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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110001
EISBN: 978-1-62708-247-1
... State Technology , 2010 . [9] Mekkoth J J. et al. , “ Yield Learning with Layout-aware Advanced Scan Diagnosis ,” Proc Int’l Symp for Testing and Failure Analysis , 2006 , pp. 208 – 418 . [10] Goh S.H. , Yeoh B. L. , You G.F. , Lam Jeffrey , “ Yield-Oriented...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110016
EISBN: 978-1-62708-247-1
... to acknowledge following people for their contributions to this publication: Joseph Vu, Jose Hulog, Mario Vargas, Edita Madriaga-Berry, Rei Fang, and Max Sidorov from Cypress San Jose FA and MCL Labs for sharing device analysis data and images TK Lim, Hoi-Yin Go and Lai-Seng Yeoh from Cypress Penang FA...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110228
EISBN: 978-1-62708-247-1
... the 40th International Symposium for Testing and Failure Analysis (p. 396 ). ASM International . [6] Yeoh BL , Goh SH , Chan YU , You GF , Koh YE , Lam Jeffrey ( 2013 ). Optimization of Soft Defect Localization Technique Scan Time Using Dummy Subroutine Test Vector...