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scanning acoustic microscopy

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110010
EISBN: 978-1-62708-247-1
... optical inspection, X-ray inspection, scanning acoustic microscopy, infrared (IR) microscopy, and electrical verification. The article discusses various fault isolation techniques to tackle the wide array of failure signatures, namely IR lock-in thermography, magnetic current imaging, time domain...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110025
EISBN: 978-1-62708-247-1
...-destructive localization techniques. The techniques considered for advanced fault isolation are magnetic current imaging for shorts and opens; infrared thermography for electrical shorts; time-domain-reflectometry for shorts and opens; scanning acoustic microscopy; and 2D/3D X-Ray microscopy. The individual...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110067
EISBN: 978-1-62708-247-1
.... and Quate C. F. , “ A Scanning Acoustic Microscope ,” in 1973 Ultrasonics Symposium , 5-7 Nov. 1973 1973 , pp. 18 - 21 , 10.1109/ULTSYM.1973.196138 . [7] Quate C. F. , Atalar A. , and Wickramasinghe H. K. , “ Acoustic microscopy with mechanical scanning—A review...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... Introduction to Scanning Transmission Electron Microscopy ”, Springer/BIOS Scientific Publishers , 1998 33. Li K. , Er E. and Redkar S. , Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits , 2003 , P. 206 . 34...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110550
EISBN: 978-1-62708-247-1
... and CSAM (Confocal Scanning Acoustic Microscopy) can be used to corroborate the data and give confidence to the analysis path set forth to determine root cause. Once a destructive analysis has begun, there is no way back and limited opportunity to re-measure and recreate fail data. The sample will...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110603
EISBN: 978-1-62708-247-1
... detected through scanning acoustic microscopy. Visual inspection also cannot detect discrepancies in termination plating materials. Such discrepancies can only be detected through material characterization techniques such as XRF spectroscopy. Table 1 Types of Parts Used to Create Counterfeits...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110587
EISBN: 978-1-62708-247-1
... instances, confirming the reported failure mode (i.e. leakage or short, open circuit, etc.) is the next important step. Next non-destructive internal and external examinations by optical microscopy, X-ray, C-mode Scanning Acoustic Microscopy (C-SAM) and so on, should be performed. Performing basic...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110563
EISBN: 978-1-62708-247-1
... frit is that the mating surfaces do not need to be as flat as the other methods. It is typically electrically insulating, which can be a problem or a feature. One advantage for FA is that these seals can be heated to decap them, and gaps are easy to see with SAM (Scanning Acoustic Microscopy) or X-ray...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110016
EISBN: 978-1-62708-247-1
... failing sectors. Bitmapping of the failing sectors showed both horizonal and vertical sector blocks involved ( Figure 10 ). Scanning Acoustic Microscopy (SAM) analysis did not review any obvious anomaly at the package level (Figures 11). X-ray inspection from the top-view and side-view did not show wire...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110506
EISBN: 978-1-62708-247-1
... example of an individual bit cell [11] , is useful. This often requires making routing cuts and depositing probe pads using a FIB. Various imaging techniques such as Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) can be employed [12] . Cross-section or plan views are...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110673
EISBN: 978-1-62708-247-1
... microscopy, electron beam tools, optical beam tools, thermal detection techniques, the focused ion beam (FIB), the scanning probe/atomic force microscope, and a bevy of surface science tools. Many times, the analyst must make do with a limited set of tools, as the cost of purchasing these tools exceeds the...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850060
EISBN: 978-1-62708-260-0
... Abstract This chapter explains how to prepare metallographic samples for light microscopy and how to anticipate and avoid related problems. It describes standard practices and procedures for sectioning, mounting, grinding, and polishing and identifies common defects along with their causes and...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
... Qualitative and quantitative elemental composition of excited volume (a few cubic μm) Carried out in conjunction with scanning electron microscopy (A.3.2) Enables accurate locational analysis of structural phases or corrosion products. Elements from boron up (in atomic number) may be detected. Accuracy often...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2008
DOI: 10.31399/asm.tb.fahtsc.t51130503
EISBN: 978-1-62708-284-6
... the weld and proceeded in between the weld filler metal and HAZ. There was no evidence of weld defects such as undercut or porosity present in the section. Scanning electron microscopy showed fine striations within the beach mark areas of the pipe. The SEM showed a ductile dimpling structure...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720001
EISBN: 978-1-62708-305-8
... either inherent flaws (such as fractures or cracks), or damage from use. Some common methods are visual, microscopy, liquid or dye penetrant inspection, magnetic particle inspection, eddy current testing, x-ray or radiographic testing, and ultrasonic testing. This chapter provides an overview of the...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610549
EISBN: 978-1-62708-303-4
... incident light or transmitted light microscopy. Because they are electrically conductive, the coated replicas may also be examined with an SEM. The amount of information that can be obtained from examination of a fracture surface at low-power magnification is extensive. A careful scan of the exterior...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430409
EISBN: 978-1-62708-253-2
... scanning electron microscopy (SEM) has proven to be an effective method for qualitative analysis of chemical and scale deposits. Conventional chemical methods, atomic absorption spectrometry, and x-ray fluorescence spectroscopy are also used to evaluate chemical deposits. Irrespective of knowledge...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.mnm2.t53060149
EISBN: 978-1-62708-261-7
... microstructural features of ~0.2 μm or larger. Another frequently used examination tool in metallography is the scanning electron microscope (SEM). Compared to the light microscope, the SEM can expand the resolution range by more than two orders of magnitude to approximately 4 nm in routine instruments, with...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2017
DOI: 10.31399/asm.tb.sccmpe2.t55090257
EISBN: 978-1-62708-266-2
... Corrosion Cracking of Light Alloys , Electron Microscopy and Structure of Materials , Thomas G. , Ed., University of California Press , 1972 , p 905 – 919 9.17 Meletis E.I. and Hochman R.F. , Crystallography of Stress Corrosion Cracking in Pure Magnesium , Corrosion , Vol 40...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 1999
DOI: 10.31399/asm.tb.caaa.t67870191
EISBN: 978-1-62708-299-0
...-T6 aircraft wing panel (a) showing unusual surface appearance. (b) Cracked anodized coating on the panel surface. Scanning electron microscopy. 160×. (c) Anodized coating flaking away and corrosion deposit under the coating. Scanning electron microscopy. 85× (d) Cross section of corrosion site on...