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Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2008
DOI: 10.31399/asm.tb.emea.t52240631
EISBN: 978-1-62708-251-8
... system for the other crystalline systems. There are a number of x-ray techniques that have been developed for studying crystalline structures. The Laue method uses a narrow collimated beam of white x-rays that strike a stationary single crystal. It is not suitable for the determination of lattice...
Abstract
This appendix explains how to identify crystallographic planes and directions. It shows how Miller indices, a system for specifying crystallographic planes within a unit cell, are determined for cubic and hexagonal systems. It also explains how x-ray diffraction techniques are used in the study of crystalline structures.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2008
DOI: 10.31399/asm.tb.emea.9781627082518
EISBN: 978-1-62708-251-8
Image
Published: 01 June 1983
Figure 9.25 Neutron-scattering ( Axe and Shirane, 1973 ), magnetic-susceptibility ( Rehwald et al., 1972 ), and x-ray diffraction ( Vieland et al., 1971 ) measurements on two Nb 3 Sn single crystals.
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Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... for the study of crystalline materials using x-ray diffraction (XRD) principles. The scattering of x-rays by atoms in a crystalline solid produces a diffraction pattern, which contains information about the atomic arrangement within the crystal. An amorphous material such as glass does not have a periodic array...
Abstract
This chapter describes some of the most effective tools for investigating boiler tube failures, including scanning electron microscopy, optical emission spectroscopy, atomic absorption spectroscopy, x-ray fluorescence spectroscopy, x-ray diffraction, and x-ray photoelectron spectroscopy. It explains how the tools work and what they reveal. It also covers the topic of image analysis and its application in the measurement of grain size, phase/volume fraction, delta ferrite and retained austenite, inclusion rating, depth of carburization/decarburization, scale thickness, pearlite banding, microhardness, and hardness profiles. The chapter concludes with a brief discussion on the effect of scaling and deposition and how to measure it.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420239
EISBN: 978-1-62708-310-2
... of phase diagrams. A simple XRD pattern can be used for phase identification. X-ray diffraction can also be used for the establishment of the loci of phase boundaries. For instance, in a two-component system, lattice parameters can vary with composition within a single-phase region but are invariant...
Abstract
This chapter discusses some of the methods and measurements used to construct phase diagrams. It explains how cooling curves were widely used to determine phase boundaries, and how equilibrated alloys examined under controlled heating and cooling provide information for constructing isothermal and vertical sections as well as liquid projections. It also explains how diffusion couples provide a window into local equilibria and identifies typical phase diagram construction errors along with problems stemming from phase-boundary curvatures and congruent transformations.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 May 2018
DOI: 10.31399/asm.tb.hma.t59250047
EISBN: 978-1-62708-287-7
.... At last, the metallurgists had a powerful new tool for determining the internal structure of metals. Among the earliest Americans to apply x-ray diffraction to the study of metals was Edgar C. Bain. He showed that steel heated to the hardening temperature had a different crystal structure. See chapter 5...
Abstract
This chapter covers the early studies and various discoveries by metals researchers to study the internal structure of metals. The topics covered include light microscopy, phase diagrams, X-ray diffraction, principles of precipitation hardening, and dislocation theory.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420363
EISBN: 978-1-62708-310-2
... is used mostly for determining the structure of single crystals. The Debye-Scherrer powder method uses an x-ray beam of constant wavelength and a specimen consisting of thousands of tiny crystals. Because there are a large number of powder particles with many different orientations, the diffracted beam...
Abstract
This appendix provides a detailed overview of the crystal structure of metals. It describes primary bonding mechanisms, space lattices and crystal systems, unit cell parameters, slip systems, and crystallographic planes and directions as well as plastic deformation mechanisms, crystalline imperfections, and the formation of surface or planar defects. It also discusses the use of X-ray diffraction for determining crystal structure.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
..., Å, is commonly used; one angstrom = 0.1 nm). When the monochromatic beam strikes the sample, some of the x-rays are diffracted from certain planes of the crystal lattice of the specimen, and the angles at which they are diffracted are unique to the spacing of the atoms that are present in the crystal...
Abstract
Several specialized instruments are available for the metallographer to use as tools to gather key information on the characteristics of the microstructure being analyzed. These include microscopes that use electrons as a source of illumination instead of light and x-ray diffraction equipment. This chapter describes how these instruments can be used to gather important information about a microstructure. The instruments covered include image analyzers, transmission electron microscopes, scanning electron microscopes, electron probe microanalyzers, scanning transmission electron microscopes, x-ray diffractometers, microhardness testers, and hot microhardness testers. A list of other instruments that are usually located in a research laboratory or specialized testing laboratory is also provided.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
...-specimen interactions occur. These interactions yield transmitted electrons, elastically and inelastically scattered electrons, secondary electrons, back-scattered electrons, Auger electrons and X-ray photons. Most of the transmitted and elastically scattered electrons and some of the inelastically...
