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sample preparation

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110144
EISBN: 978-1-62708-247-1
.... It also presents a case study illustrating the application of CNC milling to isolate MCM leakage failure. chemical etching CNC machining flat lapping frontside sample preparation laser decap method laser etching mechanical milling multi-chip module plasma reactive ion etching...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850060
EISBN: 978-1-62708-260-0
... Abstract This chapter explains how to prepare metallographic samples for light microscopy and how to anticipate and avoid related problems. It describes standard practices and procedures for sectioning, mounting, grinding, and polishing and identifies common defects along with their causes...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110153
EISBN: 978-1-62708-247-1
... requirements and hopefully dispel many of the associated myths and assumptions. Many have heard Analysts and Scientists in our field refer to sample preparation as “Black Magic” stemming from a lack of understanding for the complexities of sample preparation. Leading to an oversight of the nearly infinite...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400169
EISBN: 978-1-62708-258-7
... , American Society for Metals , 1984 One of the most important steps in metallographic practice is to obtain as much information as possible about the material being evaluated before preparing the sample. In some metallographic laboratories, a work request form is required. The form details...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... Abstract The ultimate goal of the failure analysis process is to find physical evidence that can identify the root cause of the failure. Transmission electron microscopy (TEM) has emerged as a powerful tool to characterize subtle defects. This article discusses the sample preparation procedures...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110413
EISBN: 978-1-62708-247-1
... Abstract This article provides an overview of how to use the scanning electron microscope (SEM) for imaging integrated circuits. The discussion covers the principles of operation and practical techniques of the SEM. The techniques include sample mounting, sample preparation, sputter coating...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110402
EISBN: 978-1-62708-247-1
... Abstract Cross-sectioning refers to the process of exposing the internal layers and printed devices below the surface by cleaving through the wafer. This article discusses in detail the steps involved in common cross-sectioning methods. These include sample preparation, scribing, indenting...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
... and emitted x-rays and the methods used to access it, namely wavelength and energy dispersive spectroscopy and electron backscattering diffraction techniques. It also describes the role of focused ion beam milling in sample preparation and provides information on atom probes, atomic force microscopes...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220101
EISBN: 978-1-62708-259-4
... features along with cooling conditions and sample preparation procedures. austenite cementite ferrite hyper-eutectoid steel hypo-eutectoid steel microstructure pearlite This chapter introduces the basic concepts of the phases and constituents present in the simpler steels in conditions...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110563
EISBN: 978-1-62708-247-1
... them. The chapter also provides information on the testing of MEMS devices. It covers the two common challenges in sample preparation for MEMS: decapping, or opening up the package, without disturbing the MEMS elements; and removing MEMS elements for analysis. Finally, the chapter discusses the aspects...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 February 2005
DOI: 10.31399/asm.tb.chffa.t51040025
EISBN: 978-1-62708-300-3
... Abstract This chapter explains how to determine flow stress and forgeability using data from tensile tests, compression tests, ring tests, and torsion tests. It describes sample preparation, tooling and equipment, test procedures, error sources, and data plotting techniques. It also provides...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850543
EISBN: 978-1-62708-260-0
... Abstract This appendix lists attack-polishing solutions and procedures used in metallographic sample preparation. attack polishing metals ...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850552
EISBN: 978-1-62708-260-0
... Abstract This appendix lists chemical polishing solutions and procedures used in metallographic sample preparation. chemical polishing metals ...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110323
EISBN: 978-1-62708-247-1
... identification, and circuit editing. The article also presents methods to prepare electron beam probing samples where some remaining silicon is required for the transistor functions and transmission electron microscope samples from units where the substrate silicon has been partially or completely removed...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220069
EISBN: 978-1-62708-259-4
... Abstract This chapter explains how to prepare material samples for optical microscopy, the most common method for characterizing the microstructure of cast iron and steel. It provides information on sectioning, mounting, polishing, etching, and recording. It describes the nature of surface...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110025
EISBN: 978-1-62708-247-1
... Abstract In embedded systems, the separation between system level, board level, and individual component level failure analysis is slowly disappearing. In order to localize the initial defect area, prepare the sample for root cause analysis, and image the exact root cause, the overall...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220039
EISBN: 978-1-62708-259-4
... reproduction, lighting, and image enhancement techniques. etching macrographic examination photographic reproduction sample preparation Macrographic examination is the examination under low or no magnification of a polished plane section of a part or a metallic sample, usually subjected...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400087
EISBN: 978-1-62708-258-7
.... After rinsing in water and drying, printer’s ink was rolled on the etched surface, and the sample was pressed onto a piece of paper. The direct transfer is seen in Fig. 4.4 . Fig. 4.4 A macrograph of the Elbogen iron meteorite prepared in 1808 by Widmanstätten and Schreibers using heavy etching...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110335
EISBN: 978-1-62708-247-1
... , and Giannuzzi L. A. . “ Advances in TEM Sample Preparation Using a Focused Ion Beam. ” Microscopy and Microanalysis 14 , no. S2 ( August 2008 ): 380 – 81 . 10.1017/S1431927608086030 [45] Giannuzzi LA , Stevie FA , “ A review of focused ion beam milling techniques for TEM specimen...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110550
EISBN: 978-1-62708-247-1
... to inspect the various components of 2.5D and 3D packages to increase the likelihood of identifying defects and other issues. Destructive analysis serves to be the final step in defect validation. It is crucial to image the actual defect without the influence of sample preparation induced...