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Published: 01 November 2019
Fig. 3 Sampling a PLL output using the PLL input delayed (circuit, waveforms, and the resulting CDF) More
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Published: 01 November 2019
Fig. 8 Undersampling a clock that has jitter (circuit, equivalent sampling resolution, and Q output) More
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Published: 01 January 2017
Fig. 17.9 Sampling procedure for testing various products with C-rings. (a) Tube. (b) Rod and bar. (c) Plate More
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Published: 01 October 2005
Fig. 5.1 SSam surface sampling system: schematic of cutting process. Source: Ref 2 . With kind permission of Exponent Failure Analysis Associates More
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Published: 01 August 1999
Fig. 14 Sampling procedure for testing various products with C-rings. (a) Tube. (b) Rod and bar. (c) Plate More
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Published: 01 January 2022
Fig. 11.14 Sampling cup for thermal analysis. Source: Ref 6 . Courtesy of SinterCast More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110144
EISBN: 978-1-62708-247-1
.... It also presents a case study illustrating the application of CNC milling to isolate MCM leakage failure. chemical etching CNC machining flat lapping frontside sample preparation laser decap method laser etching mechanical milling multi-chip module plasma reactive ion etching...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030023
EISBN: 978-1-62708-349-2
... of mounting methods and when each is advantageous Sample clamping—no mold Cavity mold—casting resin Hand mount Automated polishing X X … Hand polishing … X X Fragile features … X … Length/volume of specimens X z … Multiple samples per mount X z z Quick preparation X...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030067
EISBN: 978-1-62708-349-2
.... 4.7 A carbon fiber composite with a titanium fastener is clamped in a fixture and aligned for sectioning. In this figure, the alignment is performed using a straight edge. This sample will be sectioned through the fastener, with the straight edge providing alignment of the edge of the saw blade...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2022
DOI: 10.31399/asm.tb.tstap.t56040030
EISBN: 978-1-62708-428-4
... both at the top surface and on the cross-section are required to reveal the anisotropic nature of the coating. The observation of a coating surface can typically be performed without additional preparation; however, analysis of the cross-section requires the sample to undergo metallographic preparation...
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Published: 01 November 2019
Figure 14 Comparison of x-ray emission from a bulk sample and from a thin film sample. More
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Published: 01 November 2019
Figure 25 Sample with a corner Micropillar chain fail. The sample was delidded (a) and the failing corner of the top die thinned to 80µm (b & c). PFIB cross section was then carried out to image the defect More
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Published: 01 November 2019
Figure 28 SEM images of the control, the 39% RH sample and the 1.8% RH sample illustrate the amount of wear debris created in each experiment. Arrows indicate the rubbing surfaces. In both stressed samples, the pin joint has been worn down from its fabricated 3 μm diameter. More
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Published: 01 November 2019
Fig. 12 Sample on wheel. Bottom shows the standard position; top is a sample effectively reversed on the wheel. More
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Published: 01 November 2019
Fig. 7 Undersampling a sine wave (sampled signal, sample points, and reconstructed output waveform) More
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Published: 01 August 2018
Fig. 6.9 Sample removal and thinning using FIB. In a sample where the microstructure was revealed by FIB sputtering/cleaning of the surface, the location of the thin sample to be removed is selected and an ion beam–assisted platinum deposition is done on location (a). A trench is dug on each More
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Published: 30 June 2023
Fig. 9.4 Sample tensile data. These limits pertain to samples taken in the longitudinal (rolling) direction. Source: Ref 9.4 More
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Published: 01 June 2022
Figure 2 Mounting orientation. (a) Sample coupon before sectioning. (b) Sample mounted with sectioned face expose. (c) Sample mounted with free edge exposed More
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Published: 01 June 2008
Fig. 2.21 Metallography of unetched and etched samples More
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Published: 01 November 2007
Fig. 3.67 Honeycomb samples after testing at 950 °C (1750 °F) for 154 h for the alloy X honeycomb sample (a) and 317 h for the 214 honeycomb sample (b) in a high-velocity combustion gas stream (0.3 Mach or 100 m/s) generated by a dynamic burner rig. The samples were also subjected to rapid More