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scanning electron microscopy (SEM)

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Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.9781627082921
EISBN: 978-1-62708-292-1
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Published: 30 September 2023
Figure 7.16: Rolled aluminum strip surface as viewed by (a) optical microscopy and (b) scanning electron microscopy (SEM). More
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Published: 01 January 2000
Fig. 22 Filiform corrosion of PVC-coated aluminum foil. (a) Advancing head and cracked tail section of a filiform cell. Scanning electron microscopy (SEM), 80×. (b) The gelatinous corrosion products of aluminum oozing out of the porous end tail section of a filiform cell. SEM. 830×. (c) Tail More
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Published: 01 December 2016
Fig. 2.8 Microstructure of the AlSi9Cu alloy, particles of the θ Cu phase, in (αAl + θ Cu + β MgSi + Si) eutectic, etch. Weck-1. Source: Ref 18 . (a) LM. (b) Scanning electron microscopy (SEM); in eutectic melting area (αAl + θ Cu + Si + β MgSi + Q), etch. Wilcox(5), Source: Ref 12 . (c More
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Published: 01 December 2016
Fig. 1.3 Endogenous dendrite grains of αAl solid solution. (a) Dendrite grains and visible dendrite axis: primary and those of next orders. (b) Morphology of the dendrite branches. Scanning electron microscopy (SEM) More
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Published: 01 December 2016
Fig. 3.3 Microstructure of alloy AlSi7Mg, sand mold, wall thickness 3 cm. (a–e) Silicon in the interdendritic eutectic. (f) Enlarged microregion visible in (e), showing silicon lamellae in the interdendritic eutectic. Scanning electron microscopy (SEM), deep etch More
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Published: 01 August 2005
Fig. 3.19 Fully pearlitic steel fatigue fracture surfaces. Crack growth direction is from left to right in both images. (a) Intermediate crack growth rate (~0.1 μm/cycle), and (b) low crack growth rate (~0.001 μm/cycle). No fatigue striations were resolved by scanning electron microscopy (SEM More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270152
EISBN: 978-1-62708-301-0
... failure. aileron control cable scanning electron microscopy SEM fractography visual examination Summary The aileron control cable of an aircraft had failed. It was found damaged. Investigation revealed that the cable had been damaged by a shearing tool. Background The cable...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.t56000020
EISBN: 978-1-62708-292-1
..., carbon nanotubes, zeolite sheets, and monolayer graphene. It also describes emerging techniques, including four-dimensional STEM, thermal diffuse scattering, energy filtering, aberration correction, and atomic resolution imaging. diffraction imaging scanning electron microscopy (SEM) scanning...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.t56000001
EISBN: 978-1-62708-292-1
... Abstract This chapter discusses the principles of scanning transmission electron microscopy (STEM) as implemented using conventional scanning electron microscopes (SEMs). It describes the pros and cons of low-energy imaging and diffraction, addresses basic hardware requirements, and provides...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270113
EISBN: 978-1-62708-301-0
.... The chapter provides several recommendations to avoid such failures in the future. cadmium plating chemical analysis elevator hinge pins fractography hydrogen embrittlement scanning electron microscopy SEM fractography Summary In an aircraft that was retrieved from the sea, the hinge pins...
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Published: 23 January 2020
Holm More
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Published: 23 January 2020
Caplins More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090109
EISBN: 978-1-62708-462-8
...-of-the-line (BEOL) levels often need higher scanning electron microscopy (SEM) e-beam accelerating voltage and thus need to be evaluated. Signal-to-noise ratio improvements of EBAC/EBIC/EBIRCH sensing electronics will also be needed. Nanoprobing tools need to continuously improve on reducing e-beam impact...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090131
EISBN: 978-1-62708-462-8
... in the following categories: 1) defect detection and classification; 2) noise reduction in scanning electron microscopy (SEM), transmission electron microscopy (TEM), scanning acoustic microscopy (SAM), and X-ray images; 3) failure mode identification by clustering and pattern recognition; and 4) failure analysis...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2022
DOI: 10.31399/asm.tb.tstap.t56040055
EISBN: 978-1-62708-428-4
... gray pixels. Thresholding of the pores across the higher gamma image was more uniform and the measured pore fraction of 5.0 area% was judged the most accurate. Scanning Electron Microscopy (SEM) SEM images represent energy interaction between the sample and impinging electrons; the materials...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... categories into which different material characterization techniques are grouped are ( Ref 5.1 ): Techniques based on microscopy principles such as optical microscopy, scanning electron microscopy (SEM), transmission electron microscopy (TEM), and focused ion beam microscopy. Techniques based...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
... is still the most appropriate approach for fine precipitates and fine phase dispersions. Dislocations and their orientations in a crystal can be observed and identified. 6.3 Scanning Transmission Electron Microscopy Like a SEM, scanning transmission electron microscopy (STEM) uses a finely...
Series: ASM Technical Books
Publisher: ASM International
Published: 30 September 2024
DOI: 10.31399/asm.tb.pmamfa.t59400027
EISBN: 978-1-62708-479-6
... of crystallization, Δ H f cry is the enthalpy of fusion of the pure sample in crystalline form, and m is the mass of the sample. Microstructure Study The microstructure of powder can be studied by field emission scanning electron microscopy (FESEM), scanning electron microscopy (SEM), or transmission...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... Techniques Nonsurface Specific Methods Nonsurface specific methods include scanning electron microscopy (SEM), electron probe microanalysis (EPMA), and transmission electron microscopy (TEM). Scanning Electron Microscopy, Electron Probe Microanalysis (SEM, EPMA) These methods are better...