Abstract
The ultimate goal of the failure analysis process is to find physical evidence that can identify the root cause of the failure. Transmission electron microscopy (TEM) has emerged as a powerful tool to characterize subtle defects. This article discusses the sample preparation procedures based on focused ion beam milling used for TEM sample preparation. It describes the principles behind commonly used imaging modes in semiconductor failure analysis and how these operation modes can be utilized to selectively maximize signal from specific beam-specimen interactions to generate useful information about the defect. Various elemental analysis techniques, namely energy dispersive spectroscopy, electron energy loss spectroscopy, and energy-filtered TEM, are described using examples encountered in failure analysis. The origin of different image contrast mechanisms, their interpretation, and analytical techniques for composition analysis are discussed. The article also provides information on the use of off-axis electron holography technique in failure analysis.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400245
EISBN: 978-1-62708-258-7
.... Bragg equation. n 2d sin , where n is the order of re ection, is the wavelength of x-rays, d is the distance between lattice planes, and is the Bragg angle. See also order (in x-ray re ection). Bragg method. A method of x-ray diffraction in which a single crystal is mounted on a spectrometer...
Abstract
This chapter presents definitions of terms related to the metallurgy and metallographic study of irons and steels.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410001
EISBN: 978-1-62708-265-5
... Spectroscopy (EDS). In Electron Probe Microanalyzers the spectra are resolved with better resolution by diffraction of the characteristic Xrays from single crystals in a process referred to as Wavelength Dispersive Spectroscopy (WDS) ( Ref 1.3 ). Auger Electron Spectroscopy The X-ray spectra generated...
Abstract
This chapter provides perspective on the physical dimensions associated with the microstructure of steel and the instruments that reveal grain size, morphology, phase distributions, crystal defects, and chemical composition, from which properties and behaviors derive. The chapter also reviews the definitions and classifications used to identify and differentiate commercial steels, including the AISI/SAE and UNS designation systems.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.9781627082587
EISBN: 978-1-62708-258-7
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780343
EISBN: 978-1-62708-281-5
..., for example, Cu k-alpha at 1.542 Å. Crystal diffraction follows Bragg’s law: n λ = 2 d sine θ where n is a constant (usually 1), λ is the wavelength of the x-ray, d is the interplanar spacing of the crystalline material, and sine θ is the experimental diffraction angle. A powder...
Abstract
This article introduces procedures an engineer or materials scientist can use to investigate failures. It provides a brief survey of polymer systems and key properties that need to be measured during failure analysis. The article begins with an overview of the problem-solving approach pertinent to structure analysis. This is followed by a review of the characterization of plastics by infrared and nuclear magnetic resonance spectroscopy. The article then provides information on the distribution of molecular weight of an engineering plastic. It further discusses the methods used in thermal analysis, namely differential thermal analysis, thermogravimetric analysis, thermal-mechanical analysis, and dynamic mechanical analysis. The following sections provide details on X-ray diffraction for analyzing crystalline phases and on a minimal scheme for polymer analysis and characterization to assist the design engineer. The article ends with a discussion on the thermal-analytical scheme for analyzing the milligram quantities of polymer samples.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... spectroscopy is based on the phenomenon of Bragg diffraction of x-rays incident on a crystal, and it yields a more precise quantitative estimate of the elements. Details pertaining to both these techniques can be found in Ref 5.1 and 5.2 . A unique aspect of SEM is that it is able to image in both...
Abstract
This chapter elucidates the indispensable role of characterization in the development of cold-sprayed coatings and illustrates some of the common processes used during coatings development. Emphasis is placed on the advanced microstructural characterization techniques that are used in high-pressure cold spray coating characterization, including residual-stress characterization. The chapter includes some preliminary screening of tool hardness and bond adhesion strength, as well as a distinction between surface and bulk characterization techniques and their importance for cold spray coatings. The techniques covered are optical microscopy, X-Ray diffraction, scanning electron microscopy, focused ion beam machining, electron probe microanalysis, transmission electron microscopy, and electron backscattered diffraction. The techniques also include electron channeling contrast imaging, X-Ray photoelectron spectroscopy, X-ray fluorescence, Auger electron spectroscopy, Raman spectroscopy, oxygen analysis, and nanoindentation.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 1998
DOI: 10.31399/asm.tb.ts5.t65900045
EISBN: 978-1-62708-358-4
... extraction ( Ref 7 ). Electron microprobes use single-crystal spectrometers set to diffract only the radiation from a given element, a process referred to as wavelength dispersive spectroscopy (WDS) and which is capable of high-precision chemical analysis. Characteristic x-ray intensity from the chemical...
