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polarized light microscopy

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030089
EISBN: 978-1-62708-349-2
.... The chapter opens with a discussion of macrophotography and microscope alignment, and then goes on to describe various illumination techniques that are useful for specific analysis requirements. These techniques include bright-field illumination, dark-field illumination, polarized-light microscopy...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850267
EISBN: 978-1-62708-260-0
... on the nature of the problem, the expertise of the investigator, and the available equipment. Microscopy methods for enhancing contrast include the following Dark-field illumination Polarized light Phase contrast Interference methods Filters 4-2 Basic Concepts in Light Optical Theory...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030211
EISBN: 978-1-62708-349-2
... on the origin and microstructure of the crystallinity in the composite. To determine the morphology of thermoplastic-matrix composites, transmitted polarized-light microscopy can be used very effectively. The preparation of thermoplastic-matrix composites for optical microscopic analysis requires...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030193
EISBN: 978-1-62708-349-2
... Compensator,” Polarized Light Microscopy, Olympus Microscopy Resource Center , http://www.olympusmicro.com/primer/techniques/polarized/berekcompensator.html 13. Evans A.G. et al. , Mechanisms of Toughening in Rubber Toughened Polymers , Acta Metall. , Vol 34 ( No. 1 ), 1986 , p 79 – 87...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030159
EISBN: 978-1-62708-349-2
... to fatigue cycling. bright-field illumination composite materials epi-fluorescence dark-field illumination microcrack analysis polarized light microscopy ...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110042
EISBN: 978-1-62708-247-1
... mirrors surrounding the final lens. Polarized Light Microscopy and Liquid Crystal Hot Spot Detection Most forms of natural and artificial illumination produce light waves whose electric field vectors vibrate in all perpendicular planes with respect to the direction of propagation. The electric...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030115
EISBN: 978-1-62708-349-2
.... , Vol 19 , 1992 , p 653 – 657 5. Abromowitz M. , Contrast Methods in Microscopy: Transmitted Light, Basics and Beyond , Olympus Corp. , Lake Success, NY , 1987 6. Viney C. , Transmitted Polarized Light Microscopy , McCrone Research Institute , Chicago, IL , 1990 7...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720161
EISBN: 978-1-62708-305-8
... Abstract This chapter describes the methods and equipment applicable to metallographic studies and discusses the preparation of specimens for examination by light optical microscopy. Five major operations for preparation of metallographic specimens are discussed: sectioning, mounting, grinding...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030137
EISBN: 978-1-62708-349-2
... Microscopy,” optical microscopy can be used to determine the fiber angles in composites made from unidirectional fiber prepreg materials. Also, it was shown that reflected polarized light can be used to further enhance fiber angle differences. Usually, a composite material can be cross sectioned...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.9781627083492
EISBN: 978-1-62708-349-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030001
EISBN: 978-1-62708-349-2
... polarized light with a full wave plate (540 nm), 20× objective. (c) Large spherulitic growth in a carbon fiber composite. Ultrathin section, trans- mitted polarized light with a full wave plate (540 nm), 100× objective Chapter 1 Introduction Composite Materials and Optical Microscopy / 7 Fig. 1.5 Cross...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030223
EISBN: 978-1-62708-349-2
... microscopy. Figure 13.1 shows an area of a honeycomb-cored sandwich structure composite cross section that is viewed using transmitted polarized light. The 3k-70 plain weave carbon fibers are visible as a black mass or short angled rods, and the epoxy resin as first-order magenta. Birefringent...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030245
EISBN: 978-1-62708-349-2
... material in place, minimizing artifacts. The specimen can be remounted to provide adequate handling of the microscopic sample. Polished cross-sectional mounts can be examined with a variety of microscopy techniques, including polarized light, bright- and dark-field illumination, and epi-fluorescence...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850165
EISBN: 978-1-62708-260-0
... of examples of structures that are observable in the as-polished condition are presented in Chap. 2 . Anisotropic metals, such as beryllium, uranium, or zirconium, can be examined using crossed-polarized light without recourse to etching. Isotropic metals do not respond to polarized light, although...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2016
DOI: 10.31399/asm.tb.ascaam.t59190147
EISBN: 978-1-62708-296-9
... of light polarization on the microscopy image can be achieved by using special filters (polarizer and analyzer). Some of the microstructural constituents, visible in Fig. 4.3 , show a color effect of the birefringence. It proves that observation carried out using polarized light reveals some...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.9781627082600
EISBN: 978-1-62708-260-0
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030177
EISBN: 978-1-62708-349-2
... residing in the interlayer region (i.e., light-gray circles). Slightly uncrossed polarized light, 50× objective. (b) Ultrathin section developed from a particle-modified toughened interlayer composite that was sectioned through the thickness. Transmitted light, Hoffman modulation contrast, 40× objective...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110196
EISBN: 978-1-62708-247-1
... Abstract This article reviews the basic physics behind active photon injection for local photocurrent generation in silicon and thermal laser stimulation along with standard scanning optical microscopy failure analysis tools. The discussion includes several models for understanding the local...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230199
EISBN: 978-1-62708-298-3
... (vacuum hot pressed block and rolled sheet) limits the value of magnifications less than 250×. Polarized light also shows the positions from which oxide particles have been “pulled out” of the structure during polishing. These locations generally appear bright white. 16.7 Electron Microscopy...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110485
EISBN: 978-1-62708-247-1
... with specific wavelengths (e.g., 660 nm). The lasers illuminate the sample at specific angles such that only the p-polarized light is absorbed in the sampling area which lies immediately beneath the SPM probe tip ( Fig. 27 ). By multiplexing two orthogonal lasers and analyzing the change in the Contact...