1-20 of 453 Search Results for

sample preparation

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110144
EISBN: 978-1-62708-247-1
.... It also presents a case study illustrating the application of CNC milling to isolate MCM leakage failure. chemical etching CNC machining flat lapping frontside sample preparation laser decap method laser etching mechanical milling multi-chip module plasma reactive ion etching...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030023
EISBN: 978-1-62708-349-2
... of mounting methods and when each is advantageous Sample clamping—no mold Cavity mold—casting resin Hand mount Automated polishing X X … Hand polishing … X X Fragile features … X … Length/volume of specimens X z … Multiple samples per mount X z z Quick preparation X...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030067
EISBN: 978-1-62708-349-2
... pieces of staged pieces of prepreg can be mounted. The use of staged prepreg material provides the opportunity to prepare many sample pieces at one time or to provide a greater view along the length of a prepreg material. However, the staging process can take some time and can alter the resin...
Image
Published: 01 November 2019
Figure 10 Image (a) is the EBAC analysis performed post sample preparation. No discontinuity noted. Images (b) & (c) are ELITE analysis performed to isolate the defect location (possible smearing from sample preparation). A hotspot is noted in the micropillar region. Image (d More
Image
Published: 01 November 2019
Figure 11 From D. Barton, et al. “FLIP-Chip and “Backside” Sample Preparation Techniques” More
Image
Published: 01 December 1984
Figure 3-2 Sample preparation can alter the microstructure, as demonstrated by these two micrographs of dual-phase sheet steel. Shearing (left) transformed the retained austenite to martensite, while abrasive cutting (right) did not (retained austenite are small, outlined white particles More
Image
Published: 01 November 2010
Fig. 2.1 Coordinates defined for composite material sample preparation as related to sectioning and viewing planes. Sectioning through the composite thickness on an angle helps in determining ply orientations (i.e., fibers will become elongated). More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2022
DOI: 10.31399/asm.tb.tstap.t56040076
EISBN: 978-1-62708-428-4
... Abstract Molybdenum thermal spray coatings are used in aerospace and other industries for wear resistance applications. Metallographic sample preparation of molybdenum coatings presents unique challenges. The purpose of the investigation described in this article is to determine Accepted...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... Abstract The ultimate goal of the failure analysis process is to find physical evidence that can identify the root cause of the failure. Transmission electron microscopy (TEM) has emerged as a powerful tool to characterize subtle defects. This article discusses the sample preparation procedures...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110402
EISBN: 978-1-62708-247-1
... Abstract Cross-sectioning refers to the process of exposing the internal layers and printed devices below the surface by cleaving through the wafer. This article discusses in detail the steps involved in common cross-sectioning methods. These include sample preparation, scribing, indenting...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030043
EISBN: 978-1-62708-349-2
... 2000 … 10 … 1000 9 2500 … 8 … 1200 6 Fig. 3.9 Cross sections of 120-grit silicon carbide paper that was polished using diamond polishing compound. (a) Unused paper. Bright-field illumination, 50× objective. (b) After the preparation of one sample. A more uniform surface can...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2022
DOI: 10.31399/asm.tb.tstap.t56040030
EISBN: 978-1-62708-428-4
... both at the top surface and on the cross-section are required to reveal the anisotropic nature of the coating. The observation of a coating surface can typically be performed without additional preparation; however, analysis of the cross-section requires the sample to undergo metallographic preparation...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2022
DOI: 10.31399/asm.tb.tstap.t56040069
EISBN: 978-1-62708-428-4
... Abstract Abradable coatings (such as Ni-4Cr-4Al/bentonite) are used throughout jet engines, primarily as sacrificial coatings into which moving components wear. This article presents the Accepted Practice for sample preparation of abradable coatings for metallographic analysis, based on round...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.pnfn.t65900167
EISBN: 978-1-62708-350-8
... preparation. The chapter also discusses the processes involved in the etching of the sample after microhardness testing and provides practices that contribute to the safe preparation of specimens. Examples of nitrided case microstructures, using optical light microscopy, are also presented. References...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110413
EISBN: 978-1-62708-247-1
... Abstract This article provides an overview of how to use the scanning electron microscope (SEM) for imaging integrated circuits. The discussion covers the principles of operation and practical techniques of the SEM. The techniques include sample mounting, sample preparation, sputter coating...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030089
EISBN: 978-1-62708-349-2
..., interference and contrast microscopy, and fluorescence microscopy. The chapter also provides a discussion of sample preparation materials such as dyes, etchants, and stains for the analysis of composite materials using optical microscopy. References References 1. Abromowitz M. , Contrast...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
... and emitted x-rays and the methods used to access it, namely wavelength and energy dispersive spectroscopy and electron backscattering diffraction techniques. It also describes the role of focused ion beam milling in sample preparation and provides information on atom probes, atomic force microscopes...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110563
EISBN: 978-1-62708-247-1
... them. The chapter also provides information on the testing of MEMS devices. It covers the two common challenges in sample preparation for MEMS: decapping, or opening up the package, without disturbing the MEMS elements; and removing MEMS elements for analysis. Finally, the chapter discusses the aspects...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850543
EISBN: 978-1-62708-260-0
... Abstract This appendix lists attack-polishing solutions and procedures used in metallographic sample preparation. attack polishing metals Metallography Principles and Practice George F. Vander Voort, p 543-551 DOI: 10.31399/asm.tb.mpp.t67850543 Copyright © 1999 ASM International® All...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850552
EISBN: 978-1-62708-260-0
... Abstract This appendix lists chemical polishing solutions and procedures used in metallographic sample preparation. chemical polishing metals Metallography Principles and Practice George F. Vander Voort, p 552-561 DOI: 10.31399/asm.tb.mpp.t67850552 Copyright © 1999 ASM International®...