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scanning transmission electron microscopy (STEM)

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Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.9781627082921
EISBN: 978-1-62708-292-1
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.t56000001
EISBN: 978-1-62708-292-1
... Abstract This chapter discusses the principles of scanning transmission electron microscopy (STEM) as implemented using conventional scanning electron microscopes (SEMs). It describes the pros and cons of low-energy imaging and diffraction, addresses basic hardware requirements, and provides...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... preparation involves thinning the area of interest containing the defect to achieve electron transparency, which is an irreversible destructive process. A variety of TEM operation modes and techniques, including the conventional parallel beam illumination TEM, scanning transmission electron microscopy (STEM...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.t56000020
EISBN: 978-1-62708-292-1
... at each SEM beam raster spot and reconstruct various real-space images based on those diffraction patterns. This image reconstruction approach is one of numer- ous recent developments in conventional scanning and transmission electron microscopy that also lends itself well to STEM-in-SEM. The Future...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
... is still the most appropriate approach for fine precipitates and fine phase dispersions. Dislocations and their orientations in a crystal can be observed and identified. 6.3 Scanning Transmission Electron Microscopy Like a SEM, scanning transmission electron microscopy (STEM) uses a finely...
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Published: 23 January 2020
Holm More
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Published: 23 January 2020
Caplins More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
...). Another electron microscope, used mainly in a research environment, is the scanning transmission electron microscope (STEM). A description of these four electron microscopes is given subsequently. First, we must understand why electron microscopes are important tools for metallographic analysis...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 30 September 2024
DOI: 10.31399/asm.tb.pmamfa.t59400391
EISBN: 978-1-62708-479-6
... PP polypropylene SAD selected area diffraction SE secondary electron SEM scanning electron microscopy SL sheet lamination SLA stereolithography SLM selective laser melting SLS selective laser sintering STEM scanning transmission electron microscopy TEM...
Series: ASM Technical Books
Publisher: ASM International
Published: 30 September 2024
DOI: 10.31399/asm.tb.pmamfa.t59400027
EISBN: 978-1-62708-479-6
...-field mode. In bright-field TEM, the study of nanoparticles with higher atomic mass appears to be dark due to electron scattering by nanoparticles. Scanning transmission electron microscopy (STEM) offers several imaging modes, such as high-angle annular dark-field and electron energy-loss spectroscopy...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110413
EISBN: 978-1-62708-247-1
... at low magnification one can increase the working distance which will produce a lower beam deflection angle for a given magnification. Figure 11 Pincushion distortion in a low magnification SEM image. Sample Charging One of the greatest challenges in scanning electron microscopy is how...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110335
EISBN: 978-1-62708-247-1
... be incorporated to collect signals with trajectories parallel to the optical axis. In-lens BSE detectors are commonly used to monitor FIB milling processes [21] . Electron transmission detectors enable scanning transmission electron microscopy (STEM) which are useful where features are resolvable to >0.6 nm...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... coatings. The techniques covered are optical microscopy, X-Ray diffraction, scanning electron microscopy, focused ion beam machining, electron probe microanalysis, transmission electron microscopy, and electron backscattered diffraction. The techniques also include electron channeling contrast imaging, X...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.9781627082815
EISBN: 978-1-62708-281-5
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... analysis in SAM; light-element analysis in STEM where scattering is in forward direction Secondary ~5 eV Loosely bound electrons scattered from surface Main signal for image formation in SEM SEM, scanning electron microscope; STEM, scanning transmission electron microscope; SAM, scanning Auger...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780433
EISBN: 978-1-62708-281-5
...-butadiene-styrene styrene-ethylene-butylene-styrene size-exclusion chromatography scanning electron microscopy short- ber-reinforced polymer secondary ion mass spectroscopy styrene-maleic anhydride sheet molding compound sheet molding compound Society of Plastics Engineers structural reaction injection...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... or other methods for viewing in a TEM (transmission electron microscope) or STEM (scanning transmission electron microscope.) Thin samples can also be viewed in an ordinary SEM by using a STEM detector [5] or a special sample holder [6 , 7] . For EDS elemental mapping of thin samples in a SEM, one...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110196
EISBN: 978-1-62708-247-1
... wavelengths. Introduction Multiple scanning optical microscopy methods for integrated circuit (IC) FA have become essential tools to locate and diagnose defects and failure sites. The popularity of laser-based approaches stems from their relatively straight forward application, information delivered...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.9781627084628
EISBN: 978-1-62708-462-8
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110153
EISBN: 978-1-62708-247-1
... requirements and hopefully dispel many of the associated myths and assumptions. Many have heard Analysts and Scientists in our field refer to sample preparation as “Black Magic” stemming from a lack of understanding for the complexities of sample preparation. Leading to an oversight of the nearly infinite...