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Image
Published: 01 August 2012
Fig. 13.17 Layout of single-point, four-point, six-point, and eight-point cushion system built in the press. Source: Ref 13.2
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Image
Published: 01 August 2012
Fig. 10.15 Vertical stiffness ( C ) of one-point (1p Mech), two-point (2p Mech), and four-point (4p Mech) mechanical presses, bottom knuckle joint (KJ bottom) drives, and top-knuckle joint (KJ top) drives. Source: Ref 10.21
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Image
Published: 01 August 2012
Fig. 10.16 Angular stiffness ( C θ ) of one-point (1p Mech), two-point (2p Mech), and four-point (4p Mech) mechanical presses, bottom knuckle joint (KJ bottom) drives, and top-knuckle joint (KJ top) drives. Source: Ref 10.21
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Published: 01 October 2011
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Published: 01 March 2006
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Published: 01 November 2019
Figure 14 3-point cleaving. A pin provides the stress point when downward force is symmetrically applied equidistant from the weak point. Note the weak point is on the top and the pin is underneath.
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Published: 01 December 1995
Fig. 10-21 Original design, left, of dipper tooth point. Redesigned point increased the service life of the casting.
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Published: 30 November 2013
Fig. 4 Comparison of wedge-shaped cracks and creep voids: (a) triple-point stress rupture (60×); (b) creep cavitation damage (arrows) in a desuperheater inlet header (1000×)
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Published: 01 March 2006
Fig. 2 Ramp-soak, programmable, single-point temperature controller. Courtesy of Honeywell, Inc.
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Published: 01 March 2006
Fig. 7 The aluminum oxide sensor, a type of dew point instrument, measures water content of an atmosphere by change in capacitance between two electrodes. Source: Ref 5
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Published: 01 March 2006
Fig. 8 Use of control charts. Each point represents the average results of a specific number of tests (usually five or ten) taken after given time intervals. Sample values may be plotted as averages as here ( x ¯ chart) or against the value of the range (R chart
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in Crystalline Imperfections and Plastic Deformation
> Elements of Metallurgy and Engineering Alloys
Published: 01 June 2008
Fig. 2.1 Vacancy point defect. Source: Ref 1
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Image
in Crystalline Imperfections and Plastic Deformation
> Elements of Metallurgy and Engineering Alloys
Published: 01 June 2008
Fig. 2.4 Foreign atom point defects. Source: Ref 1
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Image
Published: 01 November 2019
Figure 9 Illumination from a point source spreads at the focus due to diffraction. The spread is least for large N.A. This ultimately limits resolution. On film a well exposed Airy Disk would appear as in the upper right.
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Published: 01 November 2019
Figure 10 Point sources just resolved by Rayleigh and Sparrow Criteria.
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Published: 01 November 2019
Figure 11 Point sources just resolved by Rayleigh and Sparrow Criteria.
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Image
Published: 01 December 1984
Figure 6-9 Example of grain size determination by the triple-point count method and comparison to planimetric (Jeffries) and intercept (Heyn) measurements (reduced 25 percent in reproduction). The above circle has a diameter of 79.8 mm for an area of 5000 mm 2 . The micrograph is a low
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Image
Published: 01 December 1984
Figure 6-14 Example of the determination of grain size in a two-phase alloy using point counting and intercept counting (reduced 25 percent in reproduction). The above microstructure, at 500X, is a sample of Ti-6Al-2Sn-4Zr-2Mo forged at 1750°F (954°C) in the alpha-beta region and annealed
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in Engineered Special Bar Quality Steel (Engineering Steels)
> Metallography of Steels: Interpretation of Structure and the Effects of Processing
Published: 01 August 2018
Fig. 15.26 Region of the axle close to the point where the fatigue crack started, shown in the macrograph of Fig. 15.25 . Weld deposited metal (upper region of the image), heat affected zone in base metal similar to AISI 1050 (lower region of the image). Metallography by I. C. Abud, INT
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in Cast Aluminum-Silicon Alloy—Phase Constituents and Microstructure
> Aluminum-Silicon Casting Alloys: Atlas of Microstructures
Published: 01 December 2016
Fig. 1.14 Heterogeneous nucleus-surface energy equilibrium at the contact point of three phases (L, liquid alloy; C, crystal; S, substrate): λ LS = λ CS + λ LC cosθ. Source: Ref 27 , 28
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