Abstract
This chapter describes the various phases that form in tool steels, starting from the base of the Fe-C system to the effects of the major alloying elements. The emphasis is on the phases themselves: their chemical compositions, crystal structures, and properties. The chapter also provides general considerations of phases and phase diagrams and the determination of equilibrium phase diagrams. It describes the formation of martensite, characteristics of alloy carbides, and the design of tool steels.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 31 January 2024
DOI: 10.31399/asm.tb.pdktmse.t56100001
EISBN: 978-1-62708-470-3
... reactions occur, and how x-ray diffraction identifies the actual phases present. It demonstrates the use of tie lines for determining phase composition at different temperatures and the application of the level rule to calculate phase fractions. It also discusses the CALPHAD method and presents computed...
Abstract
Phase diagrams serve as a map to the phases present in an alloy at different temperatures and compositions. They also help in assessing mechanical properties, selecting heat treat temperatures, warning of possible solidification problems, and identifying routes for creating desired microstructures. This chapter familiarizes readers with the information contained in binary phase diagrams and the methods used to extract it. It explains how thermocouple measurements are used to determine liquidus, solidus, and eutectic reaction lines, how differential scanning calorimetry shows where phase reactions occur, and how x-ray diffraction identifies the actual phases present. It demonstrates the use of tie lines for determining phase composition at different temperatures and the application of the level rule to calculate phase fractions. It also discusses the CALPHAD method and presents computed binary phase diagrams that account for the presence of inclusions, oxygen content, and secondary phases.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
.... Two methods are widely used to analyze the energy spectrum of the x-rays. The first one is a method called wavelength dispersion spectroscopy (WDS), in which the spectrum of emitted x-rays is directed toward a crystal of known plane spacing. The angle at which diffraction occurs depends...
Abstract
This chapter discusses the use of electron microscopy in metallographic analysis. It explains how electrons interact with metals and how these interactions can be harnessed to produce two- and three-dimensional images of metal surfaces and generate crystallographic and compositional data as well. It discusses the basic design and operating principles of scanning electron microscopes, transmission electron microscopes, and scanning transmission electron microscopes and how they are typically used. It describes the additional information contained in backscattered electrons and emitted x-rays and the methods used to access it, namely wavelength and energy dispersive spectroscopy and electron backscattering diffraction techniques. It also describes the role of focused ion beam milling in sample preparation and provides information on atom probes, atomic force microscopes, and laser scanning microscopes.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... the angle and characteristics of the diffracting crystal). Alternatively, the counter can be set to a series of predetermined wavelengths corresponding to the elements in the sample (presuming this is known or has already been determined), and the numbers of x-rays at each of these wavelengths counted...
Abstract
The overall chemical composition of metals and alloys is most commonly determined by x-ray fluorescence (XRF) and optical emission spectroscopy (OES). High-temperature combustion and inert gas fusion methods are typically used to analyze dissolved gases (oxygen, nitrogen, and hydrogen) and, in some cases, carbon and sulfur in metals. This chapter discusses the operating principles of XRF, OES, combustion and inert gas fusion analysis, surface analysis, and scanning auger microprobe analysis. The details of equipment set-up used for chemical composition analysis as well as the capabilities of related techniques of these methods are also covered.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220001
EISBN: 978-1-62708-259-4
... Scale (approximate dimensions) Characterization techniques Crystalline structure (Å) X-ray diffraction Transmission electron microscopy (electron diffraction) Structural features in the range of 10–100 nm (dislocations, stacking faults, ultrafine grains, etc.) Transmission electron microscopy...
Abstract
This chapter discusses the engineering significance of steel and briefly describes its chemical composition, crystal structure, Fe-C phases, and associated characterization techniques.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1983
DOI: 10.31399/asm.tb.mlt.t62860295
EISBN: 978-1-62708-348-5
... f.c.c.→h.c.p. (stacking fault energy at room temperature) d Dulieu, Nutting (1964) 0 5 14 34 I 36 (Ti), 32 (Cu), –0.55 (Co) Electron microscopy Schramm, Reed (1975) –530 7 62 32 93 7 alloys, x-ray, literature data-regression analysis. Rhodes, Thompson (1977...
Abstract
This chapter concentrates on very low-temperature martensitic transformations, which are of great concern for cryogenic applications and research. The principal transformation characteristics are reviewed and then elaborated. The material classes or alloy systems that exhibit martensitic transformations at very low temperatures are discussed. In particular, the martensitic transformations and their effects in austenitic stainless steels, iron-nickel alloys, practical superconductors, alkali metals, solidified gases, and polymers are discussed.
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