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quantitative microscopy

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850410
EISBN: 978-1-62708-260-0
... Abstract This chapter covers the emerging practice of quantitative microscopy and its application in the study of the microstructure of metals. It describes the methods used to quantify structural gradients, volume fraction, grain size and distribution, and other features of interest...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220025
EISBN: 978-1-62708-259-4
.... , Stereology and Metallurgy , Metals Forum , Vol 5 , ( No. 1 ), 1982 , p 4 – 12 8. DeHoff R.T. and Rhines F.N. , Quantitative Microscopy , McGraw-Hill , 1968 9. Russ J. and DeHoff R.T. , Practical Stereology , Springer , 2000 10.1007/978-1-4615-1233-2 10...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270025
EISBN: 978-1-62708-301-0
... present in the material are observed on the as-polished surface. The inclusion rating can be determined by standard quantitative microscopy techniques. By differences in color, reflectivity, and refractive index, they can also be identified with some prior experience. The polished specimen...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
... R.T. and Rhines F.N. , Quantitative Microscopy , McGraw-Hill , 1968 • Underwood E.E. , Quantitative Stereology , Addison-Wesley , 1970 • Vander Voort G.F. , Etching Techniques for Image Analysis , Microstructural Science , Vol 9 , 1981 , p 137 – 154...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.9781627082600
EISBN: 978-1-62708-260-0
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... of the more frequently used techniques for characterization of boiler tubes are quantitative metallography (i.e., optical microscopy) using an image analyzer, SEM in conjunction with EDS, XRD, emission spectroscopy, XRF, atomic absorption spectrometry (AAS), and surface analysis techniques such as XPS...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... Edition , 2nd ed. , ASM International , 1998 , p 1433 – 1436 10.31399/asm.hb.mhde2.a0003253 4. Jenkins R. , Gould R. , and Gedcke D. , Quantitative X-Ray Spectrometry , Dekker , 1981 , p 16 5. Materials Characterization , Vol 10 , ASM Handbook , ASM International...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
..., chevron markings on brittle fracture surfaces) May be carried out on site. Whole sample/plant may be examined. Photographic recording possible. Requires no specialized equipment Low resolution of damage initiation/mechanism(s), etc. A.2 Optical (light) microscopy Examination of small region...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
..., University of Waterloo, 2011 5.58 Howie A. , Theory of Diffraction Contrast Effects in the Scanning Electron Microscope , Quantitative Scanning Electron Microscopy , Holt D.B. , Muir M. , Grant P. , and Boswarva I. , Ed., London Academic Press , 1974 , p 183 – 212...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420239
EISBN: 978-1-62708-310-2
... now been expanded to include results from electron microscopy. Electron microscopy offers the capability of greater magnification and, in addition, allows quantitative determination of the compositions of individual grains, provided that the microscope is equipped with suitable attachments...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110180
EISBN: 978-1-62708-247-1
... • Landolt-Börnstein: Numerical Data and Functional Relationships in Science and Technology - New Series , 6th ed . Springer ( 2008 ). • Koelzer J. , Boit C. , Dallmann A. , Deboy G. , Otto J. , and Weinmann D. , “ Quantitative emission microscopy, ” J. Appl. Phys...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
... Abstract This chapter discusses the use of electron microscopy in metallographic analysis. It explains how electrons interact with metals and how these interactions can be harnessed to produce two- and three-dimensional images of metal surfaces and generate crystallographic and compositional...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... Abstract This article covers common techniques for surface characterization, including the modern scanning electron microscopy and methods for the chemical characterization of surfaces by Auger electron spectroscopy, X-ray photoelectron spectroscopy, and time-of-flight secondary ion mass...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 1999
DOI: 10.31399/asm.tb.lmcs.t66560283
EISBN: 978-1-62708-291-4
... Abstract This chapter describes the effects that can be observed by light microscopy when a steel in the hardened condition, consisting of martensite and possibly some retained austenite, is heated at subcritical temperatures. It includes micrographs that illustrate the effect of carbide...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.9781627082921
EISBN: 978-1-62708-292-1
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420171
EISBN: 978-1-62708-310-2
... Structures , Metallography and Microstructures , Vol 9 , ASM Handbook , ASM International , 2004 , p 144 – 147 10.31399/asm.hb.v09.a0003733 9.4 Marcinkowski M.J. , Electron Microscopy and Strength of Crystals , Thomas G. and Washburn J. , Ed., Interscience , 1963 9.5...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 May 2018
DOI: 10.31399/asm.tb.hma.t59250047
EISBN: 978-1-62708-287-7
... Abstract This chapter covers the early studies and various discoveries by metals researchers to study the internal structure of metals. The topics covered include light microscopy, phase diagrams, X-ray diffraction, principles of precipitation hardening, and dislocation theory...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110025
EISBN: 978-1-62708-247-1
...-destructive localization techniques. The techniques considered for advanced fault isolation are magnetic current imaging for shorts and opens; infrared thermography for electrical shorts; time-domain-reflectometry for shorts and opens; scanning acoustic microscopy; and 2D/3D X-Ray microscopy. The individual...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400087
EISBN: 978-1-62708-258-7
... upon cooling from the hot-rolling temperature). The segregation pattern elongates during the hot-rolling process. The metallographer determines by standard quantitative microscopy procedures outlined in ASTM E 562 that the bar is 50% ferrite and 50% pearlite. The ferrite constituent is equiaxed...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850267
EISBN: 978-1-62708-260-0
... Abstract This chapter discusses the tools and techniques of light microscopy and how they are used in the study of materials. It reviews the basic physics of light, the inner workings of light microscopes, and the relationship between resolution and depth of field. It explains the difference...