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structural defects

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2021
DOI: 10.31399/asm.tb.ciktmse.t56020001
EISBN: 978-1-62708-389-8
... and their relevance in design and manufacturing. It begins with a review of compositional impurities, the physical arrangement of atoms in solid solution, and the factors that determine maximum solubility. It then describes different types of structural imperfections, including point, line, and planar defects...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2021
DOI: 10.31399/asm.tb.ciktmse.t56020013
EISBN: 978-1-62708-389-8
... Abstract This chapter provides readers with worked solutions to more than 25 problems related to compositional impurities and structural defects. The problems deal with important issues and challenges such as the design of low-density steels, the causes and effects of distortion in different...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430351
EISBN: 978-1-62708-253-2
... Abstract Boiler tube failures associated with material defects are often the result of poor quality control, whether in primary production, on-site fabrication, storage and handling, or installation. This chapter examines quality-related failures stemming from compositional and structural...
Image
Published: 01 November 2019
Figure 17 TEM image of the TSV structure with a sidewall defect (Top). STEM image (lower left) and EDS maps (lower middle and right) of the defect revealing the migration of Cu from the TSVs filling through its side wall isolation resulting in a short path. More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2021
DOI: 10.31399/asm.tb.ciktmse.9781627083898
EISBN: 978-1-62708-389-8
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110550
EISBN: 978-1-62708-247-1
... divided by the combined resistance, gives a percentage of the length of the structure where the fail exists. (This assumes the resistance of the defect itself is negligible and there is one defect, which may not always be true). Capacitance Measurements Localization information on an open test site...
Series: ASM Technical Books
Publisher: ASM International
Published: 31 December 2020
DOI: 10.31399/asm.tb.phtbp.t59310001
EISBN: 978-1-62708-326-3
... crystal structures presented here depict a perfectly ordered crystalline lattice, real materials are rarely perfect. They usually contain imperfections or defects that affect their physical, chemical, mechanical, and electronic properties. However, depending on the desired properties exhibited...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610001
EISBN: 978-1-62708-303-4
... cracking and thus should be considered when predicting useful product life. brittle fracture fatigue cycles linear elastic fracture mechanics material defects stress intensity structural design IT IS OFTEN STATED that history repeats itself. Yet, when it comes to the failure of structural...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2008
DOI: 10.31399/asm.tb.emea.t52240017
EISBN: 978-1-62708-251-8
... Abstract In a perfect crystalline structure, there is an orderly repetition of the lattice in every direction in space. Real crystals contain a considerable number of imperfections, or defects, that affect their physical, chemical, mechanical, and electronic properties. Defects play...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110323
EISBN: 978-1-62708-247-1
... was identified using this method. The resistance of structure containing the defect was approximately 10kΩ, whereas the resistance of an identical nearby passing reference structure was approximately 700Ω. Such small differences are typically not detectable using two point EBAC. Figure 17 A TEM image...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420363
EISBN: 978-1-62708-310-2
..., crystalline imperfections, and the formation of surface or planar defects. It also discusses the use of X-ray diffraction for determining crystal structure. crystalline structures line defects metallic structure planar defects plastic deformation point defects volume defects X-ray diffraction...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270003
EISBN: 978-1-62708-301-0
... as an unacceptable gap between its expected and actual performance. It is a condition that makes the structure unable to perform its intended function safely, reliably, and economically. Such an unacceptable difference can be due to many reasons. A later chapter explains that the causes of failures rest in defects...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 1997
DOI: 10.31399/asm.tb.wip.t65930039
EISBN: 978-1-62708-359-1
... is included that encompasses techniques used to characterize the locations and structure of internal and surface defects, including radiography, ultrasonic testing, and liquid penetrant inspection. The next group of characterization procedures discussed is destructive tests, requiring the removal of specimens...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110132
EISBN: 978-1-62708-247-1
...-level interconnect based on waveform comparison between known-good and bare-substrate reference units [9] Figure 6 EOTPR waveform shows the waveform signatures of subtle design elements of the same structure as in Fig. 5 . Physical failure analysis showed that the defect is an additional...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.scm.t52870333
EISBN: 978-1-62708-314-0
..., although most composite structure is usually tested at 1 to 5 MHz. Higher frequencies (short wavelengths) are more sensitive to small defects, while lower frequencies (long wavelengths) can penetrate to greater depths. As the ultrasonic beam passes through the composite, it is attenuated or lost due...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2006
DOI: 10.31399/asm.tb.ex2.t69980141
EISBN: 978-1-62708-342-3
... Abstract This chapter explains the basic terminology and principles of metallurgy as they apply to extrusion. It begins with an overview of crystal structure in metals and alloys, including crystal defects and orientation. This is followed by sections discussing the development...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610303
EISBN: 978-1-62708-303-4
... operations without catastrophic failure by fracture . Very seldom does a fracture occur due to an unforeseen overload on an undamaged structure. Fractures are usually the end result of crack growth from a small defect or flaw. Due to repeated or sustained “normal” service loads, a crack may develop from...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.mnm2.t53060013
EISBN: 978-1-62708-261-7
... Abstract This chapter introduces many of the key concepts on which metallurgy is based. It begins with an overview of the atomic nature of matter and the forces that link atoms together in crystal lattice structures. It discusses the types of imperfections (or defects) that occur in the crystal...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270005
EISBN: 978-1-62708-301-0
.... By proper inspection procedures, it was possible to reject defective structural members in an aircraft industry and obtain free replacement from the suppliers. Example: Blisters in Aluminum Alloy Extrusions In one batch of aluminum alloy extrusions to be used for aircraft wing roots, blisters ( Fig...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110634
EISBN: 978-1-62708-247-1
... and structural testing. They are described in more detail later in this chapter. Speed and Power Binning Tests In addition to determining if a chip has a defect or not, it is often required to determine the speed at which the device fully operates. For example, the same microprocessor design may operate...