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Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... combinations of elements are difficult to analyze because of overlapping x-ray energies. Such problems sometimes can be overcome by using wavelength dispersive spectrometers, rather than energy dispersive detectors, or by using optical emission spectroscopy. Operating Principles Capabilities of Related...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... Spectrometer ,” 2014 , https://image.slidesharecdn.com/prasanth-141007111927-conversion-gate01/95/atomic-absorption-spectrophotometry-15-638.jpg?cb=1412681932 5.14 Campbell I. et al. , The Use of EDXRF for Pharmaceutical Material Elemental Analysis ,” 2012 , http...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110335
EISBN: 978-1-62708-247-1
...A comparison of mass spectrometers. Table 2 A comparison of mass spectrometers. Quadrupole ToF Magnetic Sector Ion detection Serial Continuous Parallel detection Mass separation Modulating electric field Flight time Magnetic deflection Mass resolution 500 - 1000...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... location of sample, imaging plane, energy dispersive spectrometer and electron energy loss spectrometer (E is in incident electron energy and ΔE is the energy loss because of inelastic scattering by various elements in the sample). Figure 11 Planar TEM image of polysilicon lines. Contrast...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
...) Computer curve-fit, showing four individual components Fig. 10 X-ray photoelectron spectroscopy high-resolution spectrum of polyethylene terephthalate Fig. 12 Block diagram of a typical x-ray photoelectron spectroscopy spectrometer. UHV, ultrahigh vacuum Fig. 13 Ion impact...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
... to different materials. Several materials analysis technologies rely on spectrometry. Electron probe microanalysis (EPMA) is a materials analysis technique that can be bundled with an SEM. Instead of relying on x-ray energy (as in the EDAX approach), EPMA uses a wavelength-dispersive spectrometer...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180151
EISBN: 978-1-62708-256-3
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610549
EISBN: 978-1-62708-303-4
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270025
EISBN: 978-1-62708-301-0
... of an intergranular fracture caused by hydrogen embrittlement in a high-strength steel component When the electron beam strikes a point on the specimen surface in the SEM, x-rays are emitted, and these are characteristic of the chemical elements present in the specimen. Thus, with an x-ray spectrometer used...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720411
EISBN: 978-1-62708-305-8
... Pressure change Pressurized liquid (generally water) and visual observation Pressurized gas using a leak detection solution Tracer gas using thermal leak detectors Helium using a mass spectrometer during pressure and vacuum tests Other methods less frequently used are acoustical detection...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780343
EISBN: 978-1-62708-281-5
... of the spectrometer. Solid-state NMR can be used to determine the structure of solid polymers ( Ref 10 – 12 ). It differs from solution NMR in instrumentation and techniques because, with solids, problems that are associated with spectral resolution and sensitivity can arise. Solid-state NMR techniques require...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780359
EISBN: 978-1-62708-281-5
... hard solids, powders, liquids, and gases. Depending on the spectrometer and the corresponding accessories, most samples can be analyzed without significant preparation or alteration. In the analysis of polymeric materials, transmittance, reflectance, and attenuated total reflectance are the most common...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780089
EISBN: 978-1-62708-281-5
... Thermogravimetric-Tandem Triple Quadrupole Mass Spectrometer System (TGA/MS/MS) , ANTEC ’84 , Society of Plastics Engineers , 1984 , p 319 – 322 133. Sabatelli D.C. , Lavigne G. , Tanaka J. , and Johnson J.F. , Polymer Curing Studies Using Combined TGA-GC-FTIR-MS Techniques , ANTEC...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.9781627082921
EISBN: 978-1-62708-292-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420239
EISBN: 978-1-62708-310-2
... to make sure the precipitation takes place. Electron probe microanalysis (EPMA) is another important technique for phase diagram determination. It is essentially a dedicated SEM with wavelength dispersive spectrometers (WDS) attached. As an elemental analysis technique, it uses a focused beam of high...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.mnm2.t53060001
EISBN: 978-1-62708-261-7
... professors for metal analysis. Davenport and Bain develop the austempering process for iron castings. 1937 : Applied Research Laboratories founder Maurice Hasler produces the first grating spectrograph for the Geological Survey of California. Spectrometers begin finding their way into foundries...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110563
EISBN: 978-1-62708-247-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... an energy-dispersive x-ray spectrometer and a wavelength-dispersive spectrometer ( Ref 5.1 , 5.2 ). Electron probe microanalysis has been used in cold-sprayed coating characterization mainly to understand the bonding mechanism at the coating-substrate interface. It is a valuable characterization tool...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... into consideration when analyzing spectra. First and most obviously, the limited energy resolution of the spectrometer causes the characteristic peaks to appear much broader (~140 eV FWHM) than the true energy width of the peaks (~ 1 to 10 eV). This peak broadening is not perfectly Gaussian but has some asymmetrical...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 30 April 2020
DOI: 10.31399/asm.tb.bpapp.t59290035
EISBN: 978-1-62708-319-5