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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090131
EISBN: 978-1-62708-462-8
... Abstract This chapter assesses the potential impact of neural networks on package-level failure analysis, the challenges presented by next-generation semiconductor packages, and the measures that can be taken to maximize FA equipment uptime and throughput. It presents examples showing how...
Image
Published: 01 October 2011
Fig. 51 (a) Indentation curve and (b) creep curves for selection of the data points that are fed into the neural networks (shown as full points or arrows). For this example, an indenter having a spherical radius of 500 μm was used. More
Image
Published: 01 November 2023
Fig. 13 The deep learning high-resolution reconstruction method proposed by Zeiss, which uses a low number of projections and/or shorter exposure time to generate low-noise and high-quality images using a trained neural network. Copyright 2022 IEEE ( Ref 12 ) More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.9781627084628
EISBN: 978-1-62708-462-8
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.htpa.t53310167
EISBN: 978-1-62708-346-1
... to regard the simulation as equivalent to a real test. The model used as a basis should, however, always be critically questioned. First, it is very important to have a network that is optimally adapted to the specific task. As an example, the network for the simulation of a sharp indentation is shown...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090021
EISBN: 978-1-62708-462-8
... to improve image resolution while, at the same time, allow the inspection of a large form factor device for a much shorter period. Reference 12 discusses the use of artificial intelligence (AI) and deep learning high-resolution reconstruction (DLHRR) by implementing trained neural networks to improve...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.htpa.9781627083461
EISBN: 978-1-62708-346-1
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2015
DOI: 10.31399/asm.tb.cpi2.t55030005
EISBN: 978-1-62708-282-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110335
EISBN: 978-1-62708-247-1
... where 3D FIB-SEM tomography has been found essential are mapping neural networks [60] , intricate porous structures [48 , 61] and various structural defects [21 , 61] . 3D acquisition has also been combined with analytical techniques such as EDS or electron backscattered diffraction [21 , 63...
Series: ASM Technical Books
Publisher: ASM International
Published: 30 November 2023
DOI: 10.31399/asm.tb.ciktmse.t56080001
EISBN: 978-1-62708-460-4
Series: ASM Technical Books
Publisher: ASM International
Published: 30 November 2023
DOI: 10.31399/asm.tb.ciktmse.9781627084604
EISBN: 978-1-62708-460-4
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 1997
DOI: 10.31399/asm.tb.wip.t65930085
EISBN: 978-1-62708-359-1
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 30 September 2023
DOI: 10.31399/asm.tb.stmflw.t59390325
EISBN: 978-1-62708-459-8
... or in combination with CAD systems [ 155 , 156 ]. Expert systems, neural networks and artificial intelligence have also been used to speed forging part and die design [ 157 – 162 ]. Strains are related to microstructure evolution, which can also be tracked by computational models [ 163 – 167 ]. While...
Series: ASM Technical Books
Publisher: ASM International
Published: 30 April 2020
DOI: 10.31399/asm.tb.bpapp.t59290201
EISBN: 978-1-62708-319-5
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 30 September 2023
DOI: 10.31399/asm.tb.stmflw.t59390284
EISBN: 978-1-62708-459-8
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 30 September 2023
DOI: 10.31399/asm.tb.stmflw.t59390389
EISBN: 978-1-62708-459-8