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Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220069
EISBN: 978-1-62708-259-4
... microscope is used, depth of field is quite low (typically in the 200 nm to 8 mm range, depending on the magnification—the higher the magnification, the lower the depth of field. Thus, if one wishes to observe the whole sample surface in focus, it is essential that the sample be quite flat and the surface...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780057
EISBN: 978-1-62708-268-6
... (certainly much higher than component failure rates). Normal Event Probabilities The failure analysis team can determine normal event probabilities by assessing the likelihood of the event occurring. For example, suppose one wishes to assess the probability of an on-off switch being in the ON position...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110413
EISBN: 978-1-62708-247-1
... convergence angle is needed to produce a large depth of field and to reduce lens aberrations such as spherical aberration that can ruin an image. Given that we wish to have a large current in a small spot and a small convergence angle, we can define a quantity called Brightness β which can be calculated from...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2008
DOI: 10.31399/asm.tb.ssde.t52310281
EISBN: 978-1-62708-286-0
... on a single computer, and installation on a network system is not supported. If you wish to run the software after the demo license has expired, it can be downloaded again (i.e., obtaining a new demo license). ...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780011
EISBN: 978-1-62708-268-6
... not drilled,” “weld porosity,” and “paint runs” are the most frequently occurring nonconformances. This suggests that if the manufacturer wishes to reduce the defect frequency, attention should be focused in these areas. As mentioned earlier, the manufacturer can also prepare a Pareto chart to show...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230107
EISBN: 978-1-62708-298-3
... , The National Chemical Laboratory Bolomey R.A. , and Wish L.J. , 1950 . Thenol Trifluoride Acetone as a Complexing Agent for Isolation and Purification of Carrier-Free Radioberyllium , J. Am. Chem. Soc. , Vol 72 , p 4483 – 4486 10.1021/ja01166a042 Bowie S.H.U. , Burke K.C...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2000
DOI: 10.31399/asm.tb.ttg2.t61120001
EISBN: 978-1-62708-269-3
... the reader to glean enough information to satisfy his or her immediate requirements. After reading the primer, the reader might wish to refer to the Contents and the Index to locate more information about specific topics. Helpful information can also be found in the Glossary ( Appendix J ) and the list...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780305
EISBN: 978-1-62708-281-5
..., strain, dilation, distortion strain energy, or stress bias. Researchers ( Ref 43 ) evaluated all these criteria and concluded that critical strain is the most consistent. However, from a practical standpoint, a designer may wish to test either under constant strain or constant load, based on in-service...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780067
EISBN: 978-1-62708-268-6
... wish to subjectively eliminate selected hypothesized failure causes by changing their assessment from “unknown” to “unlikely.” In some cases, this may make sense, but the team must review such decisions carefully. Recall that in the case of recurring failures, the causes are not going to be obvious...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780047
EISBN: 978-1-62708-268-6
... as either normal events (if they are normally present) going into an INHIBIT gate (indicating the magnitude was sufficient) or undeveloped events if the failure analysis team wishes to show that such events are hypothetically possible. Human error: A human error means that a human being does not do...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180127
EISBN: 978-1-62708-256-3
... and that the pin had failed by overload. I wish I had the crystal ball some program managers seem to have hidden in their desks. The crazy part of this situation was that it took more time to persuade the program manager than to perform the visual and SEM examinations. These examinations proved the failure...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780081
EISBN: 978-1-62708-268-6
... with the relative humidity and temperature on that date. Sometimes, how material is stored influences how it performs. The failure analysis team may wish to determine if materials associated with any of the hypothesized failure causes experienced changes in storage environments. For epoxies and composite raw...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2006
DOI: 10.31399/asm.tb.fdsm.t69870009
EISBN: 978-1-62708-344-7
..., or for a material after the major amount of hardening or softening has been completed. The analyst who wishes to take account of the early life when hardening or softening may be pronounced may wish to use changing templates that reflect the changes in hardness, which is dictated by his or her judgment...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2006
DOI: 10.31399/asm.tb.fdsm.t69870375
EISBN: 978-1-62708-344-7
... herein can be found in classic books devoted to their subject in much more sophisticated and inclusive form. References A.1 to A.24 are but examples of such books, and the reader wishing more complete background on any one of the subjects discussed is referred to these books and to numerous others...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
... approaches outlined previously. If the component fractured in a manner indicating a fatigue failure, the part can be tested for its resistance to fatigue loading. Most frequently, the hardness test is used for this assessment. In some cases, the failure analysis team may wish to subject the part...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2000
DOI: 10.31399/asm.tb.ttg2.t61120005
EISBN: 978-1-62708-269-3
... with the unalloyed grades, palladium-containing pure grades, and Ti-6Al-4V. Ti-3A1-8V-6Cr-4Zr-4Mo (also called beta C) was approved for use in deep, sour-well technology. Other alloys are in various stages of use. The reader may wish to refer to Appendix A (“Summary Table of Titanium Alloys”) and/or Appendix...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2006
DOI: 10.31399/asm.tb.fdsm.t69870075
EISBN: 978-1-62708-344-7
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110402
EISBN: 978-1-62708-247-1
... involves cuts on the order of tens of microns in length to avoid significant milling time, which limits the size of the analytical region. Therefore, if a customer wishes to view a region on the order of hundreds of microns to millimeters long, mechanical polishing is generally the optimal method...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110634
EISBN: 978-1-62708-247-1
... to supply correct, robus and reliable products to the marketplace. The authors wish to thank Wojciech Maly for providing the motivation for exploring many of these technical issues. We would also like to acknowledge Brian Kessler for providing information related to embedded memory testing. Contact...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2007
DOI: 10.31399/asm.tb.smnm.t52140117
EISBN: 978-1-62708-264-8
... pamphlet, called On Steel and Iron , gives several recipes for hardening steel, one of which is: “Take the stems and leaves of vervain, crush them, and press the juice through a cloth. Pour the juice into a glass vessel and lay it aside. When you wish to harden a piece of iron, add an equal amount...