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volume defects

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2008
DOI: 10.31399/asm.tb.emea.t52240017
EISBN: 978-1-62708-251-8
... an important role in processes such as deformation, annealing, precipitation, diffusion, and sintering. All defects and imperfections can be conveniently classified under four main divisions: point defects, line defects, planar defects, and volume defects. This chapter provides a detailed discussion...
Series: ASM Technical Books
Publisher: ASM International
Published: 31 December 2020
DOI: 10.31399/asm.tb.phtbp.t59310001
EISBN: 978-1-62708-326-3
...-packed, and body-centered cubic. It then describes the four main divisions of crystal defects, namely point defects, line defects, planar defects, and volume defects. The chapter provides information on grain boundaries of metals, processes involved in atomic diffusion, and key properties of a solid...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2021
DOI: 10.31399/asm.tb.ciktmse.t56020001
EISBN: 978-1-62708-389-8
... and interstitial sites, ion migration, volume expansion, antisite defects, edge and screw dislocations, slip planes, twinning planes, and dislocation passage through precipitates. It also points out important structure-property correlations. References References 1. Liu Y.-X. and Lin Y.C...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110634
EISBN: 978-1-62708-247-1
... discussed have driven the development of novel focus areas in test and the chapter discusses several of those areas, including test data volume containment, test power containment, and novel methods of defect-based test. analog circuit testing built-in self-testing functional testing integrated...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220129
EISBN: 978-1-62708-259-4
...,” in this book; this contraction or shrinkage is largely counteracted by the formation of graphite, which has low density.) This change of volume may induce the formation of different shrinkage defects, such as porosity and pipe, and may contribute to liquid movement during solidification. These movements...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420363
EISBN: 978-1-62708-310-2
..., crystalline imperfections, and the formation of surface or planar defects. It also discusses the use of X-ray diffraction for determining crystal structure. crystalline structures line defects metallic structure planar defects plastic deformation point defects volume defects X-ray diffraction...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110101
EISBN: 978-1-62708-247-1
... for scan chain defects. An additional strategy to reduce fail data volume and the test time impact was to use sampling. In the initial phase of the yield learning when volume of material being processed was low, all failing dies on all wafers in a lot were analyzed. Later in the middle phase...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110062
EISBN: 978-1-62708-247-1
... samples’ position and view multiple angles to make real-time observations. Some manufacturers have also provided integration to CAD design data to allow live overlay on 3D X-ray images for direct comparison and defect analysis [10] . During the past decade, the increasing complexity and 3D nature...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610585
EISBN: 978-1-62708-303-4
... Abstract This appendix provides detailed information on design deficiencies, material and manufacturing defects, and service-life anomalies. It covers ingot-related defects, forging and sheet forming imperfections, casting defects, heat treating defects, and weld discontinuities. It shows how...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.mnm2.t53060013
EISBN: 978-1-62708-261-7
... positive and negative ways. They can play an important role in processes such as mechanical deformation, annealing, precipitation, diffusion, and sintering. And these defects and imperfections can be conveniently classified under four main divisions: point defects, line defects, planar defects, and volume...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2008
DOI: 10.31399/asm.tb.fahtsc.t51130151
EISBN: 978-1-62708-284-6
.... In the majority of cases, this transformation is followed by a density increase ( Fig. 8 ) and thus a shrinkage, because the metal as a liquid occupies a larger volume than in the solid state. The defect known as shrinkage pores can be characterized as the appearance of non-superficial cavities in the casting...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720393
EISBN: 978-1-62708-305-8
..., and nondestructive testing. This chapter is a detailed account of these testing methods. It describes the four most common types of defects in P/M parts, namely ejection cracks, density variations, microlaminations, and poor sintering. The chapter discusses the capabilities and limitations of various nondestructive...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110001
EISBN: 978-1-62708-247-1
... root cause that has the most impact on yield. A 100% failure analysis success based on a couple of worse failing dies is no longer meaningful to yield. To ensure a fast product yield ramp-up, a prompt, conclusive, defect-learning approach is necessary in order to devise a precise corrective action...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... quantity is present within the volume analyzed. In failure analysis, EDS is commonly used to identify elemental composition of defects and anomalies. Such analysis can be easily convoluted by spurious x-ray signals from material surrounding the defect. For example, copper grids ( Figures 5 and 6...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.tb.aacppa.t51140047
EISBN: 978-1-62708-335-5
... into the forming void. The important measures of these pores—morphology, pore density, pore size, and volume fraction of pores—are affected by hydrogen. The conventional wisdom is that hydrogen voids are always rounded, smooth surface defects, while shrinkage voids invariably have the characteristic...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110550
EISBN: 978-1-62708-247-1
... for failure analysis of complex packages. Packaging FA Workflow From Failure to Defect Found The packaging failure analysis workflow ( Figure 1 ) plots the course of an analysis from the discovery of a failure to the identification of root cause. This path is often iterative and starts...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2008
DOI: 10.31399/asm.tb.fahtsc.t51130255
EISBN: 978-1-62708-284-6
..., and the potential micro-structural transformations that are possible for a given steel are illustrated by their CCT or TTT diagrams. Furthermore, dimensional changes depend on carbon content and the microstructural transformation product formed. Table 1 summarizes the atomic volumes of various micro-structural...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030137
EISBN: 978-1-62708-349-2
... the structure of composite materials is essential for understanding how the part will perform in service. Assessing fiber volume variations, void content, ply orientation variability, and foreign object inclusions helps in preventing degradation of composite performance. This chapter describes the optical...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.scm.t52870333
EISBN: 978-1-62708-314-0
... during curing, they normally result in either the need for a repair or scrapping of the part if the foreign object is large enough or located in a highly stressed area. The cure process can also result in defects, the most serious being porosity and voids. If an adhesive bonding operation is involved...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110025
EISBN: 978-1-62708-247-1
... Abstract In embedded systems, the separation between system level, board level, and individual component level failure analysis is slowly disappearing. In order to localize the initial defect area, prepare the sample for root cause analysis, and image the exact root cause, the overall...