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transmitted light microscopy

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030115
EISBN: 978-1-62708-349-2
...Abstract Abstract Transmitted-light methods reveal more details of the morphology of fiber-reinforced polymeric composites than are observable using any other available microscopy techniques. This chapter describes the various aspects relating to the selection and preparation of ultrathin...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030211
EISBN: 978-1-62708-349-2
..., these analytical methods provide little, if any, information on the origin and microstructure of the crystallinity in the composite. To determine the morphology of thermoplastic-matrix composites, transmitted polarized-light microscopy can be used very effectively. The preparation of thermoplastic-matrix...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030089
EISBN: 978-1-62708-349-2
... Etches for Polymeric Matrices Summary References References 1. Abromowitz M. , Contrast Methods in Microscopy: Transmitted Light , Basics and Beyond , Olympus Corp. , Lake Success, NY , 1987 2. Bloss F.D. , An Introduction to the Methods of Optical Crystallography...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030223
EISBN: 978-1-62708-349-2
... of the contrast techniques of transmitted-light microscopy. Figure 13.1 shows an area of a honeycomb-cored sandwich structure composite cross section that is viewed using transmitted polarized light. The 3k-70 plain weave carbon fibers are visible as a black mass or short angled rods, and the epoxy resin...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030177
EISBN: 978-1-62708-349-2
..., ultrathin sections were developed from the composite materials to use transmitted-light optical microscopy contrast techniques to determine the phases. Figure 10.1 shows a cross section of a carbon-fiber-reinforced composite that has a very small dispersed-rubber phase in the matrix. The phase size...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030193
EISBN: 978-1-62708-349-2
...,” Polarized Light Microscopy, Olympus Microscopy Resource Center , http://www.olympusmicro.com/primer/techniques/polarized/berekcompensator.html 13. Evans A.G. et al. , Mechanisms of Toughening in Rubber Toughened Polymers , Acta Metall. , Vol 34 ( No. 1 ), 1986 , p 79 – 87 10.1016/0001...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.9781627083492
EISBN: 978-1-62708-349-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030001
EISBN: 978-1-62708-349-2
... section showing the microstructure of spruce wood. Transmitted-light phase contrast, 40× objective Optical microscopy is a valuable tool in materials investigations related to problem solving, failure analysis, advanced materials development, and quality control. Microscopy has been used for many...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850267
EISBN: 978-1-62708-260-0
....) Figure 4-36 Example of an optical replica of ferrite and pearlite in AISI 1040 using the Struers Transcopy replication tape. The sample was etched in 4% picral, 150×. Abstract Abstract This chapter discusses the tools and techniques of light microscopy and how they are used in the study...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
... of light (mostly visible light) with a sample, making possible primarily the observation of color, relief, and polarization, electron microscopy makes use of a variety of metal–electron interaction phenomena to provide valuable information from the sample observation. In many phenomena, electron behavior...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
...) samples, frequently encountered in failure analysis applications. In scanning transmission electron microscopy, the electron beam is focused to a fine spot on the specimen and “scanned” over the area of interest [2 , 32 - 34] . A STEM detector under the specimen is used to collect the transmitted...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030245
EISBN: 978-1-62708-349-2
... be remounted to provide adequate handling of the microscopic sample. Polished cross-sectional mounts can be examined with a variety of microscopy techniques, including polarized light, bright- and dark-field illumination, and epi-fluorescence. The damage characteristics depend on many factors, including...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.9781627082921
EISBN: 978-1-62708-292-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110153
EISBN: 978-1-62708-247-1
... 1999 , p 371 . [12] Rudolf Schlangen et al. “ Visible Light Probing Sample Thinning Using Targeted Lapping ”, ISTFA 2016 p 174 [13] IBID p 174 [14] Colvin , “ BGA and Advanced Package Wire to Wire Bonding for Backside Emission Microscopy ”, ISTFA 1999 , p 368...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030023
EISBN: 978-1-62708-349-2
... is dissolved in 7 mL of methanol. To achieve the desired contrast, more or less of the dye may be necessary, depending on the microscopist and the capability of the microscope used. The polished cross-sectional mounts can be examined with a variety of microscopy techniques, including polarized light, bright...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110550
EISBN: 978-1-62708-247-1
... at die to interposer interface, (c) Reflected signal scan at interposer to laminate interface showing a large area of delamination (d) Transmitted scan signal of entire module showing the delamination Figure 14 Example of a topography map and line profile obtained from a 2.5D module...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110067
EISBN: 978-1-62708-247-1
... attach region. Figure 22 A real-time x-ray image of the TO-220 package shown in Fig. 16 , taken after temperature cycling. Figure 44 X-ray radiographic inspection (A) and scanning laser acoustic microscopy (SLAM) (B) of IC packages. Figure 1 Coefficient of thermal expansion...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
... of the chapter. Replicas are prepared by different techniques. One type of replica, called a surface or carbon replica, is produced from a specimen as prepared for light microscopy. The specimen surface is coated with a cellulose acetate film (e.g., collodion) to produce a negative impression of the surface...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610549
EISBN: 978-1-62708-303-4
... and, in general, are either electronic or mechanical in principle. Obviously, small size and light weight are advantages in portable testers. The major components of the portable laboratory may include: In a failure investigation, routine analysis of the material is usually recommended. Often, it is done...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030237
EISBN: 978-1-62708-349-2
.... (a) As received (no exposure). (b) 204 °C (400 °F) exposure. (c) 232 °C (450 °F) exposure. (d) 260 °C (500 °F) exposure. Transmitted light, phase contrast, 20× objective Matrices in polymeric composites may be subject to degradation by ultraviolet (UV) light (photo-oxidation) if not protected...