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microanalysis

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... coatings. The techniques covered are optical microscopy, X-Ray diffraction, scanning electron microscopy, focused ion beam machining, electron probe microanalysis, transmission electron microscopy, and electron backscattered diffraction. The techniques also include electron channeling contrast imaging, X...
Image
Published: 01 March 2012
Fig. 12.11 Light micrograph of 367 °C (693 °F) diffusion couple between pure aluminum and pure magnesium. Electron probe microanalysis (EPMA) was used to identify the β, ε, and γ phases. Source: Ref 12.5 More
Image
Published: 01 June 2016
Fig. 5.16 Representative scanning electron micrographs showing Ni-20Cr coating on AISI 4130 steel substrate interface, (a) as sprayed and (b) after heat treatment. (c, d) Corresponding electron probe microanalysis elemental profiles indicating the interdiffusion of elements at the interface More
Image
Published: 01 December 1999
Fig. 1.9 Composition gradients associated with internal oxidation. (a) Electron probe microanalysis of manganese, chromium, and nickel within the surface zone of 15C4rNi6 steel. Source: Ref 17 . (b) Chromium and manganese concentration gradients beneath the internally oxidized surface More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270146
EISBN: 978-1-62708-301-0
... surface was examined in a SEM. The surface was covered with a deposit, with classical “mud-cracked” regions ( Fig. CH34.3 ). In situ microanalysis of the deposit revealed presence of significant amounts of sulfur ( Fig. CH34.4 ). In some places, deep secondary cracks were seen on the fracture surface...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270074
EISBN: 978-1-62708-301-0
... inside some of the hollow pistons. In situ x-ray microanalysis indicated the slivers contained iron. The interior of the ball-and-socket joint of the piston was cleaned and the residue was collected. The residue contained small copper alloy flakes. Figure CH5.4 shows a SEM of a copper alloy flake...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... versus position. This map provides a method for characterizing chemical inhomogeneities on a spatial resolution scale midway between the ~1 cm (~0.04 in.) range of bulk XRF and the ~1 μm scale of electron probe microanalysis, for example, characterizing segregation patterns in cross-sectioned ingots...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420239
EISBN: 978-1-62708-310-2
... of a sample, creating backscattered electrons, secondary electrons, characteristic X-rays, and Auger electrons, among other signals. Scanning electron microscopes are often coupled with energy-dispersive X-ray microanalysis (EDX), a microanalytical technique that uses the characteristic spectrum of X-rays...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270019
EISBN: 978-1-62708-301-0
...%; accuracy, 2 to 5% X-ray fluorescence analysis: Normally applicable to elements heavier than sodium; accessible range, 0.005 to 10%; accuracy, 2 to 5% Techniques for Local Composition Variations Laser probe microanalysis: Applicable to nearly all elements; accessible range, 0.01 to 100...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 1999
DOI: 10.31399/asm.tb.lmcs.t66560001
EISBN: 978-1-62708-291-4
... present, but the phases themselves cannot be identified positively. Such identification is done indirectly as a result of correlations that have been established throughout the years by positive techniques, such as electron or x-ray diffraction, chemical analysis, electron probe microanalysis...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110335
EISBN: 978-1-62708-247-1
... , Withagen Josephus , Hagen Cornelius , Kruit Pieter , and van Veldhoven Emile . “ Angular Dependence of the Ion-Induced Secondary Electron Emission for He+ and Ga+ Beams. ” Microscopy and Microanalysis 17 , no. 4 ( 2011 ): 624 – 636 . 10.1017/S1431927611000225 [10] Burnett...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... are produced for light elements. The emitted x-rays and Auger electrons have energy that is characteristic of the electron transitions for that atom, and this information can be used for microanalysis. Auger electrons will not be further discussed in this article. Figure 1 Characteristic x-ray...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
... identification capabilities. If these capabilities are not available to the failure analysis team, many commercial laboratories can provide the services. Chemical and materials analysis technologies include energy-dispersive analysis of x-rays, spectrographic techniques (including electron probe microanalysis...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.sap.t53000017
EISBN: 978-1-62708-313-3
... hardening effect in a nickel matrix compared with iron, titanium, cobalt, or vanadium ( Ref 2 ). The influence of the clustering effect has been observed in rhenium-modified CMSX-2 by atom probe microanalysis, showing small rhenium atom clusters of approximately 1 nm in size, which significantly impede...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
... that generate high x-ray intensity for WDS under stable conditions. This was the first equipment able to perform reliable quantitative microanalysis. The second method consists of separating the energies of the x-ray signals that reach the detector using electronic methods. This method is called energy...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410001
EISBN: 978-1-62708-265-5
... J. , Newbury D. E. , Joy D. C. , and Lyman C. E. , Scanning Electron Microscopy and X-ray Microanalysis , Third Edition , Plenum Press , New York , 2007 1.4 Cullity B. D. and Stock D. R. , Elements of X-ray Diffraction , Third Edition , Prentice Hall...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110545
EISBN: 978-1-62708-247-1
... imaging and (c) electroluminescence imaging. These inspections methods help to identify the physical location of a failure site. Once the site is identified then additional microanalysis can be performed if necessary. Introduction Power generation from solar photovoltaics is increasing at a rapid...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.t56000001
EISBN: 978-1-62708-292-1
... in the Transmission Electron Microscope, Ultramicroscopy, Vol 1, 1975, p 97 112. httpsdoi.org/10.1016/S0304-3991(75)80012-X 16. C. Lyman, et al., Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy, Plenum Press, 1990, p 12 17. D.B. Williams and C.B. Carter, Electron Sources...