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Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220025
EISBN: 978-1-62708-259-4
..., and other such metrics. metallography One of the most interesting problems in evaluating micro- and macrostructures of metals is the fact that most available analytical techniques make it possible to observe two-dimensional sections of three-dimensional structures. This transformation, which...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220039
EISBN: 978-1-62708-259-4
... reproduction, lighting, and image enhancement techniques. etching macrographic examination photographic reproduction sample preparation Macrographic examination is the examination under low or no magnification of a polished plane section of a part or a metallic sample, usually subjected...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220069
EISBN: 978-1-62708-259-4
... the steps involved in replicating part surfaces. etchants etching metallographic replication microscopic examination sample preparation Several techniques are used to observe the structure of steels and cast irons in the microscopic scale. For many of these techniques, sampling and sample...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
... and emitted x-rays and the methods used to access it, namely wavelength and energy dispersive spectroscopy and electron backscattering diffraction techniques. It also describes the role of focused ion beam milling in sample preparation and provides information on atom probes, atomic force microscopes...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110010
EISBN: 978-1-62708-247-1
... a package failure analysis flow for analyzing open and short failures. The flow begins with a review of data on how the device failed and how it was processed. Next, non-destructive techniques are performed to document the condition of the as-received units. The techniques discussed are external optical...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850712
EISBN: 978-1-62708-260-0
Series: ASM Technical Books
Publisher: ASM International
Published: 30 November 2013
DOI: 10.31399/asm.tb.uhcf3.t53630001
EISBN: 978-1-62708-270-9
... , Vol 11 , ASM Handbook , 8th ed. , ASM International , 1986 , p 15 – 46 2. Dennies D.P. , How to Organize and Run a Failure Investigation , ASM International , 2005 3. Witherell C.E. , Mechanical Failure Avoidance: Strategies and Techniques , McGraw Hill , 1994 , p...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270031
EISBN: 978-1-62708-301-0
.... The chapter also covers quantitative fractography, fracture surface topography analysis, and the use of oxide dating as well as fault tree and failure modes and effects analysis (FMEA) and computational techniques. fault tree analysis fracture surface topography analysis oxide dating quantitative...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
... Abstract This chapter discusses the techniques applicable to the diagnosis of corrosion failures, including visual and microscopic examination of corroded surfaces and microstructure; chemical analysis of the metal, corrosion products, and bulk environment; nondestructive evaluation methods...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110209
EISBN: 978-1-62708-247-1
... Abstract Many defects generate excessive heat during operation; this is due to the power dissipation associated with the excess current flow at the defect site. There are several thermal detection techniques for failure analysis and this article focuses on infrared thermography with lock...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1989
DOI: 10.31399/asm.tb.dmlahtc.t60490415
EISBN: 978-1-62708-340-9
... techniques for nozzles and buckets. It also presents key information from a detailed review of the literature and the results of a survey on combustion-turbine material problems. buckets combustion turbines life assessment nozzles General Materials of Construction Damage Mechanisms Life...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110228
EISBN: 978-1-62708-247-1
... Abstract Diagnosing the root cause of a failure is particularly challenging if the symptom of the failure is not consistently observable. This article focuses on Laser Assisted Device Alteration/Soft Defect Localization (LADA/SDL), a global fault isolation technique, for detecting such failures...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110499
EISBN: 978-1-62708-247-1
... Abstract This article provides an introduction to the dynamic random access memory (DRAM) operation with a focus to localization techniques of the defects combined with some physical failure analysis examples and case studies for memory array failures. It discusses the electrical measurement...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110550
EISBN: 978-1-62708-247-1
... these 2.5D and 3D packages. This article focuses on these methods of fault isolation, non-destructive imaging, and destructive techniques through an iterative process for failure analysis of complex packages. 2.5D packaging 3D packaging destructive techniques failure analysis fault isolation non...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... , ASTM , 2013 5.3 Exner H.E. and Hougardy H.P. , Quantitative Image Analysis of Microstructures: A Practical Guide to Techniques, Instrumentation and Assessment of Materials , R Publications Ltd , 1988 5.4 Sum-Met Buehler , The Science Behind Material Preparation...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2011
DOI: 10.31399/asm.tb.cfw.t52860035
EISBN: 978-1-62708-338-6
... materials, affect winding program generation are explored. Before launching into the topic of advanced programming techniques and software for CNC filament winding machines, it is worthwhile to reflect on the evolution of winding machines, which has gone hand-in-hand with the evolution of the art...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460173
EISBN: 978-1-62708-285-3
..., characteristics, manufacturing, and procedures for packaging of powders specific to cold spray applications. powder production techniques high-pressure cold spray process spray powders RECENT GROWTH of high-pressure cold spraying (HPCS) applications on the industrial scale have forced global powder...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110563
EISBN: 978-1-62708-247-1
... Abstract This chapter discusses the various failure analysis techniques for microelectromechanical systems (MEMS), focusing on conventional semiconductor manufacturing processes and materials. The discussion begins with a section describing the advances in integration and packaging technologies...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110025
EISBN: 978-1-62708-247-1
... functionality has to be maintained during the process. This leads to the requirement of adding additional techniques that help isolate and image defects that are buried deeply within the board structure. This article demonstrates an approach of advanced board level failure analysis by using several non...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110323
EISBN: 978-1-62708-247-1
... Abstract This article presents methods that enable one to consistently, uniformly and quickly remove substrate silicon from units without imparting damage to the structure of interest. It provides examples of electron beam probing and backside nano-probing techniques. The electron beam probing...