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statistical analysis

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2000
DOI: 10.31399/asm.tb.aet.t68260233
EISBN: 978-1-62708-336-2
... experimentation and analysis for those who are not familiar with these techniques. Wolf ( Ref 2 ) reviewed the application of five of the seven tools, including Pareto charts, flow process charts, histograms, run charts, and control charts of statistical process control (SPC) to the aluminum extrusion and drawn...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780157
EISBN: 978-1-62708-268-6
... Abstract Failure analysis can sometimes involve considerations of statistics and probability. This chapter reviews some of the basic types of statistical distributions in order to understand some basic principles in their use. The main focus is on the uses of the normal distribution, which is...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180061
EISBN: 978-1-62708-256-3
... Abstract Statistics, data analysis, root cause analysis, and problem-solving processes play a key role in failure investigations. This chapter explains how to collect failure investigation data, how to build and maintain a database for company-related failures, and how to use corresponding...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2006
DOI: 10.31399/asm.tb.pht2.t51440243
EISBN: 978-1-62708-262-4
... methods of statistical analysis, quality can be assured. Quality cannot be inspected into a part, but proper attention to each step of the process can identify sources of problems and prevent their occurrence. As demand for increased quality and documentation has been experienced by heat treaters, the...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110666
EISBN: 978-1-62708-247-1
... design Eyring models failure analysis outlier screening power law models quality reliability statistical distribution Although failure analysis serves to determine the cause and impact of failures with an eye to appropriate corrective action, it is worth noting that this activity is...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780075
EISBN: 978-1-62708-268-6
.... This chapter describes various areas that can be examined by the failure analysis team to assess the pedigree of the failed system. If the failure analysis team suspects product pedigree anomalies it should confirm conformance through independent means. failure analysis failure mode assessment...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110506
EISBN: 978-1-62708-247-1
... mining. They need to include automatic failure mode recognition software for defect classification [3] , data analysis tools based upon statistical methods, and powerful interactive data mining features. (See Figure 1 ). The wealth of signature information available is at the heart of the FA effort...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110613
EISBN: 978-1-62708-247-1
... Abstract Electronics spans a number of devices, their configurations, and properties. A challenge is to identify those electronic subjects essential for failure analysis. This article reviews the normal operation and terminal characteristics of MOSFET. It describes the electronic behavior of...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780081
EISBN: 978-1-62708-268-6
...), visiting on a one-on-one basis (rather than having everyone on the failure analysis team show up in the work center), and asking open-ended questions (rather than questions that can be answered with a “yes” or a “no”) are approaches that work well. In companies that use statistical process control (SPC...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110101
EISBN: 978-1-62708-247-1
.... , Leininger A. , “ Yield enhancement through fast statistical scan test analysis for digital logic ,” IEEE Advanced Semiconductor Manufacturing Conference and Workshop , April 2005 30. Eichenberger S. , ; Geuzebroek J. , ; Hora C. , ; Kruseman B. , ; Majhi A...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780147
EISBN: 978-1-62708-268-6
... Abstract In some cases, the failure analysis team finds that all components meet their requirements, the system was properly assembled, and it was not operated or tested in an out-of-specification manner, yet it still failed. When this occurs, the only conclusion the failure analysis team can...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780089
EISBN: 978-1-62708-281-5
... properties of reactive thermoset systems, while the second utilizes these thermal characteristics as the basis for monitoring and control during processing. thermoset resins chromatography infrared spectroscopy physical test thermal analysis THERMOSETTING RESINS are unique among engineering...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... Abstract This article provides an overview of the most common micro-analytical technique in the failure analysis laboratory: energy dispersive X-ray spectroscopy (EDS). It discusses the general characteristics, advantages, and disadvantages of some of the X-ray detectors attached to the...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
... semiconductor industry surface analysis time of flight static secondary ion mass spectroscopy transmission electron microscope-EDX X-ray photoelectron spectroscopy Some physical FA techniques with the focus on material characterization have been described. The purpose is to establish the manufacturing...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270031
EISBN: 978-1-62708-301-0
... Abstract This chapter discusses some of the more advanced methods and procedures used in failure analysis, including in-service material sampling, in situ microstructure analysis, and a form of punch testing that can determine the fracture toughness of any material from a tiny specimen. The...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610549
EISBN: 978-1-62708-303-4
... limitations are clearly understood, the simulated testing and statistical experimental design analysis of the effects of certain selected variables encountered in service may be helpful in planning corrective action or, at least, may extend service life. The evaluation of the efficacy of special additives to...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2008
DOI: 10.31399/asm.tb.fahtsc.t51130111
EISBN: 978-1-62708-284-6
... artificially increasing the severity of one of the factors—such as the corrosive medium or the operating temperature. Similar problems are encountered in wear testing. On the other hand, when its limitations are clearly understood, the simulated testing and statistical experimental design analysis of the...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2015
DOI: 10.31399/asm.tb.piht2.t55050215
EISBN: 978-1-62708-311-9
... Abstract This chapters discusses the considerations involved in the qualification and analysis of induction hardening treatments. The discussion covers material selection and prior heat treatment, hardness and case depth, frequency selection, power density and heating time, part and process...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180151
EISBN: 978-1-62708-256-3
... as the corrosive medium or the operating temperature. Similar problems are encountered in wear testing. On the other hand, when its limitations are clearly understood, the simulated testing and statistical experimental design analysis of the effects of certain selected variables encountered in...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 30 November 2013
DOI: 10.31399/asm.tb.uhcf3.t53630117
EISBN: 978-1-62708-270-9
.... , Schafer R.E. , and Singpurwalla N.D. , Methods for Statistical Analysis of Reliability and Life Data , John Wiley & Sons , 1974 • Manual on Low Cycle Fatigue Testing , STP 465, ASTM, 1969 • Powell G.W. , Cheng S.-H. , and Mobley C.E. Jr. , A Fractography...