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particle-induced X-ray emission spectroscopy

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
...Abstract Abstract This chapter describes some of the most effective tools for investigating boiler tube failures, including scanning electron microscopy, optical emission spectroscopy, atomic absorption spectroscopy, x-ray fluorescence spectroscopy, x-ray diffraction, and x-ray photoelectron...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270019
EISBN: 978-1-62708-301-0
... Magnetic Particle Testing Eddy Current Inspection Radiography Using x-rays, γ-rays, and Neutrons Ultrasonic Inspection In addition to these conventional NDE techniques, there are certain other techniques that are employed under special circumstances. Acoustic Emission Computed Tomography...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
... Magnetic particle, dry Magnetic particle, wet fluorescent Penetrant, visible Penetrant, fluorescent Radiographic, gamma ray Radiographic, x-ray Eddy current, standard Eddy current, remote field Acoustic emission Visual In situ metallography Austenitic stainless steel P P F NA NA G E...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... Table 5 Comparison of selected surface analysis techniques Technique Probe radiation Analyzed emission Advantages Limitations X-ray photoelectron spectroscopy (XPS or ESCA) X-rays Photoelectrons Nondestructive Depth profiles Oxidation states Quantitative Spot size ≥100 μm (3940 μin...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... imaging, X-Ray photoelectron spectroscopy, X-ray fluorescence, Auger electron spectroscopy, Raman spectroscopy, oxygen analysis, and nanoindentation. cold-sprayed coatings residual-stress analysis hardness bond adhesion strength microscopy spectroscopy diffraction MATERIALS...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
... used in semiconductor industry are: Auger spectroscopy, dynamic secondary ion mass spectroscopy, time of flight static secondary ion mass spectroscopy (ToF-SIMS), X-ray photoelectron spectroscopy, scanning electron microscope-energy dispersive X-ray spectroscopy (SEM-EDX), and transmission electron...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110563
EISBN: 978-1-62708-247-1
... methods. It is typically electrically insulating, which can be a problem or a feature. One advantage for FA is that these seals can be heated to decap them, and gaps are easy to see with SAM (Scanning Acoustic Microscopy) or X-ray. Metal-metal thermocompression bonding requires patterning metal...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110603
EISBN: 978-1-62708-247-1
... induce handling related damage such as ESD if precautions are not taken Tools/Equipment: low power optical macroscope, optical microscope, solvent for marking permanency tests, part datasheet information X-ray inspection Severity: non-destructive, may induce handling related damage such as ESD...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.9781627082532
EISBN: 978-1-62708-253-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... by the annular detector to form the Z-contrast image. X-ray photons are captured to form STEM-EDS elemental map. The bright field detector is retracted from the path of the transmitted beam for STEM-EELS elemental mapping. Figure 19 A planar STEM-BF image of a SRAM bit. The contrast is like...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610549
EISBN: 978-1-62708-303-4
... diffraction identifies crystalline compounds either on the metal surface or as a mass of particles and can be used to analyze corrosion products and other surface deposits. Minor and trace elements capable of being dissolved can be determined by atomic absorption spectroscopy of the solution. X-ray...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110413
EISBN: 978-1-62708-247-1
... purchasing. Energy dispersive x-ray (EDS) analysis is problematic in the ESEM because electron beam scattering into the beam skirt greatly degrades the lateral spatial resolution of the technique. Specimen current methods like EBIC (electron beam induced conductivity), RCI (resistive contrast imaging...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2008
DOI: 10.31399/asm.tb.fahtsc.t51130111
EISBN: 978-1-62708-284-6
... compounds either on the metal surface or as a mass of particles and can be used to analyze corrosion products and other surface deposits. Minor and trace elements capable of being dissolved can be determined by atomic-absorption spectroscopy of the solution. X-ray fluorescence spectrography can be used...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2007
DOI: 10.31399/asm.tb.htcma.t52080259
EISBN: 978-1-62708-304-1
... attack was observed on the tube surface as shown in Fig. 10.8 Chemical compositions of the phases of the corrosion products at different locations were analyzed by energy dispersive x-ray spectroscopy (EDX) with the results summarized as: 1: 1.1% S, 0.7% Al, 0.8% Si, 0.6% Mn, 95% Fe, and trace...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.9781627082587
EISBN: 978-1-62708-258-7
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430409
EISBN: 978-1-62708-253-2
... to corrosion and to identify its source. Energy dispersive spectroscopy in conjunction with scanning electron microscopy (SEM) has proven to be an effective method for qualitative analysis of chemical and scale deposits. Conventional chemical methods, atomic absorption spectrometry, and x-ray fluorescence...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110180
EISBN: 978-1-62708-247-1
... of MOSFETs from different technology nodes under nominal conditions [13] . Figure 18 (a) PE spectra of a forward biased source/body junction from 14/16nm p-type Fin-FET. (b) Calculated bandgap energy of Si 1−x Ge x mixture after [22] , with measured band gap energy for Si-MOSFET and p-type...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180151
EISBN: 978-1-62708-256-3
... tool in failure analysis, particularly in the investigation of large castings and forgings. Radiography uses x-rays or gamma rays, which are directed through the sample to a photographic film. After the film has been developed, it can be examined by placing it in front of a light source...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110335
EISBN: 978-1-62708-247-1
...] . FIB-SEM tomography fills an important gap between TEM analysis and X-Ray tomography [61] . The more recent introduction of plasma FIBs has significantly expanded the volume that can be imaged using FIB tomography [19 , 62] . 3D visualization minimizes misinterpretation of 3D morphology, an inherent...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.mnm2.9781627082617
EISBN: 978-1-62708-261-7