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Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2008
DOI: 10.31399/asm.tb.ssde.t52310281
EISBN: 978-1-62708-286-0
... will run for approximately 1 month on a single computer, and installation on a network system is not supported. If you wish to run the software after the demo license has expired, it can be downloaded again (i.e., obtaining a new demo license). References References 1 Andersson J.O...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780057
EISBN: 978-1-62708-268-6
... probabilities by assessing the likelihood of the event occurring. For example, suppose one wishes to assess the probability of an on-off switch being in the ON position when it is supposed to be. If it is assumed the system is already operating, the probability of the normal event “Power switch in ON position...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220069
EISBN: 978-1-62708-259-4
... aperture (which also is discussed in Chapter 4 ). When an optical microscope is used, depth of field is quite low (typically in the 200 nm to 8 mm range, depending on the magnification—the higher the magnification, the lower the depth of field. Thus, if one wishes to observe the whole sample surface...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110413
EISBN: 978-1-62708-247-1
... for the detector. A small convergence angle is needed to produce a large depth of field and to reduce lens aberrations such as spherical aberration that can ruin an image. Given that we wish to have a large current in a small spot and a small convergence angle, we can define a quantity called Brightness β which...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780011
EISBN: 978-1-62708-268-6
... occurring nonconformance, the next most frequently occurring nonconformance, and so on. This Pareto chart shows that “hole not drilled,” “weld porosity,” and “paint runs” are the most frequently occurring nonconformances. This suggests that if the manufacturer wishes to reduce the defect frequency...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2000
DOI: 10.31399/asm.tb.ttg2.t61120001
EISBN: 978-1-62708-269-3
... might wish to refer to the Contents and the Index to locate more information about specific topics. Helpful information can also be found in the Glossary ( Appendix J ) and the list of Symbols ( Appendix I ). Why Use Titanium and Its Alloys? Titanium was discovered in 1790 but not purified until...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780067
EISBN: 978-1-62708-268-6
... necessary to rule the hypothesized cause in or out. If all of the failure analysis team members are included in this discussion, the methods proposed for making this assessment are more meaningful. Some of the failure analysis team members may wish to subjectively eliminate selected hypothesized failure...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230107
EISBN: 978-1-62708-298-3
... with cold caustic soda. Solvent extraction procedures are of importance in connection with beryllium radiochemistry; those involving acetylacetone [ Toribara and Chen 1952 ], thenoyltrifluoro-acetone (TTA) [ Bolomey and Wish 1950 ], and the chloroform extraction of beryllium oxide acetate are typical...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780305
EISBN: 978-1-62708-281-5
... essentially determines whether the service life objective is met. The engineer who wishes to work with thermoplastics in a given environment needs to consider particular questions and problems: Why certain environments promote crazing in polymers under stress How to identify environments...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780047
EISBN: 978-1-62708-268-6
.... These events would most likely be modeled as either normal events (if they are normally present) going into an INHIBIT gate (indicating the magnitude was sufficient) or undeveloped events if the failure analysis team wishes to show that such events are hypothetically possible. Human error: A human error...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780081
EISBN: 978-1-62708-268-6
... how it performs. The failure analysis team may wish to determine if materials associated with any of the hypothesized failure causes experienced changes in storage environments. For epoxies and composite raw materials, for example, storage temperature is critical. Moving raw materials to a different...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180127
EISBN: 978-1-62708-256-3
... and that the pin had failed by overload. I wish I had the crystal ball some program managers seem to have hidden in their desks. The crazy part of this situation was that it took more time to persuade the program manager than to perform the visual and SEM examinations. These examinations proved the failure...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
... be tested for its resistance to fatigue loading. Most frequently, the hardness test is used for this assessment. In some cases, the failure analysis team may wish to subject the part to repetitive stress fluctuations to measure its life against varying levels of stress fluctuation, although this is a fairly...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2000
DOI: 10.31399/asm.tb.ttg2.t61120005
EISBN: 978-1-62708-269-3
... operations have been concerned principally with the unalloyed grades, palladium-containing pure grades, and Ti-6Al-4V. Ti-3A1-8V-6Cr-4Zr-4Mo (also called beta C) was approved for use in deep, sour-well technology. Other alloys are in various stages of use. The reader may wish to refer to Appendix...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2006
DOI: 10.31399/asm.tb.fdsm.t69870009
EISBN: 978-1-62708-344-7
... origin at the reversal point from which the intersected hysteresis loop was constructed. This treatment is for the cycling of either a material that displays no hardening or softening, or for a material after the major amount of hardening or softening has been completed. The analyst who wishes...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2006
DOI: 10.31399/asm.tb.fdsm.t69870375
EISBN: 978-1-62708-344-7
... books devoted to their subject in much more sophisticated and inclusive form. References A.1 to A.24 are but examples of such books, and the reader wishing more complete background on any one of the subjects discussed is referred to these books and to numerous others that can be found in libraries. Our...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1995
DOI: 10.31399/asm.tb.sch6.t68200144
EISBN: 978-1-62708-354-6
..., but increases its variability. Since the flat fillet is normal in welding, its effect must be carefully considered unless the designer wishes to specify the rather expensive step of contouring the weld by grinding. Steel castings, however, are easily contoured and streamlined closely to any shape desired...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2006
DOI: 10.31399/asm.tb.fdsm.t69870075
EISBN: 978-1-62708-344-7
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110402
EISBN: 978-1-62708-247-1
... on the order of milimeters in length. In comparison, FIB sample preparation typically involves cuts on the order of tens of microns in length to avoid significant milling time, which limits the size of the analytical region. Therefore, if a customer wishes to view a region on the order of hundreds...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110634
EISBN: 978-1-62708-247-1
... in test methodologies that promise to continue to allow IC manufacturers to supply correct, robus and reliable products to the marketplace. Acknowledgements The authors wish to thank Wojciech Maly for providing the motivation for exploring many of these technical issues. We would also like...