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neutron powder diffraction

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420239
EISBN: 978-1-62708-310-2
... the past century electron and neutron diffraction have been developed. Each of the three has its own advantages and limitations. X-ray diffraction is the least costly and can be used in a variety of ways in the establishment of phase diagrams. A simple XRD pattern can be used for phase identification. X...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270019
EISBN: 978-1-62708-301-0
... Magnetic Particle Testing Eddy Current Inspection Radiography Using x-rays, γ-rays, and Neutrons Ultrasonic Inspection In addition to these conventional NDE techniques, there are certain other techniques that are employed under special circumstances. Acoustic Emission Computed Tomography...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... electron microscopy, transmission electron microscopy, electron backscatter diffraction, and electron probe microanalysis are integral to understanding the highly nonequilibrium process that enables the formation of thick adherent coatings via severe plastic deformation of metal powders. Microhardness...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... to light. In general, particles of media such as light, sound, or electromagnetic radiation, including x-rays and gamma rays, when made to fall on small moving particles such as atoms, neutrons, and electrons, give rise to diffraction. Diffraction is the bending and spreading of waves around the obstacles...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230027
EISBN: 978-1-62708-298-3
... of beryllium as a function of the crystallographic orientation in a plane normal to the basal plane. Source: Killpatrick Fig. 4.3 Young’s modulus of various grades of beryllium as a function of temperature. a, pressure sintered; b, cast and cross rolled; c, cast and extruded; d, powder metallurgy...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2015
DOI: 10.31399/asm.tb.cpi2.t55030360
EISBN: 978-1-62708-282-2
.... Charlesworth J.P. and Temple J.A.G. , Engineering Applications of Ultrasonic Time-of-Flight Diffraction , 2nd ed. , Research Studies Press Ltd. , United Kingdom , 2001 27. New Portable Pipe Wall Thickness Measuring Technique , 15th World Conference on Non-Destructive Testing ( Rome...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230131
EISBN: 978-1-62708-298-3
... , Per Kofstad Memorial Symposium , Hou P.Y. et al. , Ed., Honolulu, HI , The Electrochemical Society , 1999 Hauback B.C. , Fjellvag H. , and Maeland A.J. , 1995 . Temperature-Induced Structural Changes in Be2ZrD1.5 Studied by Powder Neutron Diffraction , J. Alloy...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.9781627082587
EISBN: 978-1-62708-258-7
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2015
DOI: 10.31399/asm.tb.piht2.t55050093
EISBN: 978-1-62708-311-9
.... The mechanical methods include the stress relaxation methods of layer removal, cutting, hole drilling, and trepanning that incorporate the use of strain gauges and measurement of the movement of a part as the stressed layers are removed. The physical methods include x-ray diffraction, neutron diffraction...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2015
DOI: 10.31399/asm.tb.piht2.t55050245
EISBN: 978-1-62708-311-9
..., flaws, discontinuities, or scattering processes with the part. Several closely related techniques are used for different purposes. X-ray and sometimes neutron diffraction are used on induction heat treated parts for the determination of residual stresses, as discussed in Chapter 5, “Heat Treating...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230523
EISBN: 978-1-62708-298-3
.../08827509408914114 Aitken E.A. , and Smith J.P. , 1962 . Oxidation of Beryllium Intermetallic Compounds in Moist Atmospheres : J. Nucl. Mater. , Vol 6 , p 119 10.1016/0022-3115(62)90220-9 Akishin P.A. , Spiridonov V.P. , and Sobolev G.A. , 1958 . Electron Diffraction...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.9781627082983
EISBN: 978-1-62708-298-3
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... of thin films; small area diffraction 2–3 nm (SEM mode, in-lens) 5–30 nm (EDS) Samples must be thinned; generally also functions as a transmission electron microscope; allows chemical analysis of particles characterized by transmission electron microscope observation Scanning Auger microscope...
Series: ASM Technical Books
Publisher: ASM International
Published: 30 April 2020
DOI: 10.31399/asm.tb.bpapp.t59290201
EISBN: 978-1-62708-319-5
... Packing and Sintering , J. Am. Ceram. Soc. , Vol 88 , 2002 , p 2449 – 2456 10.1111/j.1151-2916.2002.tb00479.x • Gossens D.J. , Whitfield R.E. , and Studer A.J. , Optimising Sintering in Metal Injection Moulding Using In Situ Neutron Diffraction , Mater. Sci. Forum , Vol 706...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2000
DOI: 10.31399/asm.tb.ttg2.9781627082693
EISBN: 978-1-62708-269-3
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2006
DOI: 10.31399/asm.tb.fdsm.t69870375
EISBN: 978-1-62708-344-7
... to Dislocations , 3rd ed., Pergamon , 1984 A.30 Read W.T. Jr., , Dislocations in Crystals , McGraw-Hill , New York , 1953 A.31 Lang A.R. , Studies of Individual Dislocations in Crystals by X-Ray Diffraction Microradiography , J. Appl. Phys. , Vol 30 , 1959 , p 1748 – 1755...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 1999
DOI: 10.31399/asm.tb.lmcs.9781627082914
EISBN: 978-1-62708-291-4
Series: ASM Technical Books
Publisher: ASM International
Published: 30 April 2021
DOI: 10.31399/asm.tb.tpsfwea.9781627083232
EISBN: 978-1-62708-323-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2006
DOI: 10.31399/asm.tb.fdsm.9781627083447
EISBN: 978-1-62708-344-7