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ultraviolet microscopy

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110042
EISBN: 978-1-62708-247-1
... details. It begins with the basic microscope column and construction. The article discusses microscope adjustments, brightfield and darkfield illumination, and microscope concepts important to liquid crystal techniques. It also discusses solid immersion lenses, infrared and ultraviolet microscopy...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850267
EISBN: 978-1-62708-260-0
... described by developing a plot of light intensity versus wavelength. Most light microscopy techniques use light in the visible spectrum, while only limited studies have been devoted to developing ultraviolet or infrared microscopy techniques. Although the eye is sensitive to only the visible spectrum...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030115
EISBN: 978-1-62708-349-2
... Abstract Transmitted-light methods reveal more details of the morphology of fiber-reinforced polymeric composites than are observable using any other available microscopy techniques. This chapter describes the various aspects relating to the selection and preparation of ultrathin-section...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030237
EISBN: 978-1-62708-349-2
..., excessive loading, and combinations of these environmental conditions. This chapter discusses the effects of heat, ultraviolet-light, and atomic oxygen on composite materials. atomic oxygen polymer composites surface degradation Polymer composite materials are subject to degradation...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030089
EISBN: 978-1-62708-349-2
...-fluorescence microscopy uses an ultraviolet light source (mercury or xenon) for illumination. The light is transmitted though an excitation filter that blocks all but a narrow bandwidth of the light spectrum. The narrow bandwidth of light strikes the sample surface and is mostly reflected. However, some...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.9781627082815
EISBN: 978-1-62708-281-5
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780433
EISBN: 978-1-62708-281-5
...-butadiene-styrene styrene-ethylene-butylene-styrene size-exclusion chromatography scanning electron microscopy short- ber-reinforced polymer secondary ion mass spectroscopy styrene-maleic anhydride sheet molding compound sheet molding compound Society of Plastics Engineers structural reaction injection...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110209
EISBN: 978-1-62708-247-1
... kT/c 2 )   dν This formula proved to be accurate at low frequencies, but failed miserably at high frequencies in the ultraviolet end of the spectrum. This theory was ultimately known as the ultraviolet catastrophe. The reason for the failure of this theory is simple. The equal-partition...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
.... Techniques in this area include visual examination, low-power magnification, optical and scanning electron microscopy, and photography. Dimensional inspection and related approaches for assessing suspected item dimensions and conformance to drawing and specification requirements and determining...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
.... A.2 Optical (light) microscopy Examination of small region or area of either unprepared or polished and normally etched surface at magnification of 25 to 1000×. Normally examination is of a sample cut from the bulk, but on-site examination and replication techniques are possible. Surface...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780404
EISBN: 978-1-62708-281-5
.... Figure 8 illustrates surface microcracking induced in a polyoxymethylene specimen exposed to ultraviolet light in the laboratory for 1000 h. It should be noted, however, that some polymers are intrinsically more resistant to degradation than others. The following common polymers are ranked with respect...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110153
EISBN: 978-1-62708-247-1
... will quickly form pits. Heating of the sample must be carefully avoided in a vacuum chamber. Ultraviolet light is created which may begin to erase NVM memory <2um. Electrostatic fields and ion implantation on the surface may alter the device with ultra-thin silicon for certain technologies. CNC...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.9781627084628
EISBN: 978-1-62708-462-8
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610549
EISBN: 978-1-62708-303-4
... (and comparison with parts that have not failed) Macroscopic examination and analysis and photographic documentation (fracture surfaces, secondary cracks, and other surface phenomena) Microscopic examination and analysis (electron microscopy may be necessary) Selection and preparation of metallographic...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 1997
DOI: 10.31399/asm.tb.wip.t65930039
EISBN: 978-1-62708-359-1
... or visible penetration liquids and developers; ultraviolet light for fluorescent dyes Defects open to the surface only; good for leak detection Detects small surface imperfections; easy application; inexpensive; use on magnetic or nonmagnetic material; low cost Time-consuming; not permanent Used on root...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.9781627082600
EISBN: 978-1-62708-260-0
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180151
EISBN: 978-1-62708-256-3
... of particles forms an outline of the discontinuity and indicates its size, shape, and extent. Frequently, a fluorescent material is combined with the particles so that discontinuities can be detected visually under ultraviolet light. This method reveals surface cracks that are not visible to the naked eye...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... Abstract This article covers common techniques for surface characterization, including the modern scanning electron microscopy and methods for the chemical characterization of surfaces by Auger electron spectroscopy, X-ray photoelectron spectroscopy, and time-of-flight secondary ion mass...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780343
EISBN: 978-1-62708-281-5
... diffraction analysis (XRD) Crystalline polymer component Crystalline structure, short- and long-range ordering, percent crystallinity, polymer blend/copolymer Small-angle x-ray diffraction X-ray scattering at low angle Crystallite size and shape, long-range periodicity Scanning electron microscopy...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780109
EISBN: 978-1-62708-268-6
... dimensional change Scanning electron microscopy, 20 to 10,000 × (fracture surface) Microvoids (dimples) elongated in direction of loading Single crack with no branching Surface slip band emergence Cleavage or intergranular fracture Origin area may contain an imperfection or stress...