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scanning auger microprobe

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Published: 01 April 2013
Fig. 9 Schematic of a scanning Auger microprobe. Source: Ref 3 More
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
...) and, in some cases, carbon and sulfur in metals. This chapter discusses the operating principles of XRF, OES, combustion and inert gas fusion analysis, surface analysis, and scanning auger microprobe analysis. The details of equipment set-up used for chemical composition analysis as well as the capabilities...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
... polishing compound would be appropriate (unless the inclusions contain carbides). More on specimen preparation for the microprobe can be found in the references listed at the end of the chapter. The Scanning Transmission Electron Microscope Although mostly confined to a research laboratory...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
... six methods used in semiconductor industry are: Auger spectroscopy, dynamic secondary ion mass spectroscopy, time of flight static secondary ion mass spectroscopy (ToF-SIMS), X-ray photoelectron spectroscopy, scanning electron microscope-energy dispersive X-ray spectroscopy (SEM-EDX), and transmission...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720001
EISBN: 978-1-62708-305-8
... materials, such as semiconductors and various types of thin films. Of these methods, the scanning Auger microprobe (SAM) is the most widely used. Metallography Metallography is the scientific discipline of examining and determining the constitution and the underlying structure of the constituents...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180151
EISBN: 978-1-62708-256-3
... be done for examination with a scanning electron microscope (SEM) and often to reveal macroscale fractographic features. Cleaning should proceed in stages using the least aggressive procedure first, then proceeding to more aggressive procedures if needed. Washing the fracture surface with water should...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610549
EISBN: 978-1-62708-303-4
... sections Examination and analysis of metallographic specimens Determination of failure mechanism Chemical analysis (bulk, local, surface corrosion products, deposits or coatings, and microprobe analysis) Analysis by fracture mechanics Testing under simulated service conditions (special tests...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 1999
DOI: 10.31399/asm.tb.caaa.t67870191
EISBN: 978-1-62708-299-0
... to a second vendor, hand wiped with a solvent, alkaline cleaned, acid desmutted, sulfuric acid anodized, and hot water sealed. The panels were studied using the scanning electron microscope and microprobe analysis. Both conventional energy-dispersive and Auger analyzers were employed. Figures 13(b...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850060
EISBN: 978-1-62708-260-0
... height is usually ½ to ¾ in. These standard sizes are accommodated by automatic grinding and polishing machines and generally fit within the specimen chambers of the scanning electron microscope (SEM) or microprobe. Samples larger than this can be cut down and mounted or handled unmounted. As the sample...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850165
EISBN: 978-1-62708-260-0
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 1997
DOI: 10.31399/asm.tb.wip.t65930197
EISBN: 978-1-62708-359-1
... examinations are completed, analysis of the material and of the weldment surface may be undertaken by wet chemistry, by electron microprobe, or by x-ray diffraction, Auger electron, or ion-scattering spectrometers. Metallographic Sectioning When study of the fracture surface is complete, sectioning may...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400245
EISBN: 978-1-62708-258-7
... a glazed appearance. Auger electron spectroscopy (AES). A technique for chemical analysis of surface layers that identi es the atoms present in a layer by measuring the characteristic energies of their Auger electrons. ausforming. Hot deformation of metastable austenite within controlled ranges...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.9781627082587
EISBN: 978-1-62708-258-7
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850001
EISBN: 978-1-62708-260-0
.... The chemically absorbed layer was studied after diamond and alumina polishing using AES (auger electron spectroscopy) and SIMS (secondary ion mass spectrometry) techniques, which showed that this layer consisted of oxygen-metal compounds plus sulfur or ammonium compounds, depending on whether polishing...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2007
DOI: 10.31399/asm.tb.htcma.9781627083041
EISBN: 978-1-62708-304-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.9781627082600
EISBN: 978-1-62708-260-0
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1995
DOI: 10.31399/asm.sch6.9781627083546
EISBN: 978-1-62708-354-6
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.stg2.9781627082679
EISBN: 978-1-62708-267-9