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photon correlation spectroscopy

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110180
EISBN: 978-1-62708-247-1
...: In the spectral range that the commercial PE detectors operate in, there is no maximum. The intensity decreases exponentially with increasing photon energy like the FWHM case in forward bias, but the temperature is not correlating to the environment. Equation 2 describes the spectra of FETs in saturation...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... Abstract This chapter describes some of the most effective tools for investigating boiler tube failures, including scanning electron microscopy, optical emission spectroscopy, atomic absorption spectroscopy, x-ray fluorescence spectroscopy, x-ray diffraction, and x-ray photoelectron...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
... displays the compound trace and a suggested material comparison trace. The FTIR technology uses a detector that captures infrared energy from the specimen as it is being bombarded with photons. A processor with regression software correlates the captured infrared energy to vibration levels...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... Abstract This article covers common techniques for surface characterization, including the modern scanning electron microscopy and methods for the chemical characterization of surfaces by Auger electron spectroscopy, X-ray photoelectron spectroscopy, and time-of-flight secondary ion mass...
Series: ASM Technical Books
Publisher: ASM International
Published: 30 November 2023
DOI: 10.31399/asm.tb.ciktmse.t56080001
EISBN: 978-1-62708-460-4
... (AES), x-ray photon spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (ToF-SIMS). For instance, SEM is widely applied to analyze surface morphology in a sub-micro scale. Surface information such as metal surface consumption and formation of corrosion products or a surface film...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110001
EISBN: 978-1-62708-247-1
... type, common laboratory bench analyzers is sufficient to reveal the anomaly as well. Fault localization (FI) then interrogates the device using localization techniques, typically using photon or laser-based techniques, to isolate possible fail sites. Once the suspected locations are identified...
Series: ASM Technical Books
Publisher: ASM International
Published: 30 November 2023
DOI: 10.31399/asm.tb.ciktmse.9781627084604
EISBN: 978-1-62708-460-4
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110506
EISBN: 978-1-62708-247-1
.... These are powerful ways to look for signal margin and leakage issues. Correlation Studies Various correlation studies should be done in order to look for further signature information and improve the root cause prediction process. In-line process defect data can identify killer and nuisance defects when...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110524
EISBN: 978-1-62708-247-1
... and waveguide layers are grown to contain the carriers and photons, and a “gain layer” is grown near the middle of the structure. Photons are created in this layer when current is passed through the device. This gain layer is usually less than 0.1 µm thick. It is also referred to as the “active layer...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110563
EISBN: 978-1-62708-247-1
... happens during development of a new product. It is at this point where the product/process interactions are first seen, and unpredicted problems always crop up. The best way to establish failure mode/failure mechanism correlations is to build one’s own database for a given MEMS product or product family...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.9781627082532
EISBN: 978-1-62708-253-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110351
EISBN: 978-1-62708-247-1
... is the determination of the stopping point during exposure of the selected interconnect during front side circuit editing. One early technique used ultraviolet light spectroscopy to determine the exposure of the metal interconnect. The collected photons were distinctive of the sputtered or etched material, enabling...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.9781627084628
EISBN: 978-1-62708-462-8
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400245
EISBN: 978-1-62708-258-7
... systems to be used to correlate changes in an experimentally measured quantity with changes in chemical potential. adhesion. Force of attraction between the molecules (or atoms) of two different phases. Contrast with cohesion. adhesive bonding. A materials joining process in which an adhesive, placed...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.9781627082587
EISBN: 978-1-62708-258-7
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1983
DOI: 10.31399/asm.tb.mlt.9781627083485
EISBN: 978-1-62708-348-5