1-12 of 12 Search Results for

time-of-flight mass spectrometry

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Image
Published: 01 December 2003
Fig. 15 Time-of-flight secondary ion mass spectrometry positive ion spectrum of stainless steel surface More
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... spectrometry. The principles of surface analysis and some of the applications of the technique in polymer failure studies are also provided. Auger electron spectroscopy X-ray photoelectron spectroscopy time-of-flight secondary ion mass spectrometry surface characterization polymers MANY...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
... in the range of >5 to <~100 SiO 2 eq. nm. Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) The pioneering work on static SIMS has started in late 1960s by Benninghoven with his fundamental studies of small molecules on surfaces. [12] SIMS was an already known technique...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110335
EISBN: 978-1-62708-247-1
... standard composed of layered GaAs and AlAs. The mapped isotope is Al + . The indicated measurements are line pair pitches except for the single line indicated by 3.5 nm. A few different types of mass spectrometers are used in SIMS instrumentation. The main three types are quadrupole, Time-of-Flight...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... (with thin samples), wavelength dispersive x-ray spectroscopy (WDS), Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS, also knows as ESCA), secondary ion mass spectrometry (SIMS), Rutherford backscattering spectrometry (RBS), Fourier transform infrared spectroscopy (FTIR), and total...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1983
DOI: 10.31399/asm.tb.mlt.t62860343
EISBN: 978-1-62708-348-5
...%. The technique may also be combined with mass spectrometry to determine the qualitative chemical composition of the pyrolysis products and the sequence of their evolution as a function of surface temperature ( Schacke, Hunter, Grunfelder, and Fristrom, 1977 ). Electric Arc Tests Many oxygen accidents have...
Series: ASM Technical Books
Publisher: ASM International
Published: 30 November 2023
DOI: 10.31399/asm.tb.ciktmse.t56080001
EISBN: 978-1-62708-460-4
... (AES), x-ray photon spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (ToF-SIMS). For instance, SEM is widely applied to analyze surface morphology in a sub-micro scale. Surface information such as metal surface consumption and formation of corrosion products or a surface film...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 30 September 2023
DOI: 10.31399/asm.tb.stmflw.t59390145
EISBN: 978-1-62708-459-8
... the order of experiments, and not change only one setting at a time, in order to reduce variation. Review the data. If the system response is not stable, or very different from model predictions, the confidence in experimental results may be affected. Analyze and interpret the results. Multivariable...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610549
EISBN: 978-1-62708-303-4
...-temperature vulcanized rubber does not provide the sensitivity of an acetate replica, and a setup time of several hours is required. However, the added area can be very important in an investigation. Hardness testing with a portable hardness testing instrument may also be performed during on-site failure...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2022
DOI: 10.31399/asm.tb.tstap.9781627084284
EISBN: 978-1-62708-428-4
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.9781627082532
EISBN: 978-1-62708-253-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1983
DOI: 10.31399/asm.tb.mlt.9781627083485
EISBN: 978-1-62708-348-5