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scanning acoustic microscopy

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110010
EISBN: 978-1-62708-247-1
... optical inspection, X-ray inspection, scanning acoustic microscopy, infrared (IR) microscopy, and electrical verification. The article discusses various fault isolation techniques to tackle the wide array of failure signatures, namely IR lock-in thermography, magnetic current imaging, time domain...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110025
EISBN: 978-1-62708-247-1
...-destructive localization techniques. The techniques considered for advanced fault isolation are magnetic current imaging for shorts and opens; infrared thermography for electrical shorts; time-domain-reflectometry for shorts and opens; scanning acoustic microscopy; and 2D/3D X-Ray microscopy. The individual...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2004
DOI: 10.31399/asm.tb.ps.t62440189
EISBN: 978-1-62708-352-2
...Abstract Abstract This chapter presents several materials and processes related to soldering technology. It first provides information on lead-free solders, followed by sections devoted to flip-chip processes, diffusion soldering, and modeling. Scanning acoustic microscopy and fine-focus x-ray...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110067
EISBN: 978-1-62708-247-1
... microscopes [8] . Today’s SAM for IC Package Inspection The application of reflection acoustic microscopy to the inspection of IC packages represents the convergence of the capabilities of focused C-scan and the Stanford SAM. It combines precision mechanical scanning for microscopic inspection...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110550
EISBN: 978-1-62708-247-1
... nondestructive to maintain the integrity of the sample and verify that data collected can match that of the test fail data. When a component and area of interest are identified, additional non-destructive imaging techniques, such as X-Ray imaging and CSAM (Confocal Scanning Acoustic Microscopy) can be used...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110603
EISBN: 978-1-62708-247-1
... and solder dipping may initiate failure mechanisms such as interfacial delamination or bond pad corrosion, which can only be detected through scanning acoustic microscopy. Visual inspection also cannot detect discrepancies in termination plating materials. Such discrepancies can only be detected through...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270019
EISBN: 978-1-62708-301-0
... engine components. Acoustic Microscopy High-frequency ultrasound in the GHz range is passed through the component of interest. The transmitted wave is detected by a rapidly scanning laser beam on the opposite surface. Transmission of these waves is interrupted by flaws present in the material...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110563
EISBN: 978-1-62708-247-1
.... It is typically electrically insulating, which can be a problem or a feature. One advantage for FA is that these seals can be heated to decap them, and gaps are easy to see with SAM (Scanning Acoustic Microscopy) or X-ray. Metal-metal thermocompression bonding requires patterning metal on the two wafers...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
... and quantitative elemental composition of excited volume (a few cubic μm) Carried out in conjunction with scanning electron microscopy (A.3.2) Enables accurate locational analysis of structural phases or corrosion products. Elements from boron up (in atomic number) may be detected. Accuracy often better than ±1...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... in the literature and crystallographic databases. Scanning Transmission Electron Microscopy (STEM) When the electron beam is transmitted through the sample, the electrons are elastically (no energy-loss) and inelastically (energy-loss) scattered. The fraction of inelastically scattered electrons increases...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110587
EISBN: 978-1-62708-247-1
..., confirming the reported failure mode (i.e. leakage or short, open circuit, etc.) is the next important step. Next non-destructive internal and external examinations by optical microscopy, X-ray, C-mode Scanning Acoustic Microscopy (C-SAM) and so on, should be performed. Performing basic electrical...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110506
EISBN: 978-1-62708-247-1
... characterization, for example of an individual bit cell [11] , is useful. This often requires making routing cuts and depositing probe pads using a FIB. Various imaging techniques such as Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) can be employed [12] . Cross-section or plan...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110673
EISBN: 978-1-62708-247-1
... analyst also faces more complex equipment sets. In addition to the curve tracer, optical microscope and decapsulation tools, the analyst must be familiar with a variety of electrical testing hardware, endless electrical fixture configurations, x-ray and acoustic microscopy, electron beam tools, optical...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110016
EISBN: 978-1-62708-247-1
... sectors. Bitmapping of the failing sectors showed both horizonal and vertical sector blocks involved ( Figure 10 ). Scanning Acoustic Microscopy (SAM) analysis did not review any obvious anomaly at the package level (Figures 11). X-ray inspection from the top-view and side-view did not show wire bond...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2008
DOI: 10.31399/asm.tb.fahtsc.t51130503
EISBN: 978-1-62708-284-6
.... There was no evidence of weld defects such as undercut or porosity present in the section. Scanning electron microscopy showed fine striations within the beach mark areas of the pipe. The SEM showed a ductile dimpling structure within the brightly colored band of the fracture surface. Energy-dispersive spectroscopy...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720001
EISBN: 978-1-62708-305-8
... materials for either inherent flaws (such as fractures or cracks), or damage from use. Some common methods are visual, microscopy, liquid or dye penetrant inspection, magnetic particle inspection, eddy current testing, x-ray or radiographic testing, and ultrasonic testing. This chapter provides an overview...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610549
EISBN: 978-1-62708-303-4
... days may be required to remove critical specimens, and so coating the fracture surfaces would be the prudent decision. Cleaning Cleaning of fractured surfaces should be avoided in general but must be done for scanning electron microscopy (SEM) examination and often to reveal macroscopic...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430409
EISBN: 978-1-62708-253-2
... of aging due to corrosion and to identify its source. Energy dispersive spectroscopy in conjunction with scanning electron microscopy (SEM) has proven to be an effective method for qualitative analysis of chemical and scale deposits. Conventional chemical methods, atomic absorption spectrometry, and x-ray...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.mnm2.t53060149
EISBN: 978-1-62708-261-7
... (optical) microscope, with magnifications ranging from ~50 to 1500× and the ability to resolve microstructural features of ~0.2 μm or larger. Another frequently used examination tool in metallography is the scanning electron microscope (SEM). Compared to the light microscope, the SEM can expand...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430204
EISBN: 978-1-62708-253-2
... that the tube was made of plain carbon steel with 0.2 wt% nominal carbon. Fig. 6.50 Failed waterwall tube (a) with window-type fracture and (b) ridges on the fracture surface Scanning electron microscopy examination of the fracture surface showed the presence of fissures and a discontinuous...