Figure 20 In this figure a resistance measurement made between adjacent passing word line gates using the two terminal backside probing technique is shown. More

Figure 31 Monte-Carlo simulation of the trajectories of 30 keV electrons passing through a 100 nm aluminum thin film. More

Figure 33 Four probe characterization (Ids vs Vgs, step Vds) of a passing transistors with no dislocation shows no Id leakage when the Gate Voltage (Vg) = 0V. More

Figure 36 Two probe characterization results for a passing transistor with no dislocation in the Drain to Well junction. There is no leakage (35uA @ 1V) when the Drain to Well junction is forward biased and no leakage when the Drain to Well junction is reversed biased (Low pA @ 1.8V). More

Figure 40 Transistor characterization results for a neighboring passing 6T – Bitcell showing the Id vs Vg curves for the BL and BLB passgate, pulldown, and pullup transistors. The Vt values and Id drive current values are similar to the failing bitcell. More

Figure 53 Id/Is vs. Vg characterization results on a linear scale for the passing BL pass gate transistor and failing BLB pass gate transistor. The failing BLB transistor shows a Vt shift and suppressed drive current and that is symmetrical for both the forward (Id) and reverse (Is) bias More

Figure 54 Id/Is vs. Vg characterization results on a log scale for the passing BL pass gate transistor and failing BLB pass gate transistor. On the log scale, the sub-threshold performance of the transistors becomes clearly visible and shows that the start of the channel inversion is delayed More

Fig. 5.20 Sketch of a ray diagram of light passing through a convex lens with chromatic aberration. The rays passing through the outer portion of the lens split into different focal lengths of blue, yellow-green, and red light because of the different wavelengths. More

Fig. 5.21 Sketch of a ray diagram of light passing through a convex lens with spherical aberration. The rays passing through the center of the lens (axial rays) have a different focal point than the rays passing through the edge of the lens (marginal rays). More

Fig. 16.5 Probability of passing versus product reliability. To have zero failures in a test with 32 samples, the product reliability must be extremely high. As the reliability decreases below 100%, the probability of passing falls quickly. More

Figure 19 (a) Pass and fail SDL sites. (b) The SDL sites overlaid with the CAD show that it is at an inverter. The defect, later identified, caused the gates to float. In (c) the signal analysis shows a qualitative explanation of how the laser effect of lowering the V t will cause a change More

Figure 52 Schematic of the 6T SRAM bit cell. The BLB pass gate transistor was found to have a higher Vt and lower drive current. More

Fig. 11.25 (Part 1) Tungsten inert-gas butt weld made in 12 mm 0.2% C plate in five passes. Parent metal: 0.20C-0.28Si-1.85Mn (wt%). CE = 0.51. Weld metal: 0.12C-0.10Si-1.66Mn-0.11S (wt%). (a) Weld region. 3% nital. 1×. (b) Weld metal, outer region of outer pass. 200 HV. 1% nital. 100 More

Fig. 11.25 (Part 2) (d) Weld metal, inner region of outer pass. 210 HV. 1% nital. 100×. (e) Weld metal, inner region of outer pass. 210 HV. 1% nital 500×. (f) Weld metal, heat-affected zone of an inner pass. 215 HV. 1% nital. 100×. (g) Weld metal, heat-affected zone of an inner pass More

Fig. 11.26 (Part 1) Tungsten inert-gas weld. (a) to (f) Butt weld made in five passes in 12 mm 0.1 5 % C plate in five passes. Weld metal: 0.08C-0.005Si-0.31 Mn (wt%). (a) Weld region. 3% nital. 1×. (b) Weld metal, as-deposited pass. 1% nital. 100×. (c) and (d) Weld metal More

Fig. 11.26 (Part 2) (e) Weld metal, grain-refined pass. 1% nital. 100×. (f) Weld metal, grain-refined pass. Picral. 1000×. (a) and (h) Weld metal: 0.11C-0.14Si-1.01 Mn (wt%). Butt weld made in seven passes in 14 mm plate. (g) Weld metal, as-deposited pass. 1% nital. 100×. (h) Weld More

Fig. 15.7 Through-wall axial residual stresses for last-pass heat-sink welding (LPHSW) of a 610 mm (24 in.) diam type 304 stainless steel pipe. Source: Ref 15.12 More

Fig. 9.35 Comparison of cooling rates and temperature gradients as workpieces pass into and through the martensite transformation range for a conventional quenching and tempering process and for interrupted quenching processes. (a) Conventional quenching and tempering processes that use oil More

Fig. 12.38 AISI 1006 steel hot rolled, pickled, and subjected to a skin pass cold work (a small cold reduction of the surface to guarantee good surface quality and precise thickness). Equiaxial ferrite and pearlite inside the plate. On the surface region, the ferrite grains are elongated More

Fig. 10-4 Pass sequences for hand and machine welding More