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Image
Structure is delta phase (Ni3Nb) in a gamma matrix. Optical microscope, ori...
Available to PurchasePublished: 01 November 2010
Fig. D.5 Structure is delta phase (Ni3Nb) in a gamma matrix. Optical microscope, original magnification 1000×. Condition: Solution treated and aged—solution annealed 1 h at 955 °C (1750 °F), air cooled, aged 8 h at 720 °C (1325 °F), and furnace cooled in 10 h to 620 °C (1150 °F). Source
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Image
Optical microscope image of a 55nm device after mechanical polish. The depr...
Available to PurchasePublished: 01 November 2019
Figure 3 Optical microscope image of a 55nm device after mechanical polish. The deprocessing technique was not adequate resulting in very poor planarity across the die.
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Image
Optical microscope image of a 55nm device deprocessed to the Metal1 layer. ...
Available to PurchasePublished: 01 November 2019
Figure 4 Optical microscope image of a 55nm device deprocessed to the Metal1 layer. The deprocessing recipe was optimized to achieve good planarity across the entire die (See references ).
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An optical microscope image from a unit after the backside silicon etch pro...
Available to Purchase
in Silicon Device Backside De-Processing and Fault Isolation Techniques
> Microelectronics Failure Analysis: Desk Reference
Published: 01 November 2019
Figure 3 An optical microscope image from a unit after the backside silicon etch process was completed. Silicon is removed from regions where the unit appears dark. The few remaining small bright spots are locations where silicon remains.
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Image
Optical microscope images taken from a unit both before (left) and after (r...
Available to Purchase
in Silicon Device Backside De-Processing and Fault Isolation Techniques
> Microelectronics Failure Analysis: Desk Reference
Published: 01 November 2019
Figure 7 Optical microscope images taken from a unit both before (left) and after (right) the dimpling process was performed. The contrast observed in these images is used to determine the endpoint for the dimpling process.
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Image
A) and B) Optical microscope images of good and failed device, respectively...
Available to Purchase
in Surface Analysis and Material Characterization Techniques Used in Semiconductor Industry to Identify and Prevent Failures
> Microelectronics Failure Analysis: Desk Reference
Published: 01 November 2019
Figure 10 A) and B) Optical microscope images of good and failed device, respectively; C) and D) SEM image failed device showing short between two pins causing electrical failure.
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Image
in Overview of Wafer-level Electrical Failure Analysis Process for Accelerated Yield Engineering
> Microelectronics Failure Analysis: Desk Reference
Published: 01 November 2019
Image
Optical microscope image of the surface of a polished and etched iron bar s...
Available to PurchasePublished: 01 November 2007
Fig. 1.1 Optical microscope image of the surface of a polished and etched iron bar showing grains and grain boundaries. Original magnification: 100×. Source: Ref 1.1
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Appearance of various types of steel grains in an optical microscope. Cm, c...
Available to Purchase
in The Various Microstructures of Room-Temperature Steel
> Steel Metallurgy for the Non-Metallurgist
Published: 01 November 2007
Image
Optical microscopic images of the vertical and the cross section of the uni...
Available to PurchasePublished: 01 December 2008
Fig. 9.9 Optical microscopic images of the vertical and the cross section of the unidirectional eutectic solidification structure. (a) Phase diagrams. (b) Lamellar eutectic structure. (c) Rodlike eutectic structure. Courtesy of Y. Kawahara
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Optical microscope images of powder metal samples after sintering with comp...
Available to Purchase
in Relationship of Structure-Properties on the Powder Metal Materials
> Powder Metallurgy and Additive Manufacturing: Fundamentals and Advancements
Published: 30 September 2024
Fig. 8.6 Optical microscope images of powder metal samples after sintering with compaction pressures of A, 245, B 290, and C 368 MPa at (a) 900, (b) 1025, and (c) 1125 °C. Source: Ref 8.36
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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110042
EISBN: 978-1-62708-247-1
... Abstract Moore's Law has driven many degree circuit features below the resolving capability of optical microscopy. Yet the optical microscope remains a valuable tool in failure analysis. This article describes the physics governing resolution and useful techniques for extracting the small...
Abstract
Moore's Law has driven many degree circuit features below the resolving capability of optical microscopy. Yet the optical microscope remains a valuable tool in failure analysis. This article describes the physics governing resolution and useful techniques for extracting the small details. It begins with the basic microscope column and construction. The article discusses microscope adjustments, brightfield and darkfield illumination, and microscope concepts important to liquid crystal techniques. It also discusses solid immersion lenses, infrared and ultraviolet microscopy and concludes with laser microscopy techniques such as thermal induced voltage alteration and external induced voltage alteration.
