1-20 of 199 Search Results for

transmission electron microscopy

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... Abstract The ultimate goal of the failure analysis process is to find physical evidence that can identify the root cause of the failure. Transmission electron microscopy (TEM) has emerged as a powerful tool to characterize subtle defects. This article discusses the sample preparation procedures...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.9781627082921
EISBN: 978-1-62708-292-1
Image
Published: 01 November 2012
Fig. 30 Fans. (a) Examples of fans in a two-stage transmission electron microscopy replica of a cleavage fracture surface of iron. The river lines point back to the crack initiation site. (b) Fans on a scanning electron microscopy image. Source: Ref 14 , 15 More
Image
Published: 01 March 2006
Fig. 10.9 Use of transmission electron microscopy to observe formation of substructure in aluminum; total strain range = 0.004, life ≈ 500,000 cycles. Source: Ref 10.12 More
Image
Published: 01 March 2012
Fig. 15.22 Transmission electron microscopy image of martensite present in Cu-11.4Al-5Mn-2.5Ni-0.4Ti (wt%). Melt spun at a wheel speed of 6.5 m/s. Precipitates of Cu 2 AlTi are visible, dispersed evenly across the different grains. Source: Ref 15.14 as published in Ref 15.13 More
Image
Published: 01 March 2012
Fig. 15.23 Transmission electron microscopy images of splat-cooled Ni-37.5Al (at.%) showing accommodating martensite groupings. Source: Ref 15.15 as published in Ref 15.13 More
Image
Published: 01 March 2012
Fig. 16.8 Transmission electron microscopy bright field micrograph showing Ti 5 Si 3 precipitates at dislocations in a Ti 52 Al 48 -3Si 2 Cr alloy. Source: Ref 16.7 as published in Ref 16.2 More
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.t56000001
EISBN: 978-1-62708-292-1
... Abstract This chapter discusses the principles of scanning transmission electron microscopy (STEM) as implemented using conventional scanning electron microscopes (SEMs). It describes the pros and cons of low-energy imaging and diffraction, addresses basic hardware requirements, and provides...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... coatings. The techniques covered are optical microscopy, X-Ray diffraction, scanning electron microscopy, focused ion beam machining, electron probe microanalysis, transmission electron microscopy, and electron backscattered diffraction. The techniques also include electron channeling contrast imaging, X...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
..., and laser scanning microscopes. atom probe tomography atomic force microscopy laser scanning confocal microscopy metallography scanning electron microscopy scanning transmission electron microscopy transmission electron microscopy Although optical microscopy is based on the interaction...
Image
Published: 01 November 2012
Fig. 16 Influence of direction of principal normal stress on the shape of dimples formed by microvoid coalescence. TEM, transmission electron microscopy. Source: Ref 9 More
Image
Published: 01 November 2012
Fig. 36 Cleavage fracture in Armco iron showing a tilt boundary, cleavage steps, and river patterns. Transmission electron microscopy replica. Source: Ref 18 More
Image
Published: 01 January 2015
Fig. 7.10 Widmanstätten ferrite saw teeth with low dislocation density in a copper-containing high-strength, low-alloy steel cooled at 0.1 °C/s (0.2 °F/s). Transmission electron microscopy micrograph. Source: Ref 7.11 More
Image
Published: 01 March 2012
Fig. 9.8 Schematic diagram (a) showing the atomic configuration in Cu 3 Au that results in the formation of straight APBs, which can be seen (b) using transmission electron microscopy. Source: Ref 9.4 and 9.5 , respectively, as published in Ref 9.3 More
Image
Published: 01 March 2012
Fig. 16.10 Coherent transition precipitates revealed by strain contrast (dark field) in transmission electron microscopy. The specimen is a Cu-3.1Co alloy aged 24 h at 650 °C (1200 °F). The precipitate is a metastable face-centered cubic (fcc) phase of virtually pure cobalt in the fcc matrix More
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.t56000020
EISBN: 978-1-62708-292-1
... transmission electron microscopy (STEM) transmission electron detectors STEM-in-SEM Copyright © 2020 ASM International® J.D. Holm and B.W. Caplins All rights reserved 10.31399/asm.tb.stemsem.t56000020 www.asminternational.org Chapter Two Imaging and Diffraction with a Programmable Pixelated Detector...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
... century to examine the “fine” microstructural details of steels and cast irons. Because the electrons can penetrate thin foils of specially prepared samples, discoveries were made by transmission electron microscopy in the late 1940s and early 1950s that led to major advances in our understanding...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220001
EISBN: 978-1-62708-259-4
... Scale (approximate dimensions) Characterization techniques Crystalline structure (Å) X-ray diffraction Transmission electron microscopy (electron diffraction) Structural features in the range of 10–100 nm (dislocations, stacking faults, ultrafine grains, etc.) Transmission electron microscopy...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410001
EISBN: 978-1-62708-265-5
... , Upper Saddle River, NJ , 2001 1.5 Vickerman J. C. , Surface Analysis-The Principle Techniques , John Wiley & Sons , 1997 1.6 Williams D. B. and Carter C. B. , Transmission Electron Microscopy, A Text for Materials Science , Second Edition , Springer , 2009...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090109
EISBN: 978-1-62708-462-8
..., microscopy, FIB circuit edit, and scanning probe microscopy. delayering dopant profiling FIB circuit edit FinFET transistors gate-all-around field-effect transistor nanoprobing sample preparation scanning probe microscopy spatial resolution transmission electron microscopy Introduction...