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Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780177
EISBN: 978-1-62708-281-5
.... In addition, details on ad hoc tests used for determining the acceptability of a plastic part for its application are provided, along with typical examples. optical components optical test plastics plastic parts OPTICAL TESTING of plastics includes characterization of materials and analysis...
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Published: 01 November 2019
Figure 48 CMP polished ultra-thin optical image ready for test. Thermal management is required. More
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Published: 01 August 2005
Fig. 2.40 Intergranular fracture of 201-T6 cast aluminum after SCC testing. (a) Optical micrograph, Keller’s etch, approximately 75×. (b) SEM image of fracture surface. Source: Ref 2.26 More
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Published: 01 November 2007
Fig. 6.66 Optical micrograph showing corrosion attack of alloy 600 after testing in HF for 92 h at 650 °C (1200 °F). Source: Ref 72 . Courtesy of Glyn Marsh More
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Published: 01 November 2007
Fig. 6.68 Optical micrograph showing corrosion attack on alloy 625 after testing in HF for 142 h at 650 °C (1200 °F). Source: Ref 72 . Courtesy of Glyn Marsh More
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Published: 01 November 2007
Fig. 6.69 Optical micrograph showing corrosion attack on alloy 601 after testing in HF for 16 h at 650 °C (1200 °F). Source: Ref 72 . Courtesy of Glyn Marsh More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090021
EISBN: 978-1-62708-462-8
... also explains how time-domain and electro-optical terahertz pulse reflectometry are used to find shorts and opens in ICs and how challenges related to heterogenous integration may be met through design for testability (DFT) and built-in self-test (BIST) accommodations and the use of passive interposers...
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Published: 01 November 2007
Fig. 5.40 Microhardness profile and optical micrograph showing severe carburization attack on the 316 specimen with the original as-received surface (solid circle data point) after testing at 649 °C (1200 °F) for 5000 h in He-1500 μatm H 2 -450 μatm CO-50 μatm CH 4 -50 μatm H 2 O. Also shown More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.pnfn.t65900167
EISBN: 978-1-62708-350-8
... preparation. The chapter also discusses the processes involved in the etching of the sample after microhardness testing and provides practices that contribute to the safe preparation of specimens. Examples of nitrided case microstructures, using optical light microscopy, are also presented. References...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110244
EISBN: 978-1-62708-247-1
... Abstract Laser Voltage Probing (LVP) is a key enabling technology that has matured into a well-established and essential analytical optical technique that is crucial for observing and evaluating internal circuit activity. This article begins by providing an overview on LVP history and LVP...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090003
EISBN: 978-1-62708-462-8
... photon emission microscopy spatial resolution technology scaling visible light probing Background Electrical/optical fault isolation (EFI) ( Ref 1 ) is a series of processes succeeding non-destructive testing (NDT) and microscopy in failure analysis (FA) of integrated circuits (ICs...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780193
EISBN: 978-1-62708-268-6
..., replacement with known good component Electronic subassembly performs outside specified range Visual examination, multimeter testing, subassembly testing, replacement with known good component Electrical disconnect Visual examination, magnification, optical microscopy Fractures Visual...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
... and subassemblies from the failed system. There are numerous techniques and technologies available for examining and analyzing components and subassemblies, which are categorized as follows: optical approaches, dimensional inspection and related approaches, nondestructive test approaches, mechanical...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270185
EISBN: 978-1-62708-301-0
... Abstract A pair of bolts on a connecting rod failed during a test run for a prototype engine. They were replaced by bolts made from a stronger material that also failed, one due to fatigue, the other by tensile overload. The fracture surfaces on all four bolts were examined using optical...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270080
EISBN: 978-1-62708-301-0
... test was carried interface. out. The tie-rod withstood the proof loading and there was no cracking after proof loading. 20 m 1P Fig. CH8.3 SEM fractograph showing the brittle nature of fracture P Load applied 2 (a) 200 m (b) Fig. CH8.4 Optical micrograph of the weld zone showing a crack and the Fig...
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Published: 01 November 2007
Fig. 3.71 Optical micrographs showing a thin oxide scale formed on Type 347 foil when tested in laboratory air after 40,000 h at 650 °C (1200 °F) (a) and (b) and thick unprotective oxide scales formed on Type 347 foil when tested in air containing 10% H 2 O after only 10,000 h at the same More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110001
EISBN: 978-1-62708-247-1
... shows a wafer-level FI setup that involves docking a standard production tester to an inverted scanning optical microscope (SOM). Figure 3 Prober configuration for wafer-level testing and dynamic fault isolation. It is apparent that the test setup remains unchanged; the only difference...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780141
EISBN: 978-1-62708-268-6
... on the titanium parts.) After ultrasonic cleaning, the parts were allowed to dry and then were epoxy-bonded to optical elements. After the epoxy cured, the subassemblies underwent shock and vibration testing to confirm bond adequacy. Litton experienced frequent epoxy disbonds during the shock and vibration...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110673
EISBN: 978-1-62708-247-1
... analyst also faces more complex equipment sets. In addition to the curve tracer, optical microscope and decapsulation tools, the analyst must be familiar with a variety of electrical testing hardware, endless electrical fixture configurations, x-ray and acoustic microscopy, electron beam tools, optical...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110025
EISBN: 978-1-62708-247-1
..., electrical testing and optical inspection are limited to guarantee a high FA success yield. Non-destructive testing methods are the best fit to adapt and ensure high quality root cause determination. Scanning acoustic microscopy and X-Ray imaging are used within this application field for many years and have...