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polarized-light microscopy

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030089
EISBN: 978-1-62708-349-2
... include bright-field illumination, dark-field illumination, polarized-light microscopy, interference and contrast microscopy, and fluorescence microscopy. The chapter also provides a discussion of sample preparation materials such as dyes, etchants, and stains for the analysis of composite materials using...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850267
EISBN: 978-1-62708-260-0
... on the nature of the problem, the expertise of the investigator, and the available equipment. Microscopy methods for enhancing contrast include the following Dark-field illumination Polarized light Phase contrast Interference methods Filters 4-2 Basic Concepts in Light Optical Theory...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030211
EISBN: 978-1-62708-349-2
..., these analytical methods provide little, if any, information on the origin and microstructure of the crystallinity in the composite. To determine the morphology of thermoplastic-matrix composites, transmitted polarized-light microscopy can be used very effectively. The preparation of thermoplastic-matrix...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030193
EISBN: 978-1-62708-349-2
...,” Polarized Light Microscopy, Olympus Microscopy Resource Center , http://www.olympusmicro.com/primer/techniques/polarized/berekcompensator.html 13. Evans A.G. et al. , Mechanisms of Toughening in Rubber Toughened Polymers , Acta Metall. , Vol 34 ( No. 1 ), 1986 , p 79 – 87 10.1016/0001...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720161
EISBN: 978-1-62708-305-8
...Abstract Abstract This chapter describes the methods and equipment applicable to metallographic studies and discusses the preparation of specimens for examination by light optical microscopy. Five major operations for preparation of metallographic specimens are discussed: sectioning, mounting...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030159
EISBN: 978-1-62708-349-2
... in composite materials. bright-field illumination composite materials dark-field illumination epi-fluorescence microcrack analysis polarized light microscopy The formation of microcracks in composite materials may arise from static-, dynamic-, impact-, or fatigue-loading situations and also...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110042
EISBN: 978-1-62708-247-1
... Silicon Immersion and Solid Immersion Lenses (SILs) Brightfield/Darkfield Polarized Light Microscopy and Liquid Crystal Hot Spot Detection UV Microscopy Infrared Microscopy Silicon Transmission & Surface Reflection Doped Silicon Backside Thinning Photoemission Infrared...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030115
EISBN: 978-1-62708-349-2
...: Transmitted Light, Basics and Beyond , Olympus Corp. , Lake Success, NY , 1987 6. Viney C. , Transmitted Polarized Light Microscopy , McCrone Research Institute , Chicago, IL , 1990 7. Bloss F.D. , An Introduction to the Methods of Optical Crystallography , Saunders College...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030137
EISBN: 978-1-62708-349-2
... and two unidirectional carbon fiber prepreg materials having different thicknesses (areal weights) and fiber types. Slightly uncrossed polarized light, 10× objective As shown in Chapter 5, “Viewing the Specimen Using Reflected-Light Microscopy,” optical microscopy can be used to determine...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.9781627082600
EISBN: 978-1-62708-260-0
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.9781627083492
EISBN: 978-1-62708-349-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030223
EISBN: 978-1-62708-349-2
... of the contrast techniques of transmitted-light microscopy. Figure 13.1 shows an area of a honeycomb-cored sandwich structure composite cross section that is viewed using transmitted polarized light. The 3k-70 plain weave carbon fibers are visible as a black mass or short angled rods, and the epoxy resin...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030245
EISBN: 978-1-62708-349-2
... be remounted to provide adequate handling of the microscopic sample. Polished cross-sectional mounts can be examined with a variety of microscopy techniques, including polarized light, bright- and dark-field illumination, and epi-fluorescence. The damage characteristics depend on many factors, including...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030001
EISBN: 978-1-62708-349-2
... macrophotograph montage. (b) Quasi-isotropic unidirectional prepreg laminate. Slightly uncrossed polarized light, 5× objective, montage. (c) 3k-70 woven carbon fabric laminate. Bright-field illumination, 5× objective, montage Fig. 1.2 Composite materials made from different types of fibers. (a) Woven...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850165
EISBN: 978-1-62708-260-0
... of examples of structures that are observable in the as-polished condition are presented in Chap. 2 . Anisotropic metals, such as beryllium, uranium, or zirconium, can be examined using crossed-polarized light without recourse to etching. Isotropic metals do not respond to polarized light, although...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2016
DOI: 10.31399/asm.tb.ascaam.t59190147
EISBN: 978-1-62708-296-9
... of light polarization on the microscopy image can be achieved by using special filters (polarizer and analyzer). Some of the microstructural constituents, visible in Fig. 4.3 , show a color effect of the birefringence. It proves that observation carried out using polarized light reveals some...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110196
EISBN: 978-1-62708-247-1
..., but rather indirectly through heat diffusion from neighboring regions as indicated in Figure 8 . The FET device regions efficient in converting NIR light into heat are: The polarity of the Seebeck voltage depends on the laser beam position relative to the junction. For example, when the laser beam...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110485
EISBN: 978-1-62708-247-1
...-polarized light is absorbed in the sampling area which lies immediately beneath the SPM probe tip ( Fig. 27 ). By multiplexing two orthogonal lasers and analyzing the change in the Contact Potential Difference (CPD) between the tip and the sample due to alternating carrier generation, one can extract...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230199
EISBN: 978-1-62708-298-3
... R. , 1985 . Beryllium , Metallography and Microstructures , Vol 9 , Metals Handbook , 9th ed. , American Society for Metals , p 389 – 390 Mott R.W. , and Haines H.R. , 1951 . “ The Examination of Metals Under Polarized Light ,” AERE-M/R-791, Oct 16 , 1951 Noland...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030177
EISBN: 978-1-62708-349-2
... through the thickness and using slightly uncrossed polarized reflected light. Depending on the particle type and matrix, the phase may be more or less distinguishable using reflected-light techniques. The use of transmitted-light microscopy provides significantly greater detail of the morphology...