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microscope alignment

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030089
EISBN: 978-1-62708-349-2
... microscopy technique for the specific analysis objectives with a given composite material. The chapter opens with a discussion of macrophotography and microscope alignment, and then goes on to describe various illumination techniques that are useful for specific analysis requirements. These techniques...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.t56000001
EISBN: 978-1-62708-292-1
...Abstract Abstract This chapter discusses the principles of scanning transmission electron microscopy (STEM) as implemented using conventional scanning electron microscopes (SEMs). It describes the pros and cons of low-energy imaging and diffraction, addresses basic hardware requirements...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110413
EISBN: 978-1-62708-247-1
...Comparison of SEM and Optical Microscopy. Table 1 Comparison of SEM and Optical Microscopy. Technique SEM Optical Microscope Resolution Few nm λ/2 ~ 250 nm Depth of field Large (up to mm) Very shallow (~λ) at high magnification Contrast Material composition, topography...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400109
EISBN: 978-1-62708-258-7
... components are on the inverted metallurgical microscope). These components can be roughly divided into having three main functions: the mechanical system, the optical system, and the illumination (light) system. All these systems are supported and aligned by the stand, the structural frame or body...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.9781627082921
EISBN: 978-1-62708-292-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2007
DOI: 10.31399/asm.tb.smnm.t52140021
EISBN: 978-1-62708-264-8
... the various phases. The chapter concludes with a brief review of spheroidized microstructures. electron microscopes grain structure heat treatment microstructure optical microscopes steel THE OPTICAL MICROSCOPE is the principal tool used to characterize the internal grain structure of steels...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.tb.ems.t53730051
EISBN: 978-1-62708-283-9
... 358 (675) Gadolinium 16 (60) Terbium –40 (–40) Dysprosium –181 (–295) Iron, nickel, and cobalt at room temperature always are magnetized, although they may not behave as magnets. The energy is lowered if the magnetic spin of each atom is closely aligned with that of its neighbor...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110603
EISBN: 978-1-62708-247-1
... induce handling related damage such as ESD if precautions are not taken Tools/Equipment: low power optical macroscope, optical microscope, solvent for marking permanency tests, part datasheet information X-ray inspection Severity: non-destructive, may induce handling related damage such as ESD...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.9781627082587
EISBN: 978-1-62708-258-7
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2007
DOI: 10.31399/asm.tb.smnm.t52140165
EISBN: 978-1-62708-264-8
... particles end up lying in the interdendritic regions, which are shown as the area labeled “high impurity level” in Fig. 15.2 . The name microsegregation is used because the segregation spacing is on a microscopic scale, as dictated by the micron-level spacing, d , of the dendrites. The noniron atoms...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410063
EISBN: 978-1-62708-265-5
... specimen was austenitized and quenched in a hot stage microscope with an argon gas atmosphere. Figure 5.4(a) shows the surface relief associated with the formation of hundreds of martensite crystals. The surface tilting is emphasized in some areas by the dark shadows present on surfaces tilted away from...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400023
EISBN: 978-1-62708-258-7
... Scanning electron microscope (SEM) micrograph of pearlite. 5000× Fig. 2.21 Fine pearlite colonies in an AISI/SAE 1080 steel. 4% picral etch. 500× Fig. 2.23 Pearlite (dark) associated with ferrite (light) in an air-cooled AISI/SAE 1040 steel. 4% picral and 2% nital etch. 800× Fig...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110001
EISBN: 978-1-62708-247-1
... failing nets. Figure 4 Static fault isolation setup on a wafer-level scanning optical microscope. Figure 3 Prober configuration for wafer-level testing and dynamic fault isolation. Figure 16 Transmission electron images showing voiding in (a) second via interconnect (cross...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400169
EISBN: 978-1-62708-258-7
... by a brief rinse in alcohol and immediately dried with a hot-air blast. The surface of the specimen should be examined with a low-power observation microscope to see if all the grinding scratches are removed (the grinding scratches should all be aligned in the same direction). The final polishing step...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780404
EISBN: 978-1-62708-281-5
... of microcracks that spread rapidly throughout the local area. Brittle materials are more prone to stress cracking than to stress whitening. Stress whitening is a generic term describing many different microscopic phenomena that produce a cloudy, foggy, or whitened appearance in transparent or translucent...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030115
EISBN: 978-1-62708-349-2
..., mounting the first surface on a glass slide, and preparing the second surface (top surface). The optimization of microscope conditions and analysis of specimens by microscopy techniques are also covered. In addition, examples of composite ultrathin sections that are analyzed using transmitted-light...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110550
EISBN: 978-1-62708-247-1
... effectively in the TEM requires the sample to be perfectly perpendicular to the beam. When imaging a typical die section, the silicon diffraction pattern can be used to align the sample. When imaging a die bump sample, close inspection of vertical and horizontal edges is required to align the sample...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110153
EISBN: 978-1-62708-247-1
... the alignment of the contour map to the sample in process. The interferometer microscope serves additionally as an inspect tool when in camera mode [51] . Referring back to Figures 33 and 34 , the surface is incompletely polished and will be used to demonstrate the usage of the interferometer...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2015
DOI: 10.31399/asm.tb.piht2.9781627083119
EISBN: 978-1-62708-311-9
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030067
EISBN: 978-1-62708-349-2
...Abstract Abstract The most common methods for preparing polymeric composites for microscopic analysis can be used for most fiber-reinforced composite materials. There are, however, a few composite materials that require special preparation techniques. This chapter discusses the processes...