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surface analysis

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
... semiconductor industry surface analysis time of flight static secondary ion mass spectroscopy transmission electron microscope-EDX X-ray photoelectron spectroscopy Some physical FA techniques with the focus on material characterization have been described. The purpose is to establish the manufacturing...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... spectrometry. The principles of surface analysis and some of the applications of the technique in polymer failure studies are also provided. Auger electron spectroscopy X-ray photoelectron spectroscopy time-of-flight secondary ion mass spectrometry surface characterization polymers MANY...
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Published: 01 January 2000
Fig. 1 Relative depth of penetration of various surface analysis techniques More
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Published: 01 November 2019
Figure 4 The AES analysis of plated lead surface is shown at top, while the AES depth profiling of the plated lead is shown at bottom. More
Image
Published: 01 June 2007
Fig. 5.29 SEM and Auger line analysis of 316L surfaces containing surface oxides formed during cooling. Reprinted with permission from MPIF, Metal Powder Industries Federation, Princeton, NJ More
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
...) and, in some cases, carbon and sulfur in metals. This chapter discusses the operating principles of XRF, OES, combustion and inert gas fusion analysis, surface analysis, and scanning auger microprobe analysis. The details of equipment set-up used for chemical composition analysis as well as the capabilities...
Image
Published: 01 December 2003
Fig. 13 Ion impact removal of atoms or clusters from solid surfaces. Mass analysis of the sputtered particles is the basis of the static SIMS technique. Simultaneous Auger electron spectroscopy analysis of the bottom of the etch crater produces chemical depth profiles. More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2015
DOI: 10.31399/asm.tb.piht2.t55050245
EISBN: 978-1-62708-311-9
... Abstract This chapter discusses the methods and procedures used for inspecting induction-hardened parts. It provides information on hardness and case depth measurements, nondestructive testing and surface analysis, the effect of various hardening errors, and relevant test standards. case...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270019
EISBN: 978-1-62708-301-0
..., external debris, and so on. Analysis at microscopic levels provides information about the nature of inclusions, phases, and surface layers. Several cases of service failures are known to have been caused by the presence of deleterious inclusions from which cracks start in the component and propagate...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... diffraction, and neutron diffraction. These techniques provide information on the chemical composition of the material, microstructure and phase analysis, and also the surface characteristics. From a failure investigation point of view, the characterization of boiler tubes entails the determination...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
... Abstract This chapter discusses the techniques applicable to the diagnosis of corrosion failures, including visual and microscopic examination of corroded surfaces and microstructure; chemical analysis of the metal, corrosion products, and bulk environment; nondestructive evaluation methods...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780193
EISBN: 978-1-62708-268-6
... and microscopic examination, dye penetrant inspection, fluorescent dye pressure testing, x-ray Mechanical disconnect Visual examination, dimensional inspection, surface fractography, stress analysis, strength of materials testing Metallic component compressive, tensile, brittle, fatigue failure Surface...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180151
EISBN: 978-1-62708-256-3
... and analysis fracture surfaces, secondary cracks, and other surface phenomena) Microscopic examination and analysis of fracture surfaces Selection, preparation, examination, and analysis of metallographic sections Determination of the actual stress state of the failed component Determination...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270124
EISBN: 978-1-62708-301-0
... at the periphery of the fracture surface Fig. CH25.4 Equiaxed dimples seen at the center of the shaft corresponding with the region of final fracture Chemical Analysis EDAX analysis in the SEM indicated that the shaft was made of 12% Cr, 1.5% Ni steel. Hardness The hardness of the shaft...
Series: ASM Technical Books
Publisher: ASM International
Published: 30 November 2013
DOI: 10.31399/asm.tb.uhcf3.t53630001
EISBN: 978-1-62708-270-9
...) Macroscopic examination and analysis and photographic documentation (fracture surfaces, secondary cracks, and other surface phenomena) Microscopic examination and analysis using various light microscopy and electron microscopy techniques Selection and preparation of metallographic sections...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610549
EISBN: 978-1-62708-303-4
... Abstract This chapters discusses the basic steps in the failure analysis process. It covers examination procedures, selection and preservation of fracture surfaces, macro and microfractography, metallographic analysis, mechanical testing, chemical analysis, and simulated service testing...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780131
EISBN: 978-1-62708-268-6
.... The gasket may have the wrong dimensional configuration. This can occur if the gasket is too thick or too thin or if it does not have the right outline for the surfaces to be sealed. The failure analysis team should be alert to the possibility suggested by gasket drawings that have been revised. If the wrong...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780359
EISBN: 978-1-62708-281-5
... data regarding stereoregularity, carbon content, chemical composition, and copolymer structure ( Ref 10 ). Additionally, surface analysis spectroscopic techniques, such as secondary ion mass spectroscopy, x-ray photoelectron spectroscopy, and electron spectroscopy for chemical analysis...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270031
EISBN: 978-1-62708-301-0
.... The chapter also covers quantitative fractography, fracture surface topography analysis, and the use of oxide dating as well as fault tree and failure modes and effects analysis (FMEA) and computational techniques. fault tree analysis fracture surface topography analysis oxide dating quantitative...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2008
DOI: 10.31399/asm.tb.fahtsc.t51130111
EISBN: 978-1-62708-284-6
... surfaces, in order of increasing aggressiveness, are (Ref 3) : Dry air blast or soft organic-fiber brush cleaning Replica stripping Organic-solvent cleaning Water-based detergent cleaning Cathodic cleaning Chemical-etch cleaning Macroscopic Examination and Analysis...