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power-timing devices

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1988
DOI: 10.31399/asm.tb.eihdca.t65220077
EISBN: 978-1-62708-341-6
... discussion of timers, with emphasis on open-loop timing systems. induction heating power-timing devices temperature-control devices vapor-coolant systems water-cooling systems Besides the power supply, other auxiliary pieces of equipment are required in most induction heating installations...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110634
EISBN: 978-1-62708-247-1
... and structural testing. They are described in more detail later in this chapter. Speed and Power Binning Tests In addition to determining if a chip has a defect or not, it is often required to determine the speed at which the device fully operates. For example, the same microprocessor design may operate...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1988
DOI: 10.31399/asm.tb.eihdca.t65220143
EISBN: 978-1-62708-341-6
... with heavy-duty contacts that open or close the circuit between the power line and the induction heating generator. Silicon-controlled rectifier devices are relatively small for the amount of power they can control and are available in different forms. They can produce full-power pulses for lengths of time...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110524
EISBN: 978-1-62708-247-1
... optimization to obtain acceptable lifetimes. Another example is high-power applications, such as DVD burners used for writing data discs where more power enables faster write times. If all the other premature failure mechanisms mentioned above are avoided, the typical lifetime of the device can be tens...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110244
EISBN: 978-1-62708-247-1
...-of-the-art in product offerings. A powerful fault isolation technique that has equally matured over time is Laser Voltage Probing (LVP) [1 - 13] . Originally developed to address the limitations of electron beam probing, LVP has transitioned into a well-established and essential analytical optical technique...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110219
EISBN: 978-1-62708-247-1
... defect localization within 3D packages exemplarily shown in Figure 1 . The technique allows to non-destructively localize resistive opens and electrical shorts within packaged devices by detecting and analyzing defect-related thermal sources caused by the dissipation of electrical power. Figure 1...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110180
EISBN: 978-1-62708-247-1
... signal intensity on supply voltage is problematic with low power technologies, but a shift of the detected spectrum further into the IR may solve this problem. Fundamental Mechanism Electronic Material Properties and Light Emission Electronic devices can emit light correlated to electronic...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110513
EISBN: 978-1-62708-247-1
... bypassing them electrically. Shorts arise from metal filaments falling into active electronics Partial memory loss occurs due to noise and EMI within the on-board supply system and crosstalk effects. Destruction of sensor devices occur by electrostatic discharge (ESD) under powered operation...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110652
EISBN: 978-1-62708-247-1
... The Wunsch-Bell Model for Junction Failure. This relationship describes the behavior of the instantaneous failure power density in a device plotted against the logarithm of the input pulse width ( Fig. 1 ). P F /A = K 1   ×   t − 1 + K 2   ×   t − 1 / 2...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110111
EISBN: 978-1-62708-247-1
... to operate in different mode. Current Imaging for Shorts and Leakages Failures associated with completed circuits can be summarized as shorts, leakage and high resistance (also called resistive opens). For this mode of operation, one powers up the device through the failing pins identified...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110228
EISBN: 978-1-62708-247-1
... the pass/fail boundary, and then start the test loop. To precisely choose the 50% fail rate, the bias must be adjusted while monitoring the fail rate during the test loop. Most testers allow the power supply voltage to be changed while running a test pattern in a loop. Timing changes may not be possible...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720021
EISBN: 978-1-62708-305-8
... inspection Measuring devices Miscellaneous measuring devices Record-keeping devices Macroetching Magnifying Devices Magnifiers can be characterized by magnifying power, focal length, and lens type. Magnifying Power An object appears to increase in size as it is brought closer...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110196
EISBN: 978-1-62708-247-1
... performed. Photocurrent generation near defects will alter the power demands of the test device and this can be used to localize structure and defects. Thermal Gradient Generation and Physical Effects TLS uses an NIR laser beam to thermally stimulate ICs. The laser energy is chosen below...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110666
EISBN: 978-1-62708-247-1
... models used by reliability engineers: Arrhenius, Eyring, and power law models. The chapter concludes with information on failure rates and mechanisms and the two techniques for uncovering reliability issues, namely burn-in and outlier screening. Arrhenius models burn-in screening experiment...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110001
EISBN: 978-1-62708-247-1
... a 1064 nm wavelength laser stimulation. Note: The laser power is measured from the fiber output and not the actual laser delivered to the junction. It is evident that the induced current is at least an order higher without SIL under the same 1064 nm laser intensity. One solution to circumvent...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2015
DOI: 10.31399/asm.tb.piht2.t55050293
EISBN: 978-1-62708-311-9
... mechanical devices. Maintenance requirements should be determined with a preventive maintenance program established according to the needs of the system. Table 14.1 , presented in Chapter 14, “Quality Control,” in this book, provides a model for maintenance requirements. Radio frequency power supplies...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2015
DOI: 10.31399/asm.tb.piht2.t55050025
EISBN: 978-1-62708-311-9
... provides information on fixtures and work-handling devices, quench systems, and load matching and tuning procedures. induction heat treating power supplies THE ELEMENTS THAT make up an induction heat treating system are shown in Fig. 3.1 . These elements are the cooling water for cooling...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1988
DOI: 10.31399/asm.tb.eihdca.t65220241
EISBN: 978-1-62708-341-6
... to 50 times less power than mild steel in the same field. However, some power is always absorbed, and water cooling of the shield may be necessary under some circumstances. Typical Applications of Shields Much like flux robbers ( Chapter 8 ), most shields form simple eddy-current loops or minor...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110209
EISBN: 978-1-62708-247-1
... of the 0° and the -90° image; for isolated heat sources, it is independent of the power of the heat source and emissivity. Thus, the phase signal is inherently emissivity-corrected. The Φ(x,y) values in the phase images measure the time delay of the surface temperature modulation referred...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110279
EISBN: 978-1-62708-247-1
.... With better control over the gate, less voltage is required to turn on the device resulting in improved power efficiency compared to a planar device structure [3] . Industry adopted FinFET MOS structures start at approximately Sub-20nm process nodes. In FinFET structures, charge carriers travel...