1-20 of 216 Search Results for

microscope alignment

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030089
EISBN: 978-1-62708-349-2
.... The chapter opens with a discussion of macrophotography and microscope alignment, and then goes on to describe various illumination techniques that are useful for specific analysis requirements. These techniques include bright-field illumination, dark-field illumination, polarized-light microscopy...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110413
EISBN: 978-1-62708-247-1
... Abstract This article provides an overview of how to use the scanning electron microscope (SEM) for imaging integrated circuits. The discussion covers the principles of operation and practical techniques of the SEM. The techniques include sample mounting, sample preparation, sputter coating...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.t56000001
EISBN: 978-1-62708-292-1
... Abstract This chapter discusses the principles of scanning transmission electron microscopy (STEM) as implemented using conventional scanning electron microscopes (SEMs). It describes the pros and cons of low-energy imaging and diffraction, addresses basic hardware requirements, and provides...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.9781627082921
EISBN: 978-1-62708-292-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400109
EISBN: 978-1-62708-258-7
... metallurgical microscope). These components can be roughly divided into having three main functions: the mechanical system, the optical system, and the illumination (light) system. All these systems are supported and aligned by the stand, the structural frame or body of the microscope, as shown in Fig. 5.2...
Image
Published: 01 August 2018
operation (“mirror” element). This special interface can be observed in a high-resolution transmission electron microscope (TEM) image (see Chapter 6, “Metallographic Technique: Electron Microscopy and Other Advanced Techniques,” in this book). There is no orientation condition that allows the formation More
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.t56000020
EISBN: 978-1-62708-292-1
... Abstract This chapter discusses the setup and use of a transmission electron detector in a typical scanning electron microscope (SEM). It describes the arrangement and function of the primary components in the detector, following the signal path from the sample to a micromirror array where...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.tb.ems.t53730051
EISBN: 978-1-62708-283-9
...) Iron, nickel, and cobalt at room temperature always are magnetized, although they may not behave as magnets. The energy is lowered if the magnetic spin of each atom is closely aligned with that of its neighbor. This causes small regions, called domains, in which all of the spins are aligned...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2007
DOI: 10.31399/asm.tb.smnm.t52140021
EISBN: 978-1-62708-264-8
... the various phases. The chapter concludes with a brief review of spheroidized microstructures. electron microscopes grain structure heat treatment microstructure optical microscopes steel THE OPTICAL MICROSCOPE is the principal tool used to characterize the internal grain structure of steels...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090003
EISBN: 978-1-62708-462-8
... in trench isolation and transistor active areas on previous-generation nodes >5 nm have been eliminated by the enhanced design rules that were added to remove any layout non-uniformity. This has affected the alignment of the microscope micrographs with the physical layout, as well as increased electro...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400245
EISBN: 978-1-62708-258-7
... to austenite is completed during heating. Ac4. The temperature at which austenite transforms to delta ferrite during heating. accelerating potential. A relatively high voltage applied between the cathode and anode of an electron gun to accelerate electrons. The source of electrons in the electron microscope...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110603
EISBN: 978-1-62708-247-1
... related damages such as ESD 2 damage or poor workmanship issues. Unlike material characterization (e.g., XRF 3 ) and destructive tests (e.g., decapsulation) that require expensive tools and equipment, visual inspection can be carried out with a light optical microscope, Visual inspection can...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2007
DOI: 10.31399/asm.tb.smnm.t52140165
EISBN: 978-1-62708-264-8
... in the interdendritic regions, which are shown as the area labeled “high impurity level” in Fig. 15.2 . The name microsegregation is used because the segregation spacing is on a microscopic scale, as dictated by the micron-level spacing, d , of the dendrites. The noniron atoms deliberately added to the iron...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.9781627082587
EISBN: 978-1-62708-258-7
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410063
EISBN: 978-1-62708-265-5
... size ( Ref 5.50 ). Each packet, composed of a high density of largely parallel martensitic crystals, is shown in a different color, and although most of the crystals are too fine to be resolved in the light microscope, the general parallel alignment or acicularity of the martensite in the packets...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400023
EISBN: 978-1-62708-258-7
... microstructures in steels and cast irons originate. This is because a key part of a metallographer’s job is to interpret what he or she sees under the microscope and to make sound judgments and recommendations based on these observations. A metallograhper is not just an “iron polisher,” as perceived by many...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110001
EISBN: 978-1-62708-247-1
... to further pinpoint the exact fail location or characterize the defect. The final step involves inspecting the defect using high-resolution scanning electron microscopes and spectroscopy to determine the failure root cause. Although this FA process flow works well in general, it does not differentiate...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850267
EISBN: 978-1-62708-260-0
... Abstract This chapter discusses the tools and techniques of light microscopy and how they are used in the study of materials. It reviews the basic physics of light, the inner workings of light microscopes, and the relationship between resolution and depth of field. It explains the difference...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1985
DOI: 10.31399/asm.tb.sagf.t63420027
EISBN: 978-1-62708-452-9
.... Mechanical Stability All gears within a composite system depend not only on their interaction, but on the action and reaction of every other component within the system. However, before any action or reaction occurs within the unit, each component must be perfectly aligned with its functioning...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030115
EISBN: 978-1-62708-349-2
... are a selection of the rough section, preparation of the rough section for preliminary mounting, grinding and polishing the primary-mount first surface, mounting the first surface on a glass slide, and preparing the second surface (top surface). The optimization of microscope conditions and analysis of specimens...