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power-timing devices

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1988
DOI: 10.31399/asm.tb.eihdca.t65220077
EISBN: 978-1-62708-341-6
.... Besides the power supply, other auxiliary pieces of equipment are required in most induction heating installations. These include systems for cooling the power supply and induction coil, power-timing devices, temperature-control devices, and materials-handling systems. The first two types of equipment...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110634
EISBN: 978-1-62708-247-1
.../Power-Up Tests I/O Parametric Tests I<sub>DDQ</sub> Testing I/O Performance Testing Logical Tests Speed and Power Binning Tests Characterization Tests The basic idea of functional testing is to test the device in the same way that it will be used in the final application...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1988
DOI: 10.31399/asm.tb.eihdca.t65220143
EISBN: 978-1-62708-341-6
... induction heating stations fed by 20-MW, 10-MW, and 5-MW line-frequency power supplies. The total time from slab delivery to arrival at the rolling mill is 54 min. Because of the complexity of the slab heating system, an automated control system for the operation is mandatory. The over-all control...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110524
EISBN: 978-1-62708-247-1
.... , Barwolff A. , Jaeger A. , Elsasser T. , Bollmann J. , Masselink W.T. , Gerhardt A. , and Donecker J. , “ Deep level spectroscopy of high-power laser diode arrays ,” J Appl Phys , Vol. 84 , #3, pp. 1325 - 1332 , ( 1998 ). 10.1063/1.368201 8. Petroff P.M...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110244
EISBN: 978-1-62708-247-1
... developments implemented by innovative design, test, and process engineers as device performance and functionality regularly re-establish the state-of-the-art in product offerings. A powerful fault isolation technique that has equally matured over time is Laser Voltage Probing (LVP) [1 - 13] . Originally...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110180
EISBN: 978-1-62708-247-1
... techniques will be challenged. The high data rates for IoT can only be realized with ultra low power technologies of 0.5V supply voltage and below. Channel mobility management will play an important role in devices that have less and less atoms in the channel volume. Doping and strain will see a wider...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110219
EISBN: 978-1-62708-247-1
... exemplarily shown in Figure 1 . The technique allows to non-destructively localize resistive opens and electrical shorts within packaged devices by detecting and analyzing defect-related thermal sources caused by the dissipation of electrical power. Figure 1 Example of a complex 3D package: Cross...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110513
EISBN: 978-1-62708-247-1
... as long as the CMOS circuitry is in off-state and not electrically powered up. Fig. 3 Multiple EOS failure signatures in a Hall sensor after ESD impacts during operation. Hall sensor devices are more frequently exposed to ESD events during operation of a car. These sensors have numerous...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110652
EISBN: 978-1-62708-247-1
... by the various ESD models. This can then be used to correlate between actual factory and customer field failures. It is imperative then that the major EOS and ESD models be available to a Device Analysis facility since replication of Failure Signature is seen to be a powerful tool in determining probable cause...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110111
EISBN: 978-1-62708-247-1
... be summarized as shorts, leakage and high resistance (also called resistive opens). For this mode of operation, one powers up the device through the failing pins identified by electrical testing. As it is well known, the current in the circuit generates a magnetic field around it and this magnetic field...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720021
EISBN: 978-1-62708-305-8
... used to designate the magnifying power of a lens, e.g., 10×. If one could focus on an object at one inch (2.5 cm), it would appear 10 times larger. Since one cannot effectively focus the eye at one inch, a lens may be used to do so. Thus, magnification can be defined as the ratio of the apparent...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110228
EISBN: 978-1-62708-247-1
... devices. Although not discussed in this paper, closely related to LADA/SDL are techniques that use the variation of an analog output from the DUT instead of the fail flag for imaging [11 - 13] . The engineer will quickly discover during low magnification imaging that the necessary laser power...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110196
EISBN: 978-1-62708-247-1
... of photocurrent can be obtained and backside photon probing performed. Photocurrent generation near defects will alter the power demands of the test device and this can be used to localize structure and defects. TLS uses an NIR laser beam to thermally stimulate ICs. The laser energy is chosen below...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110001
EISBN: 978-1-62708-247-1
... Reverse PN junction optical-beam induced current using a 1064 nm wavelength laser stimulation. Note: The laser power is measured from the fiber output and not the actual laser delivered to the junction. It is evident that the induced current is at least an order higher without SIL under the same...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110666
EISBN: 978-1-62708-247-1
... acceleration models used by reliability engineers: Arrhenius, Eyring, and power law models. The chapter concludes with information on failure rates and mechanisms and the two techniques for uncovering reliability issues, namely burn-in and outlier screening. Arrhenius models burn-in screening...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110209
EISBN: 978-1-62708-247-1
.... The Φ(x,y) values in the phase images measure the time delay of the surface temperature modulation referred to the power modulation. These values are indeed independent of the magnitude of the heat source, as long as there is no superposition of the temperature fields of neighboring heat sources...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2015
DOI: 10.31399/asm.tb.piht2.t55050025
EISBN: 978-1-62708-311-9
... indication Process diagnostics Power level Heat time Scan speed Rotation speed Part temperature Energy into a part Quench flow Quench pressure Quench temperature Quench concentration Process signature capabilities Quench pressure Quench flow Power level...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1988
DOI: 10.31399/asm.tb.eihdca.t65220241
EISBN: 978-1-62708-341-6
... as 0.61 mm (0.024 in.) can be used reliably. The power absorption into a shield from the electromagnetic field is a function of its permeability and resistivity. Copper, with a permeability of μ = 1, will absorb approximately 30 to 50 times less power than mild steel in the same field. However, some...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110379
EISBN: 978-1-62708-247-1
... at the most critical layers and it is possible to insert the entire die into the FIB-SEM chamber for deprocessing without the need of any logistic concerned. Last but not least is the option with in-situ manipulators to power up the device for electrical contacts. [13] Figure 15 shows a SEM imaging...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2015
DOI: 10.31399/asm.tb.piht2.t55050293
EISBN: 978-1-62708-311-9
... maintenance for induction heat-treating systems is centered on the cooling water systems, the high-frequency electrical output connections from the heat station, the induction coil, any mechanical fixturing, and the quench system, because the power supplies and heat stations have very few mechanical devices...