1-20 of 100 Search Results for

polarized light microscopy

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030089
EISBN: 978-1-62708-349-2
...-field illumination, dark-field illumination, polarized-light microscopy, interference and contrast microscopy, and fluorescence microscopy. The chapter also provides a discussion of sample preparation materials such as dyes, etchants, and stains for the analysis of composite materials using optical...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850267
EISBN: 978-1-62708-260-0
... on the nature of the problem, the expertise of the investigator, and the available equipment. Microscopy methods for enhancing contrast include the following Dark-field illumination Polarized light Phase contrast Interference methods Filters 4-2 Basic Concepts in Light Optical Theory...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030211
EISBN: 978-1-62708-349-2
... of the crystallinity in the composite. To determine the morphology of thermoplastic-matrix composites, transmitted polarized-light microscopy can be used very effectively. The preparation of thermoplastic-matrix composites for optical microscopic analysis requires the creation of ultrathin sections so...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030193
EISBN: 978-1-62708-349-2
... Properties of Impact Damage in Carbon Fibre/Epoxy Laminates , Compos. Part A: Appl. Sci. Manuf. , Vol 32 , 2001 , p 1237 – 1242 10.1016/S1359-835X(01)00058-6 12. Davidson M.W. , “The Berek Compensator,” Polarized Light Microscopy, Olympus Microscopy Resource Center , http...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030159
EISBN: 978-1-62708-349-2
... in composite materials. bright-field illumination composite materials epi-fluorescence dark-field illumination microcrack analysis polarized light microscopy The formation of microcracks in composite materials may arise from static-, dynamic-, impact-, or fatigue-loading situations and also...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110042
EISBN: 978-1-62708-247-1
... mirrors surrounding the final lens. Polarized Light Microscopy and Liquid Crystal Hot Spot Detection Most forms of natural and artificial illumination produce light waves whose electric field vectors vibrate in all perpendicular planes with respect to the direction of propagation. The electric...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030115
EISBN: 978-1-62708-349-2
.... These methods include: Bright field Polarized light Phase contrast Differential interference contrast (DIC), also known as Nomarski Modulation contrast, also known as Hoffman modulation contrast Epi-illumination Optical staining The various methods of transmitted optical microscopy...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720161
EISBN: 978-1-62708-305-8
... Abstract This chapter describes the methods and equipment applicable to metallographic studies and discusses the preparation of specimens for examination by light optical microscopy. Five major operations for preparation of metallographic specimens are discussed: sectioning, mounting, grinding...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030137
EISBN: 978-1-62708-349-2
... uncrossed polarized light, 10× objective Fiber Orientation Verification As shown in Chapter 5, “Viewing the Specimen Using Reflected-Light Microscopy,” optical microscopy can be used to determine the fiber angles in composites made from unidirectional fiber prepreg materials. Also, it was shown...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.9781627083492
EISBN: 978-1-62708-349-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030001
EISBN: 978-1-62708-349-2
...). The manufacturing of prepreg is usu- 6 / Optical Microscopy of Fiber-Reinforced Composites Fig. 1.4 Crystallinity in thermoplastic-matrix carbon fiber composites. (a) Crystalline region in the center area of a woven carbon fabric com- posite cross section. Ultrathin section, transmitted polarized light with a full...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030223
EISBN: 978-1-62708-349-2
... into the composite system performance. To perform this analysis, an ultrathin section (0.5 to 5 μm) must be developed from the honeycomb sandwich structure composite part to be able to use all of the contrast techniques of transmitted-light microscopy. Figure 13.1 shows an area of a honeycomb-cored sandwich...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030245
EISBN: 978-1-62708-349-2
... be remounted to provide adequate handling of the microscopic sample. Polished cross-sectional mounts can be examined with a variety of microscopy techniques, including polarized light, bright- and dark-field illumination, and epi-fluorescence. The damage characteristics depend on many factors, including...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850165
EISBN: 978-1-62708-260-0
... of examples of structures that are observable in the as-polished condition are presented in Chap. 2 . Anisotropic metals, such as beryllium, uranium, or zirconium, can be examined using crossed-polarized light without recourse to etching. Isotropic metals do not respond to polarized light, although...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.9781627082600
EISBN: 978-1-62708-260-0
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2016
DOI: 10.31399/asm.tb.ascaam.t59190147
EISBN: 978-1-62708-296-9
... of light polarization on the microscopy image can be achieved by using special filters (polarizer and analyzer). Some of the microstructural constituents, visible in Fig. 4.3 , show a color effect of the birefringence. It proves that observation carried out using polarized light reveals some...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230199
EISBN: 978-1-62708-298-3
... (vacuum hot pressed block and rolled sheet) limits the value of magnifications less than 250×. Polarized light also shows the positions from which oxide particles have been “pulled out” of the structure during polishing. These locations generally appear bright white. 16.7 Electron Microscopy...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110196
EISBN: 978-1-62708-247-1
... Abstract This article reviews the basic physics behind active photon injection for local photocurrent generation in silicon and thermal laser stimulation along with standard scanning optical microscopy failure analysis tools. The discussion includes several models for understanding the local...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030177
EISBN: 978-1-62708-349-2
... lead to ambient- and elevated-temperature property degradation. In the following figures, ultrathin sections were developed from the composite materials to use transmitted-light optical microscopy contrast techniques to determine the phases. Figure 10.1 shows a cross section of a carbon-fiber...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110485
EISBN: 978-1-62708-247-1
... with specific wavelengths (e.g., 660 nm). The lasers illuminate the sample at specific angles such that only the p-polarized light is absorbed in the sampling area which lies immediately beneath the SPM probe tip ( Fig. 27 ). By multiplexing two orthogonal lasers and analyzing the change in the Contact...