Fig. 7.89 Extrusion stem with an oval cross section (rectangular billet stem) and a fixed pad in production. Source: SMS Schloemann More

Fig. 7.90 Equivalent stresses at the transition to the stem foot of an extrusion stem for indirect extrusion. Source: SMS Schlomann More

Fig. 3.5 Variation of the stem load F St over the stem displacement s St in direct hot extrusion without lubrication and without a shell (initial billet temperature ϑ B ≌ container temperature ϑ R ). l B , initial billet length; D B , initial billet diam; l 0 , upset billet length More

Fig. 3.18 Calculated variation of the stem load F St over the stem displacement for Al99.5. The result is the principal variation of the stem force over the stem displacement shown in the figure. More

Fig. 3.37 Calculated variation of the stem load over the stem displacement in direct cold extrusion of aluminum with lubrication and without a shell. D 0 = 85 mm; V = 50; l B = 450 mm + tip; μ = 0.02; R eH = 120 N/mm 2 More

Fig. 3.40 (a) Hollow stem with internal thread. (b) Hollow stem with screwed-on extension with bayonet adapter. (c) Hollow stem with screwed-on extension and die holder attached by bayonet connector More

Fig. 3.51 Variation of the sealing stem force F VSt over the sealing stem displacement s VSt in indirect hot extrusion with an initial billet temperature equal to the container temperature More

Fig. 3.54 Variation in the sealing stem load with the sealing stem displacement in indirect hot extrusion with an initial billet temperature ϑ B that is higher than the container temperature ϑ R (e.g., copper alloys) More

Fig. 3.56 Sealing stem, hollow stem, and container for a container diam of 85 mm and a sealing stem load of 8000 kN More

Fig. 6.7 STEM dark field images of the prior austenite grain boundary in B added steel (0.05%C, 1.5%Mn, 3%Ni, 0.5%Mo, 11 ppm B). Courtesy of Nippon Steel & Sumitomo Metals Corporation. Source: Ref 11 More

Fig. 6.8 Example of boron profile measured using EELS in STEM around the prior austenite grain boundary marked in Fig. 6.7. Adapted from Ref 11 with permission of Nippon Steel & Sumitomo Metals Corporation. More

Fig. 25 (a) User-modified bicycle handlebar stem that failed in service. (b) Multiple fatigue initiations at part-through drill holes. Original magnification: 3×. Source: Ref 1 More

Figure 17 TEM image of the TSV structure with a sidewall defect (Top). STEM image (lower left) and EDS maps (lower middle and right) of the defect revealing the migration of Cu from the TSVs filling through its side wall isolation resulting in a short path. More

Figure 32 30 KeV STEM image of a FIB thinned area showing the exposed fins of a transistors [52] . More

Figure 29 Design for a “STEM-in-SEM” sample holder. The overall height is 2.5 cm. More

Figure 30 Optical photo of the STEM-in-SEM sample holder mounted to the SEM stage. The pole piece of the objective lens is visible above the sample holder. More

Figure 32 Low magnification STEM-in-SEM image showing the TEM sample. More

Figure 33 STEM-in-SEM image of an aluminum line connected to a tungsten plug contact. The barrier layer and the plug liner are visible. More

Figure 34 Higher magnification STEM-in-SEM image resolving a titanium plug liner and barrier layer. More