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wavelength dispersive X-ray detector

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... scanning electron microscope chamber including the lithium-drifted EDS detector, silicon drift detector (SDD), and wavelength dispersive X-ray detector. The article then provides information on qualitative and quantitative X-ray analysis programs followed by a discussion on EDS elemental mapping. The...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... film deposits X-ray fluorescence with energy dispersive detectors have a threshold sensitivity of ~0.02% and a precision for quantitative analysis of ~1% relative, or 0.02% absolute, depending on count time. The detection threshold and precision for wavelength dispersive detectors is a threshold...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2012
DOI: 10.31399/asm.tb.lmub.t53550193
EISBN: 978-1-62708-307-2
... as a window material in x-ray tubes and detectors such as those used in energy-dispersive analysis of x-ray equipment. Powder metallurgy is required for a number of reasons, the primary one being that beryllium castings contain too much porosity and other casting defects to allow their use in...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
...) is a materials analysis technique that can be bundled with an SEM. Instead of relying on x-ray energy (as in the EDAX approach), EPMA uses a wavelength-dispersive spectrometer that is approximately an order of magnitude better than EDAX at detecting elemental peaks. That fact notwithstanding, EDAX is...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.9781627082815
EISBN: 978-1-62708-281-5
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110042
EISBN: 978-1-62708-247-1
...   ( 6   microns ) 0.100   microns ∼   ​ 120 x For this deep UV example it can be seen that a 100x lens just will not be enough. For an infrared example, the author has used a thermal infrared microscope working at 3 microns wavelength to measure junction temperatures. The...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110335
EISBN: 978-1-62708-247-1
... resolution has contributed to the adoption of the method across many disciplines in materials science and biology [21 - 22 , 58 - 61] . FIB-SEM tomography fills an important gap between TEM analysis and X-Ray tomography [61] . The more recent introduction of plasma FIBs has significantly expanded the...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.9781627082600
EISBN: 978-1-62708-260-0