M. , Yin S. N. , & Felix B. , ( 2008 , November ). Dual Port RAM MBIST Failure...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110244
EISBN: 978-1-62708-247-1
... Voltage Imaging and Its Derivatives, Efficient Techniques to Address Defect on 28 nm Technology ”, Proceedings from the 39th International Symposium for Testing and Failure Analysis (ISTFA) , ( 2013 ) [25] Yin S Ng , et al. , “ Laser Voltage Imaging: A new Perspective of Laser Voltage Probing...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460017
EISBN: 978-1-62708-285-3
.... , Influence of Substrate Temperature on Adhesion Strength of Cold-Sprayed Coatings , J. Therm. Spray Technol. , Vol 24 , Issue 1 , p 86 – 91 2.107 Yin S. , Suo X. , Xie Y. , Li W. , Lupoi R. , and Liao H. , Effect of Substrate Temperature on Interfacial Bonding...
Series: ASM Technical Books
Publisher: ASM International
Published: 30 April 2020
DOI: 10.31399/asm.tb.bpapp.t59290201
EISBN: 978-1-62708-319-5