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sample selection

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.tb.tt2.t51060001
EISBN: 978-1-62708-355-3
... Tensile Specimens and Testing Machines Tensile Specimens Elastic versus Plastic Deformation Stress-Strain Curves Test Set-Up Sample Preparation Other Factors Influencing the Stress-Strain Curve Test Methodology and Data Analysis Sample Selection Ductility Yield Points True...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... based on focused ion beam milling used for TEM sample preparation. It describes the principles behind commonly used imaging modes in semiconductor failure analysis and how these operation modes can be utilized to selectively maximize signal from specific beam-specimen interactions to generate useful...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2006
DOI: 10.31399/asm.tb.pht2.t51440243
EISBN: 978-1-62708-262-4
.... The steps include selecting proper material and design of the part being treated; determining whether the process is capable of heat treatment; using statistical process control, control charting, and in-process inspection and testing; and applying statistical quality control and final testing (sampling...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030089
EISBN: 978-1-62708-349-2
... of selected light bands. The image is passed through a dichroic mirror that filters some of the spectrum, with the remaining bands passing through a barrier filter. The barrier filter removes all light except that which was emitted (fluoresced) from the sample. It is important to note that with fluorescence...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.t56000001
EISBN: 978-1-62708-292-1
... to extracting the most information from a sample, these detectors usually comprise individually selectable annular elements. Other common detector configurations comprise either single round sensor elements (i.e., photodiodes) or rectangular sensor elements that enable limited angu- lar selectivity (i.e...
Image
Published: 01 August 2018
Fig. 6.9 Sample removal and thinning using FIB. In a sample where the microstructure was revealed by FIB sputtering/cleaning of the surface, the location of the thin sample to be removed is selected and an ion beam–assisted platinum deposition is done on location (a). A trench is dug on each More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780157
EISBN: 978-1-62708-268-6
... or objects. Before any set of data can be analyzed statistically, one must select a statistical distribution that will be used to model the data in terms of the likelihood (or probability) of outcomes from sampling the population of data or objects. The various types and selection of statistical...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.9781627082921
EISBN: 978-1-62708-292-1
Image
Published: 01 August 2018
Fig. 9.38 Selected micrographs from the specimens used to determine the CCT curve of Fig. 9.37 . Sample (a) presents only martensite (and possibly some retained austenite, in view of the measured M s temperature). Samples (b) and (c) show pearlite (in the past, some of the very fine More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030115
EISBN: 978-1-62708-349-2
... the Primary-Mount First Surface Procedure and Selection of the Rough Section Preparation of the Rough Section for Preliminary Mounting Step 4: Grinding the Second Surface Step 1: Trimming the Rough Sample Step 2: Trimming the Sample Mounting the First Surface on a Glass Slide Preparing...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.pnfn.t65900245
EISBN: 978-1-62708-350-8
..., check that the plasma conditions are correctly set in terms of power density, voltage, amperage, pressure, gas ratios, and process temperature. Material selection may also play a role in initiating corrosion. Does the selected material have the necessary corrosion resistance for the given...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2022
DOI: 10.31399/asm.tb.tstap.t56040069
EISBN: 978-1-62708-428-4
... Abstract Abradable coatings (such as Ni-4Cr-4Al/bentonite) are used throughout jet engines, primarily as sacrificial coatings into which moving components wear. This article presents the Accepted Practice for sample preparation of abradable coatings for metallographic analysis, based on round...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1995
DOI: 10.31399/asm.tb.sch6.t68200078
EISBN: 978-1-62708-354-6
... Abstract This chapter discusses the processes and guidelines for selecting a supplier and for specifying and purchasing steel castings. It details the information that is most useful to the casting supplier and purchaser. purchasing policy steel castings Purchasing Policy...
Image
Published: 01 November 2019
Figure 8 Illustration showing how a specific region of a bowed device under test (DUT) can be selected for targeted lapping through tilt adjustments of the Microhub assembly sample holder. More
Image
Published: 01 November 2012
Fig. 13 Effect of surface residual stress on the endurance limit of selected steel. All samples were water quenched except as shown, and all specimen dimensions are given in inches. Source: Ref 9 , 10 More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110402
EISBN: 978-1-62708-247-1
... conditional/possible follow-up analyses) based on information provided by the customer, and the possible implications that these factors have on sample preparation methods to be used. These considerations are crucial prior to selecting downsizing and cross-sectioning method(s), coatings, and/or chemical...
Image
Published: 01 November 2019
Figure 18 A) Overview image of a vertical NAND memory sample cross-section prepared with off-axis Ga FIB polishing. B) High magnification SE image of the BEOL (including bit contacts and select gates) and top of the memory stacks. C) High magnification SE image taken half-way down the memory More
Image
Published: 01 August 2018
Fig. 11.50 Cross section of the plane identified as TS in the hot rolled HY-100 steel presented in Fig. 11.48 , quenched and tempered. (a) Very little evidence of segregation can be noticed. Etchant: nital 2%. (b) TEM of selected region of the sample: tempered martensite. Reproduced More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2022
DOI: 10.31399/asm.tb.tstap.t56040030
EISBN: 978-1-62708-428-4
... grinding operations required later in the sample’s preparation. A simple and effective technique for sample sectioning is to use an abrasive wet cutting procedure, with care given to select cutting parameters to minimize sample damage. The abrasive wet cutting process may typically be conducted using...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2006
DOI: 10.31399/asm.tb.ex2.t69980551
EISBN: 978-1-62708-342-3
... Selection of testing characteristics Planning-guidelines Testing characteristics 1, 2, 3 Product-specific instructions Failure modes and effect analysis Characteristic/defect catalog Operations plan Establishing the extent of testing Sample selection plan AQL (a) Guide to AQL...