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synchrotron X-ray diffraction

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410315
EISBN: 978-1-62708-265-5
.... , Investigation of white etching layers on rails by optical microscopy, electron microscopy, X-ray and synchrotron X-ray diffraction , Materials Science and Engineering , Vol A303 , 2001 , p 150 – 157 10.1016/S0921-5093(00)01842-6 15.25 Wild E. , Wang L. , Hasse B. , Wroblewski T...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.9781627084628
EISBN: 978-1-62708-462-8
Series: ASM Technical Books
Publisher: ASM International
Published: 01 February 2022
DOI: 10.31399/asm.tb.mbheaktmse.t56030021
EISBN: 978-1-62708-418-5
... manufacturing ( Ref 28 ). Question 14: What Are the Basic Characterization Methods Used for High-Entropy Alloys? Answer For crystal-structure detection, x-ray diffraction (XRD), in-situ neutron diffraction (ND), and synchrotron XRD are the normal methods used. For microstructure analysis, scanning...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 February 2022
DOI: 10.31399/asm.tb.mbheaktmse.9781627084185
EISBN: 978-1-62708-418-5
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2016
DOI: 10.31399/asm.tb.ascaam.t59190035
EISBN: 978-1-62708-296-9
... equilibrium phase diagram Designation Ref Designation in Fig. 2.22 Al 3 Ti(HT), Al 3 Ti(LT), ν 4 – 6 , 45 – 47 ν Ti (HT), ν Ti (LT) Al 2 Ti Ti 0.5 Al 11 Ti 5 Ti 5 Al 5 Ti 3 Ti 3 Al 1+x Ti 1–x Ti 1–x AlTi AlTi HT, high temperature; LT, low temperature...