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time-of-flight secondary ion mass spectrometry

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... spectrometry. The principles of surface analysis and some of the applications of the technique in polymer failure studies are also provided. Auger electron spectroscopy X-ray photoelectron spectroscopy time-of-flight secondary ion mass spectrometry surface characterization polymers MANY...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.9781627082815
EISBN: 978-1-62708-281-5
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
... Electronic Components and Technology Conference , Orlando , 1996 . [16] Dong X. , Proctor A. and Hercules D. M. , “ Characterization of Poly(dimethylsiloxane)s by Time-of-Flight Secondary Ion Mass Spectrometry ,” Macromolecules , vol. 30 , no. 1 , pp. 63 - 70 , 1997 . 10.1021...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110335
EISBN: 978-1-62708-247-1
.... ,; Gabureac M. ,; Riesterer J. L. ,; Utke I. ,; Hohl M. ,; Sedláček L. ,; Jiruše J. ,; Friedli V. , “ High spatial resolution time-of-flight secondary ion mass spectrometry for the masses: a novel orthogonal ToF SIMS instrument with in situ AFM, ” Advances in Materials...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS, also knows as ESCA), secondary ion mass spectrometry (SIMS), Rutherford backscattering spectrometry (RBS), Fourier transform infrared spectroscopy (FTIR), and total-reflection x-ray fluorescence (TXRF). Each of these capabilities is given...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610549
EISBN: 978-1-62708-303-4
... or in determining a sequence of events leading to the failure. For example, traces of paint or corrosion found on a portion of a fracture surface may provide evidence that the crack was present in the surface for some time before complete fracture occurred. Such evidence should be recorded photographically...