1-20 of 190 Search Results for

microscope optimization

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030115
EISBN: 978-1-62708-349-2
..., mounting the first surface on a glass slide, and preparing the second surface (top surface). The optimization of microscope conditions and analysis of specimens by microscopy techniques are also covered. In addition, examples of composite ultrathin sections that are analyzed using transmitted-light...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400109
EISBN: 978-1-62708-258-7
... describes the various parts of the illumination system on most metallurgical microscopes. A later section describes the procedures used to control the illumination system for optimal results. In purchasing a microscope, always select the types of objectives first, then select the eyepieces that match...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
... electron microscope (SEM) design and construction aims at optimizing the ability to capture the desired electrons at the correct detector. Thus, one tries to prevent SEs from reaching the BE detector and BEs from reaching the SE detector (through the physical arrangement of the detectors, for instance...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780305
EISBN: 978-1-62708-281-5
...Abstract Abstract This article discusses the molecular mechanism, environmental criteria, and material optimization of environmental stress crazing (ESC) in glassy thermoplastics, polyethylenes, and nylons. In addition, it provides information on various tests used to determine relative...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110413
EISBN: 978-1-62708-247-1
...Comparison of SEM and Optical Microscopy. Table 1 Comparison of SEM and Optical Microscopy. Technique SEM Optical Microscope Resolution Few nm λ/2 ~ 250 nm Depth of field Large (up to mm) Very shallow (~λ) at high magnification Contrast Material composition, topography...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030089
EISBN: 978-1-62708-349-2
... and thus benefit from an off-centered aperture, these are the exception, not the rule. The back focal plane of the microscope may be observed using an internal Bertrand lens or a phase-focusing telescope so the rays of light can be properly aligned. In addition, the aperture opening must be optimized...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.tb.ahsssta.t53700199
EISBN: 978-1-62708-279-2
... in an average vehicle jumped from 37 kg (82 lb) in 2006 to 79 kg (174 lb) in 2011. Projections show that the use of AHSS in North American light vehicles will double between 2011 and 2020. The ULSAB family of research studies demonstrates that optimized steel body structure design using AHSS produces structures...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780276
EISBN: 978-1-62708-281-5
... electron microscope micrographs of abraded surfaces of composites against 80-grade SiC paper and under 14 N load, and worn surfaces of abraded polyether-imide composites and polyamide 66 unidirectional composites and 66 hybrid composites. abrasive wear adhesive wear reinforced polymers polymer...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110016
EISBN: 978-1-62708-247-1
.... Abstract Abstract Since the introduction of chip scale packages (CSPs) in the early 90s, they have continuously increased their market share due to their advantages of small form factor, cost effectiveness and PCB optimization. The reduced package size brings challenges in performing failure analysis...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.9781627082921
EISBN: 978-1-62708-292-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400087
EISBN: 978-1-62708-258-7
... be separated from the microscopes by a wall and door. Thus, before any equipment is purchased, make sure that the allocated laboratory space is adequate to partition the three areas. The work flow in the laboratory is very important for optimal efficiency. The details of each area are described subsequently...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110262
EISBN: 978-1-62708-247-1
... traditional approaches and practices. In modern FA, it is almost always required to link CAD data to equipment. Common types of FA equipment that interface to CADNav software include Focused Ion Beams (FIB), Scanning Electron Microscopes (SEM), Photon Emission Microscopes (PEM), and Laser Voltage Prober (LVP...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.sap.t53000001
EISBN: 978-1-62708-313-3
... complexity allows the development of a wide range of alloys that can be optimized through processing for specific applications. The need for materials with higher-temperature capability has driven superalloy development to the present level of sophistication. The high level of investment and the complexity...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110524
EISBN: 978-1-62708-247-1
... in the upper quantum well. Fig 25 Photos of the backside of a mesa VCSELs taken by a laser scanning microscope (LSM) using a 1.06um wavelength. Reflected light image (left) shows large mesa with small central area in the middle with oxide aperture where current is confined. Middle and right images...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... magnification optical image of the 3mm diameter membrane coated grid. The location of the sample is indicated by the arrow. (b) High magnification optical image of the TEM sample, placed on the membrane coated grid. Figure 1 An illustration of a transmission electron microscope showing physical...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.tb.aacppa.t51140061
EISBN: 978-1-62708-335-5
... be practically and economically achieved is desirable for optimal properties. Different casting processes and foundry practices result in microstructural differences with relevance to heat treatment practice. Coarser microstructures associated with slow-solidification-rate processes require longer exposure...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400215
EISBN: 978-1-62708-258-7
...-aluminum alloy spangle (Galvalume) on a steel wire. Specimen etched by suspending over fuming nitric acid. 200× Fig. 8.51 Scanning electron microscope micrograph of a similar dendritic spangle shown in Fig. 8.50 . Specimen etched by suspending over fuming nitric acid. 200× Fig. 8.4...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 May 2018
DOI: 10.31399/asm.tb.hma.t59250073
EISBN: 978-1-62708-287-7
.... Cutting tests were performed by tool steel producers and users to optimize the many variables of alloy content, hardening temperatures, methods of cooling from hardening, and post-hardening heat treatments (tempering). Not all of this work was performed with equal competence or similar results. Thus...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220069
EISBN: 978-1-62708-259-4
... describes the steps involved in replicating part surfaces. etchants etching metallographic replication microscopic examination sample preparation Several techniques are used to observe the structure of steels and cast irons in the microscopic scale. For many of these techniques, sampling...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110067
EISBN: 978-1-62708-247-1
... transducer is moved 10 µs out of focus). (D) A TT-SAM image obtained with proper set-up. (E) A TT-SAM image made with the receiver is moved 10 µs away from its optimized placement below the sample. Figure 24 An “interference image” produced by attempted pulse-echo analysis of the die attach...