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optical analysis

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030043
EISBN: 978-1-62708-349-2
...Abstract Abstract Rough grinding and polishing of mounted specimens are required to prepare the composite sample for optical analysis. This chapter describes these techniques for preparing composite materials. First, it provides information on grinding and polishing equipment and describes...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030089
EISBN: 978-1-62708-349-2
...Abstract Abstract The analysis of composite materials using optical microscopy is a process that can be made easy and efficient with only a few contrast methods and preparation techniques. This chapter is intended to provide information that will help an investigator select the appropriate...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110196
EISBN: 978-1-62708-247-1
... reviews the basic physics behind active photon injection for local photocurrent generation in silicon and thermal laser stimulation along with standard scanning optical microscopy failure analysis tools. The discussion includes several models for understanding the local thermal effects on metallic lines...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110010
EISBN: 978-1-62708-247-1
... reflectometry external optical inspection infrared microscopy IR lock-in thermography magnetic current imaging package failure analysis scanning acoustic microscopy time domain reflectometry X-ray inspection ...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110042
EISBN: 978-1-62708-247-1
... Microscopy Photoemission High NA Macro Lenses Thermal Infrared Hot Spot Detection Laser Signal Injection Microscopy Moore’s Law has driven many circuit features below the resolving capability of optical microscopy. Yet the optical microscope remains a valuable tool in failure analysis...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... as the capabilities of related techniques of these methods are also covered. chemical composition dissolved gases high-temperature combustion inert gas fusion methods optical emission spectroscopy scanning auger microprobe surface analysis X-ray fluorescence spectroscopy THE OVERALL CHEMICAL...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110499
EISBN: 978-1-62708-247-1
... know-how-based analysis techniques of array failures by bitmap classification. The limits of bitmapping that lead to well-known localization techniques like thermally induced voltage alteration and optical beam induced resistance change are also discussed. The article concludes by providing information...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
... inspection environmental approaches failure mode assessment and assignment material characteristics mechanical approaches nondestructive test approaches optical approaches AFTER THE FAULT-TREE, a failure-cause identification method has identified potential failure causes and the failure analysis...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780177
EISBN: 978-1-62708-281-5
...Abstract Abstract This article is a brief account of various factors pertinent to the characterization of materials and analysis of optical components, namely transmission, haze, yellowness, refractive index, surface irregularity, birefringence, internal contamination, surface gloss, and color...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... – 5.15 ), as well as alloys based on aluminum (2052, 6061, etc.), magnesium (AZ31B, ZE41A, etc.), nickel (IN718, IN625, IN738, etc.), and titanium (Ti-64, CP-Ti, etc.), with optical micrographs of the as-processed coating ( Ref 5.6 – 5.18 ). The coating porosity is determined using the image analysis...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... inclusion rating material characterization microhardness optical emission spectroscopy pearlite banding retained austenite scale thickness scanning electron microscopy X-ray diffraction X-ray fluorescence spectroscopy X-ray photoelectron spectroscopy 5.1 Introduction 5.2 Image Analysis...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2016
DOI: 10.31399/asm.tb.ascaam.t59190147
EISBN: 978-1-62708-296-9
...) Polarization light: Visual contrast in color reveals optical anisotropy of the particular crystals. (d) Differential interference contrast (DIC): Visual contrast in color reveals difference in the height of the particular microregions along z axis. LM, polished cross section Fig. 4.4(a) Selective...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030177
EISBN: 978-1-62708-349-2
.... 10.5 Preformed-particle-modified interlayer regions of various carbon fiber composite materials showing differences in the optical analysis technique and the sample-preparation method. (a) Reflected-light optical analysis of an interlayer region showing particles residing in the interlayer region...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030115
EISBN: 978-1-62708-349-2
... microscopy contrast methods are shown throughout. fiber-reinforced polymeric composites grinding mounting polishing thin-section preparation transmitted-light microscopy The technique that is used to prepare fiber-reinforced composite specimens for optical analysis dictates the information...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110001
EISBN: 978-1-62708-247-1
...’ it around with the help of an air cushion which reduces friction between the wafer and platen, as shown in Figure 7(a) . The air flow is removed and vacuum activated once the die of interest arrives at the position for optical analysis. Since the tester is decoupled from the probe card via the cables...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030193
EISBN: 978-1-62708-349-2
... thermosetting-matrix composite. Transmitted polarized light, full wave plate, 40× objective An optical analysis of the fracture mechanism of another toughened thermosetting-matrix composite after impact is shown in Fig. 11.10 ( a to c ). Figure 11.10(a) shows an area in the composite where...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110244
EISBN: 978-1-62708-247-1
... Microprocessors ,” Proceedings from the 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) , Singapore , ( 1999 ). [7] Paniccia M. et al. , “ Novel Optical Waveform Probing Technique for Flip Chip Packaged Microprocessors ,” Proceedings International...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030067
EISBN: 978-1-62708-349-2
... composite material that also commonly requires optical analysis. This material is thermosetting-resin-based prepregs, which are the precursors to many high-performance composite parts. These types of prepregs are made by preimpregnating continuous fibers or fabric with a controlled volume of uncured...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780141
EISBN: 978-1-62708-268-6
...Abstract Abstract Contaminants can be a cause of numerous types of system failures. There are numerous techniques for confirming contaminant presence. When the presence of a contaminant is suspected, the failure analysis team must find and eliminate the contaminant source, which can be obvious...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110209
EISBN: 978-1-62708-247-1
... and Failure Analysis of Power Transistors ”, Proc. 14th Int’l Symposium for Testing and Failure Analysis (ISTFA) , November 1988 , pp. 63 - 75 . [3] Zissis G. J. , “ Infrared Technology Fundamentals ”, Optical Engineering , Vol. 15 , No. 6 ( 1976 ), pp. 484 - 497 . 10.1117/12.7972032...