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surface acoustic wave microscopy

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110067
EISBN: 978-1-62708-247-1
... longitudinal, shear and surface waves in the sample [5 , 6] . Instead of the large water baths of C-scan, a tiny water droplet acoustically couples the transducer and sample. Image contrast is formed by the combined interference of longitudinal, shear and leaky surface waves. Narrow-band RF pulses...
Image
Published: 01 November 2019
Figure 68 Schematic of the Photo-acoustic GHz-microscopy setup. The optical excitation is performed through the back-side. Acoustic waves then propagate to the surface and are detected by the acoustic lens. More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110025
EISBN: 978-1-62708-247-1
... and delamination at component edges or corners. SAM bases on the operational principle of inducing an acoustic wave through a transducer into the device under test top surface that travels through the individual material layers [14] . Each material interface interaction leads to a partial or total wave reflection...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110550
EISBN: 978-1-62708-247-1
... microscopy (SAM) allows non-destructive imaging of certain defect types hidden below the top surface, including the delamination of interfaces, cracks, and voids [14] . An ultrasonic wave transducer is scanned horizontally above the surface and the reflected wave amplitude and polarity are plotted to form...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110010
EISBN: 978-1-62708-247-1
... inspection, X-ray inspection, scanning acoustic microscopy, infrared (IR) microscopy, and electrical verification. The article discusses various fault isolation techniques to tackle the wide array of failure signatures, namely IR lock-in thermography, magnetic current imaging, time domain reflectometry...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270019
EISBN: 978-1-62708-301-0
... engine components. Acoustic Microscopy High-frequency ultrasound in the GHz range is passed through the component of interest. The transmitted wave is detected by a rapidly scanning laser beam on the opposite surface. Transmission of these waves is interrupted by flaws present in the material...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
.... A.2 Optical (light) microscopy Examination of small region or area of either unprepared or polished and normally etched surface at magnification of 25 to 1000×. Normally examination is of a sample cut from the bulk, but on-site examination and replication techniques are possible. Surface...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090131
EISBN: 978-1-62708-462-8
... in the following categories: 1) defect detection and classification; 2) noise reduction in scanning electron microscopy (SEM), transmission electron microscopy (TEM), scanning acoustic microscopy (SAM), and X-ray images; 3) failure mode identification by clustering and pattern recognition; and 4) failure analysis...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110219
EISBN: 978-1-62708-247-1
... and the packaging materials until it reaches the device surface. At the surface, this thermal energy forms a hot-spot from which it radiates off as infrared waves that are detected by an IR-sensitive camera. Despite the degradation in lateral resolution owed to lateral spreading of the thermal wave, lock...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610549
EISBN: 978-1-62708-303-4
... (and comparison with parts that have not failed) Macroscopic examination and analysis and photographic documentation (fracture surfaces, secondary cracks, and other surface phenomena) Microscopic examination and analysis (electron microscopy may be necessary) Selection and preparation of metallographic...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... Abstract The ultimate goal of the failure analysis process is to find physical evidence that can identify the root cause of the failure. Transmission electron microscopy (TEM) has emerged as a powerful tool to characterize subtle defects. This article discusses the sample preparation procedures...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2004
DOI: 10.31399/asm.tb.ps.t62440189
EISBN: 978-1-62708-352-2
... Abstract This chapter presents several materials and processes related to soldering technology. It first provides information on lead-free solders, followed by sections devoted to flip-chip processes, diffusion soldering, and modeling. Scanning acoustic microscopy and fine-focus x-ray...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720001
EISBN: 978-1-62708-305-8
... in absorption of a few percent compared with the surrounding material can be detected. Ultrasonic Inspection Ultrasonic inspection is a nondestructive method in which beams of high frequency acoustic energy are introduced into a material to detect surface and subsurface flaws, to measure the thickness...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110563
EISBN: 978-1-62708-247-1
.... It is typically electrically insulating, which can be a problem or a feature. One advantage for FA is that these seals can be heated to decap them, and gaps are easy to see with SAM (Scanning Acoustic Microscopy) or X-ray. Metal-metal thermocompression bonding requires patterning metal on the two wafers...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430409
EISBN: 978-1-62708-253-2
... sound waves to detect surface and subsurface flaws, if any. Discontinuities such as cracks, fissures, flakes, laminations, shrinkage cavities, and pores can be detected using ultrasonic testing. This technique is also used for measuring the oxide scale thickness of high-temperature tubes. Advanced...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.mnm2.t53060149
EISBN: 978-1-62708-261-7
... used in conjunction with a microhardness test, a micrograph can be useful in relating microstructure to mechanical properties. Some History The critical factor in the light microscopy of metals is the surface preparation of the specimen. This is the basic insight made by the father...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430204
EISBN: 978-1-62708-253-2
... that the tube was made of plain carbon steel with 0.2 wt% nominal carbon. Fig. 6.50 Failed waterwall tube (a) with window-type fracture and (b) ridges on the fracture surface Scanning electron microscopy examination of the fracture surface showed the presence of fissures and a discontinuous...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.9781627084628
EISBN: 978-1-62708-462-8
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 1997
DOI: 10.31399/asm.tb.wip.t65930057
EISBN: 978-1-62708-359-1
... the initial pulse is excessively broadened by the rough as-welded surface. Unmachined welds can be readily inspected by direct-beam and reflected-beam techniques, using an angle-beam (shear-wave) transducer. Tungsten Inclusions Tungsten inclusions are particles found in the weld metal from...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.9781627082600
EISBN: 978-1-62708-260-0