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Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540357
EISBN: 978-1-62708-309-6
... deformation of crystal lattices can also occur by other processes such as twinning and, in special circumstances, by the migration of vacant lattice sites. This appendix describes the notation used to specify lattice planes and directions and discusses the mechanisms of slip and twinning as well as the effect...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540001
EISBN: 978-1-62708-309-6
... within the same framework as metals (e.g., the role of antishear twinning, microtwinning, etc. [1] ). The microstructure of these materials controls microscale fracture mechanisms and fracture site initiation. In this book, intermetallics, such as TiAl, Ti 3 Al, NiAl, and Ni 3 Al, are treated the same...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540047
EISBN: 978-1-62708-309-6
... discusses alternative mechanisms such as twinning and cleavage fracture. While the discussions throughout this book are filled with macroscale aspects of failure, efforts are made to balance them with discussions of microscopic mechanisms whenever applicable. References 2.1. Holt...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540121
EISBN: 978-1-62708-309-6
... stressing, continued surface roughening and damage accumulation ultimately results in crack nucleation at the surface. Cyclic damage can also accumulate at grain boundaries, particularly at elevated temperature or under conditions that cause grain-boundary embrittlement, and at twin boundaries. Fig...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540169
EISBN: 978-1-62708-309-6
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540215
EISBN: 978-1-62708-309-6
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540281
EISBN: 978-1-62708-309-6
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540297
EISBN: 978-1-62708-309-6
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540319
EISBN: 978-1-62708-309-6
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540373
EISBN: 978-1-62708-309-6
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540379
EISBN: 978-1-62708-309-6
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540383
EISBN: 978-1-62708-309-6
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540391
EISBN: 978-1-62708-309-6
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540395
EISBN: 978-1-62708-309-6
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540397
EISBN: 978-1-62708-309-6
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540411
EISBN: 978-1-62708-309-6
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540415
EISBN: 978-1-62708-309-6
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540423
EISBN: 978-1-62708-309-6
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540429
EISBN: 978-1-62708-309-6
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540431
EISBN: 978-1-62708-309-6