1-20 of 149 Search Results for

transmission electron microscopy

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.9781627082921
EISBN: 978-1-62708-292-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
...Abstract Abstract The ultimate goal of the failure analysis process is to find physical evidence that can identify the root cause of the failure. Transmission electron microscopy (TEM) has emerged as a powerful tool to characterize subtle defects. This article discusses the sample preparation...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... spray coatings. The techniques covered are optical microscopy, X-Ray diffraction, scanning electron microscopy, focused ion beam machining, electron probe microanalysis, transmission electron microscopy, and electron backscattered diffraction. The techniques also include electron channeling contrast...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.t56000001
EISBN: 978-1-62708-292-1
...Abstract Abstract This chapter discusses the principles of scanning transmission electron microscopy (STEM) as implemented using conventional scanning electron microscopes (SEMs). It describes the pros and cons of low-energy imaging and diffraction, addresses basic hardware requirements...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
..., and laser scanning microscopes. atom probe tomography atomic force microscopy laser scanning confocal microscopy metallography scanning electron microscopy scanning transmission electron microscopy transmission electron microscopy Although optical microscopy is based on the interaction...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.t56000020
EISBN: 978-1-62708-292-1
... (SEM) scanning transmission electron microscopy (STEM) transmission electron detectors ...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
... Transmission Electron Microscopy • Goringe M.J. and Thomas G. , Transmission Electron Microscopy , John Wiley & Sons , 1979 • Hirsch P. , Howie A. , Nicholson R.B. , Pashley D.W. and Whelan M.J. , Electron Microscopy of Thin Crystals , Butterworths...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220001
EISBN: 978-1-62708-259-4
... Scale (approximate dimensions) Characterization techniques Crystalline structure (Å) X-ray diffraction Transmission electron microscopy (electron diffraction) Structural features in the range of 10–100 nm (dislocations, stacking faults, ultrafine grains, etc.) Transmission electron microscopy...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... and Energy Measurement Nonsurface specific methods include scanning electron microscopy (SEM), electron probe microanalysis (EPMA), and transmission electron microscopy (TEM). Scanning Electron Microscopy, Electron Probe Microanalysis (SEM, EPMA) Transmission Electron Microscopy (TEM) A number...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420171
EISBN: 978-1-62708-310-2
.... , Electron Microscopy and Strength of Crystals , Thomas G. and Washburn J. , Ed., Interscience , 1963 9.5 Marcinkowski M.J. and Zwell L. , Transmission Electron Microscopy Study of the Off-Stoichiometric Cu3Au Superlattices , Acta Metall. , Vol 11 , 1963 , p 373 – 390...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110550
EISBN: 978-1-62708-247-1
... induced artifacts, especially when supporting key technology and package qualifications. Module Lid Removal Mechanical Cross-Sectioning Mechanical Milling Plasma-Based Focused Ion Beam (PFIB) Cross-Sectioning Transmission Electron Microscopy and Prep A sample submitted for failure...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410001
EISBN: 978-1-62708-265-5
... & Sons , 1997 1.6 Williams D. B. and Carter C. B. , Transmission Electron Microscopy, A Text for Materials Science , Second Edition , Springer , 2009 10.1007/978-0-387-76501-3_1 1.7 Giannuzzi L. A. and Stevie F. A. , Introduction to Focused Ion Beams...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410113
EISBN: 978-1-62708-265-5
... are aligned, elongated, parallel features. Transmission electron microscopy shows that the latter features are crystals of austenite or M/A constituent that have been retained between crystals of acicular ferrite. The matrix structure in Fig. 7.13 is in fact made up of many fine crystals of ferrite...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410315
EISBN: 978-1-62708-265-5
... spacing is too fine to be resolved in the light microscope, and the pearlite appears uniformly dark. Therefore, to resolve the interlamellar spacing of pearlite, high resolution scanning electron microscopy (SEM) and transmission electron microscopy (TEM), are necessary to resolve the two-phase structure...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420339
EISBN: 978-1-62708-310-2
.... Fig. 16.8 Transmission electron microscopy bright field micrograph showing Ti 5 Si 3 precipitates at dislocations in a Ti 52 Al 48 -3Si 2 Cr alloy. Source: Ref 16.7 as published in Ref 16.2 Coarsening of the particles occurs because the microstructure of a two-phase alloy is not stable...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270025
EISBN: 978-1-62708-301-0
... 6 , 7 ). The latter is more convenient for rapid examination of fracture surfaces. Transmission Electron Microscopy Scanning Electron Microscopy Metallography For many years, TEM has been a powerful tool for the study of fracture surfaces at high magnifications. However, its use...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420303
EISBN: 978-1-62708-310-2
... orientations (variants), have been found to reduce the constraining elastic stress through accommodation of the macroscopic shape changes ( Fig. 15.23 ). Fig. 15.22 Transmission electron microscopy image of martensite present in Cu-11.4Al-5Mn-2.5Ni-0.4Ti (wt%). Melt spun at a wheel speed of 6.5 m/s...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110335
EISBN: 978-1-62708-247-1
... such as recipe-based automated workflows tailored for specific applications has lowered the training barrier, making it possible for more users to perform tasks previously considered advanced with relative ease. Nowadays, skills for complex tasks such as transmission electron microscopy (TEM) lamella preparation...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 1999
DOI: 10.31399/asm.tb.lmcs.t66560283
EISBN: 978-1-62708-291-4
... of the particles of ε carbide responsible for this increased etching reactivity can be confirmed by transmission electron microscopy of thin foils; an example is given in Fig. 10.2 (Part 1) (a) , an illustration of this specimen being shown by light microscopy in Fig. 10.3 (Part 1) (a) and (b) . The above...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410099
EISBN: 978-1-62708-265-5
.... The austenite in this TEM image appears gray, and an example of the austenite is marked “A.” Fig. 6.7 Carbide particles (dark) formed between ferrite crystals in upper bainite in 4360 steel transformed at 495 °C (920 °F). Transmission electron micrograph, original magnification 25,000×. Source: Ref...