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post-construction monitoring

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270031
EISBN: 978-1-62708-301-0
... of these techniques are described in this chapter. 5.1 Material Sampling (In-Service and Post-Fracture) 5.2 Fracture Parameters by Small Punch Testing 5.3 Quantitative Fractography 5.4 Fracture Surface Topography Analysis (FRASTA) 5.5 Oxide Dating for Failure Analysis 5.6 Fault Tree Analysis (FTA...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270005
EISBN: 978-1-62708-301-0
... treatment Quench cracks Overheating Undertempering Surface treatment Improper cleaning Improper plating Improper post treatment Assembly Defective joining Misorientation and misalignment Inadequate support Improper tightening Improper balancing Damages...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2006
DOI: 10.31399/asm.tb.cw.t51820203
EISBN: 978-1-62708-339-3
... is a 24 h test in boiling 6% CuSO 4 + 10% H 2 SO 4 solution to which metallic copper is added: evaluation of IGC due to Cr 23 C 6 formation is based on post-exposure visual examination of specimens for fissures after bending. In Practice F, a 120 h boiling test in CuSO 4 + 50% H 2 SO 4 solution...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
..., are discussed in this review article. A TEM sample contains a thin section of the device, which is both transparent under electron beam illumination and encompasses the feature of interest. A variety of TEM sample preparation procedures [8 - 22] can be employed to construct the TEM sample. In FA, focused...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110550
EISBN: 978-1-62708-247-1
... the failing micropillar chain for further fault isolation, the sample was mechanically polished to the start of the micropillars parallel to the trace. The IV bench retest post polishing showed ~200Ω of resistance, indicative of smearing during the mechanical polishing. The sample was analyzed using EBAC...
Series: ASM Technical Books
Publisher: ASM International
Published: 30 April 2020
DOI: 10.31399/asm.tb.bpapp.t59290085
EISBN: 978-1-62708-319-5
... and binder density High shear rates Low interfacial adhesion Binders with insoluble constituents Density differences between phases are the largest cause of separation. This is especially evident when the feedstock turns a corner or diverges. A classic case is during flow around a post...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110153
EISBN: 978-1-62708-247-1
... Aperture Lens (NAIL) were used with a targeted thickness of silicon as per the lens design requirements from 100 µm down to 30 µm RST. The SIL is constructed to match the index of refraction of silicon (3.4) to a spherical or aspherical lens element pressed against or etched into the polished silicon...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110335
EISBN: 978-1-62708-247-1
...] . For this process to be practical, automation is a necessity for both data collection and post-acquisition data processing. Throughout the data acquisition, fiducials are monitored and used to track the slice milling thickness and imaging position [65] . Periodically, as predefined by the operator, the system...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2001
DOI: 10.31399/asm.tb.secwr.t68350011
EISBN: 978-1-62708-315-7
... at intervals to isolate some parts of the line electrically from other parts. Leads may be attached during construction to facilitate the cathodic protection installation when needed. The most reliable performance data are obtained by field tests/surveys. One example would be to monitor and test...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720183
EISBN: 978-1-62708-305-8
... of rinsing, drying, application of developer, and final ultraviolet-light inspection for flaws. The unit does not include stations for preliminary cleaning and post cleaning; these operations often are performed in another area. The equipment shown in Fig. 2 is available in a wide range of sizes and can...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2015
DOI: 10.31399/asm.tb.cpi2.t55030338
EISBN: 978-1-62708-282-2
...-diameter pipelines ranging from 813 to 914 mm (32 to 36 in.) were built. Discovery of oil on Alaska’s North Slope resulted in the construction of the country’s largest pipeline, the Trans-Alaska Pipeline System, with a 1219 mm (48 in.) diameter and 1287 km (800 mi) length. Demand continues to add more...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2015
DOI: 10.31399/asm.tb.cpi2.t55030247
EISBN: 978-1-62708-282-2
... on fixed offshore structures. Source: Ref 106 Fig. 23 Differences in corrosion rate and modality—(a) pitting and (b) general corrosion—as determined by automated, real-time electrochemical corrosion monitoring system using linear polarization resistance, electrochemical noise, and harmonic...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720085
EISBN: 978-1-62708-305-8
... by 64 mm (2.5 in.) deep. A swing arm and post is also for bench use but has height and reach capacities of 0.25 and 0.35 m (9 and 14 in.), respectively. Another type of base is used for mounting the Scleroscope hardness tester on rolls and other cylindrical objects having a minimum diameter of 64 mm...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2012
DOI: 10.31399/asm.tb.smff.t53400129
EISBN: 978-1-62708-316-4
...) experimental measurements. Reprinted with permission from Ref 9.25 Possible ways to avoid the effect of bolster bending are (a) cambering the tools to compensate for the bending effect ( Ref 9.25 ), (b) adding another steel bolster and/or a die post ( Ref 9.9 ), and (c) adding a special pressure pad...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720411
EISBN: 978-1-62708-305-8
... assemblies depends on the same factors as those that affect system selection for other workpieces. The water-washable, post-emulsifiable, and solvent-removable systems have been successfully used for inspecting brazed assemblies. Inspection using liquid penetrants should not be performed prior to brazing...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110351
EISBN: 978-1-62708-247-1
... Continues to Provide Increased Value in Post-Silicon Debug at Each Process Node ,” IEEE-Silicon Debug and Diagnosis Workshop , 2007 . [40] Gonzalez Jj. C. , da Silva M.I.N. , Griffis D. P. , Miau T.T. , and Russell P.E. “ Improvements in Focused Ion Beam Micro-Machining...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720117
EISBN: 978-1-62708-305-8
... of Metallic Materials.” The test consists of three distinct parts: Test piece preparation, geometry, and material condition Test setup and equipment Test The Test Piece Description of Test Material Test Piece Geometry Test Setup Test Procedures Post Test Measurements...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.aceg.9781627082808
EISBN: 978-1-62708-280-8
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110244
EISBN: 978-1-62708-247-1
... and, consequently, maximize profitability. A crucial step in analyzing a failure is to monitor device functionality. Non-contact optical probing techniques serve as a key enabling technology in silicon-level design verification and product debug. Historically, electrical micro-probing and electron beam probing were...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1989
DOI: 10.31399/asm.tb.dmlahtc.9781627083409
EISBN: 978-1-62708-340-9