Book Chapter
Micrograph Gallery
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.sap.t53000139
EISBN: 978-1-62708-313-3
... , 1972 , p 157 – 192 Fig. D.1 Laves phase (white islands) has precipitated at dendrites in the gamma matrix. Optical microscope, original magnification 250x. Condition: Solution treated and aged—solution annealed 1 h at 1095 °C (2000 °F), air cooled, reannealed 1 h at 980 °C (1800 °F), air...
Abstract
This appendix contains detailed micrographs of nickel- and cobalt-base superalloys selected to illustrate the microstructural features described in this book.
Book Chapter
The Various Microstructures of Room-Temperature Steel
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 November 2007
DOI: 10.31399/asm.tb.smnm.t52140021
EISBN: 978-1-62708-264-8
... the various phases. The chapter concludes with a brief review of spheroidized microstructures. electron microscopes grain structure heat treatment microstructure optical microscopes steel THE OPTICAL MICROSCOPE is the principal tool used to characterize the internal grain structure of steels...
Abstract
The mechanical properties of steel are strongly influenced by the underlying microstructure, which is readily observed using optical microscopy. This chapter describes common room-temperature steel microstructures and how they are achieved via heat treatment. It discusses the production of hypo- and hypereutectoid steels and the effect of cooling rate on microstructure. It also examines quenched steels and the phase transformations associated with rapid cooling. It describes the development of lath and plate martensite, retained austenite, and bainite and how to identify the various phases. The chapter concludes with a brief review of spheroidized microstructures.
Image
Specific lighting devices: (a and b) fiber optics, (c) microscope ring ligh...
Available to PurchasePublished: 01 April 2013
Fig. 11 Specific lighting devices: (a and b) fiber optics, (c) microscope ring light, (d) microscope light, (e) ring flash, (f) microscope illuminator using fluorescent and ultraviolet tubes. Source: Ref 1
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Optical path in the vertical illuminator of the metallurgical microscope in...
Available to PurchasePublished: 01 December 1984
Figure 4-13 Optical path in the vertical illuminator of the metallurgical microscope in the bright-field illumination mode. (Courtesy of E. Leitz, Inc.)
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Optical path in the vertical illuminator of the metallurgical microscope in...
Available to PurchasePublished: 01 December 1984
Figure 4-14 Optical path in the vertical illuminator of the metallurgical microscope in the dark-field illumination mode. (Courtesy of E. Leitz , Inc.)
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Schematic illustration of lighting methods in metallographic optical micros...
Available to Purchase
in Metallographic Technique: Micrography
> Metallography of Steels: Interpretation of Structure and the Effects of Processing
Published: 01 August 2018
Fig. 5.1 Schematic illustration of lighting methods in metallographic optical microscopes: (a) oblique or inclined illumination; (b) normal illumination or illumination parallel to the optical axis—the most common method; (c) dark field illumination.
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Image
Stains caused by water retained between the metallic matrix and the graphit...
Available to Purchase
in Metallographic Technique: Micrography
> Metallography of Steels: Interpretation of Structure and the Effects of Processing
Published: 01 August 2018
Fig. 5.13 Stains caused by water retained between the metallic matrix and the graphite in an oxidized cast iron. Sometimes it can take a few seconds or minutes for water to leave cavities. Inverted optical microscopes help accelerate the water exudation. This contributes to damaging
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Book Chapter
Metallographic Technique: Micrography
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220069
EISBN: 978-1-62708-259-4
... is in the range of 220 to 250 nm corresponding to a maximum magnification of about 1400 times (1400x) ( Ref 1 ). Although optical microscopes that can provide magnifications higher than this are available on the market, the results are called “empty” magnifications, because they will not provide additional...
Abstract
This chapter explains how to prepare material samples for optical microscopy, the most common method for characterizing the microstructure of cast iron and steel. It provides information on sectioning, mounting, polishing, etching, and recording. It describes the nature of surface roughness, the factors that contribute to it, and its effect on image quality. It discusses the use of fixturing and holding devices, includes photographic examples of polishing defects and drying marks, and provides an overview of micrographic etchants and the features they reveal. It also describes the steps involved in replicating part surfaces.
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