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wavelength-dispersive X-ray fluorescence spectroscopy

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Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... film deposits X-ray fluorescence with energy dispersive detectors have a threshold sensitivity of ~0.02% and a precision for quantitative analysis of ~1% relative, or 0.02% absolute, depending on count time. The detection threshold and precision for wavelength dispersive detectors is a threshold...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... detector scanning transmission electron microscope-EDS silicon drift detector wavelength dispersive X-ray detector Introduction By far the most common micro-analytical technique in the failure analysis laboratory is energy dispersive x-ray spectroscopy, known as EDX or EDS. It is commonly...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... on spectroscopy principles such as optical emission spectroscopy, energy dispersive spectroscopy (EDS), wavelength dispersive spectroscopy, x-ray fluorescence spectroscopy (XRF), and x-ray photoelectron spectroscopy (XPS). Techniques based on diffraction principles such as x-ray diffraction (XRD), electron...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
... microanalysis (EPMA) is a materials analysis technique that can be bundled with an SEM. Instead of relying on x-ray energy (as in the EDAX approach), EPMA uses a wavelength-dispersive spectrometer that is approximately an order of magnitude better than EDAX at detecting elemental peaks. That fact...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
...) or wavelength-dispersive spectroscopy (WDS). The equipment possesses a lateral resolution of 1 to 50 nm in the secondary electron mode. Energy-dispersive x-ray spectroscopy can provide a rapid multielement analysis for Z > 11, with a detection limit of approximately 200 ppm. Wavelength-dispersive...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... >10 μm <100 ppm Moderate Raman Chemical structure >1 μm >1 μm <0.1 at.% Difficult Note: EDS, energy-dispersive spectroscopy; WDS, wavelength-dispersive spectroscopy; AES, Auger electron spectroscopy; XPS, x-ray photoelectron spectroscopy; TOF-SIMS, time-of-flight secondary...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
.... Surface Chemical Analysis A variety of analytical techniques and tools have been developed to provide investigators with information regarding the chemical composition of surface constituents ( Table 1 ). Energy-dispersive and wavelength-dispersive x-ray spectrometers are employed as accessories...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 1997
DOI: 10.31399/asm.tb.wip.t65930039
EISBN: 978-1-62708-359-1
... and microsegregation, and the properties may be governed by the composition in a very local region. A thorough characterization of welds requires techniques with sufficient spatial resolution to characterize their inhomogeneity. Scanning electron microscopy with wavelength or energy dispersive x-ray analysis systems...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.9781627082532
EISBN: 978-1-62708-253-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 1998
DOI: 10.31399/asm.tb.ts5.t65900045
EISBN: 978-1-62708-358-4
... extraction ( Ref 7 ). Electron microprobes use single-crystal spectrometers set to diffract only the radiation from a given element, a process referred to as wavelength dispersive spectroscopy (WDS) and which is capable of high-precision chemical analysis. Characteristic x-ray intensity from the chemical...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610549
EISBN: 978-1-62708-303-4
... microscopy because of the large depth of field and very high magnifications attainable, typically 5000 to 10,000×. In addition, SEMs are often equipped with microanalytical capabilities, for example, energy-dispersive x-ray spectroscopes. Chemical analysis can be helpful in confirming the chemistry...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180151
EISBN: 978-1-62708-256-3
... done with an SEM. An SEM has the advantage over light microscopy because of the large depth of field and very high magnifications attainable, typically 5000 to 10,000×. In addition, SEMs are often equipped with microanalytical capabilities, for example, energy-dispersive x-ray (EDX) spectroscopes...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2008
DOI: 10.31399/asm.tb.fahtsc.t51130111
EISBN: 978-1-62708-284-6
... according to their energy. This is called energy-dispersive x-ray analysis. The x-ray wavelength corresponds to the presence of a specific element, and its amplitude corresponds to the quantity of such element. This technique allows quantitative characterization of elements within a given phase. Bulk...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.mnm2.t53060429
EISBN: 978-1-62708-261-7
... to aging in ferrous alloys, natural or artificial ag- 10-10 m, or 0.1 nm (nanometer), sometimes ing in ferrous and nonferrous alloys) or after a used to express small distances such as inter- cold working operation (strain aging). The atomic distances and some wavelengths. change in properties is often...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.mnm2.9781627082617
EISBN: 978-1-62708-261-7
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110524
EISBN: 978-1-62708-247-1
... are either scribed and broken or diced with a wafer saw. Great care must be taken to not induce damage at the chip edge in many designs, since such damage can subsequently result in defects that will later grow to cause problems. A common chip size is 250 x 350 µm – visible by the unaided eye, but only...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.9781627082600
EISBN: 978-1-62708-260-0
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2006
DOI: 10.31399/asm.tb.cw.t51820013
EISBN: 978-1-62708-339-3
.... Details of the welding consumables and significant alloying elements are given in Table 4 . Figure 2 shows the average calculated electrochemical impedance spectroscopy (EIS) corrosion rates between 5 and 10 days from a low chloride (0.35 g/L NaCl) test. Welding details for the preferential weld...