1-20 of 27 Search Results for

mass spectrometry

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.pnfn.t65900139
EISBN: 978-1-62708-350-8
... zone formation. Emphasis is placed on the effect of sputtering on the kinetics of compound zone formation. The discussion covers the processes involved in process gas control analysis by photo spectrometry and mass spectrometry and the difficulties associated with gas analysis. compound zone...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
...-of-flight secondary ion mass spectrometry; FTIR, Fourier transform infrared (spectroscopy) Comparison summary of scanning electron beam instruments equipped with secondary electron and x-ray detectors Table 2 Comparison summary of scanning electron beam instruments equipped with secondary electron...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
... of x-rays, spectrographic techniques (including electron probe microanalysis, Fourier transform infrared spectroscopy, mass spectrometry, secondary ion mass spectrometry, and Auger analysis), and chromatography. These technologies are described as follows. Energy-Dispersive Analysis of X-Rays...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110335
EISBN: 978-1-62708-247-1
....2015.12.005 [31] Whitby J. A. ,; Östlund F. ,; Horvath P. ,; Gabureac M. ,; Riesterer J. L. ,; Utke I. ,; Hohl M. ,; Sedláček L. ,; Jiruše J. ,; Friedli V. , “ High spatial resolution time-of-flight secondary ion mass spectrometry for the masses...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.9781627082815
EISBN: 978-1-62708-281-5
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780141
EISBN: 978-1-62708-268-6
..., and scanning electron microscopy can reveal the presence of contaminants. Any of the materials analysis technologies (energy-dispersive analysis of x-rays, Fourier transform infrared spectroscopy, spectrometry, chromatography, secondary ion mass spectrometry, and Auger) can be used to identify elements...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
... Assembly and It's Impact on Interfacial integrity ,” in 46th Electronic Components and Technology Conference , Orlando , 1996 . [16] Dong X. , Proctor A. and Hercules D. M. , “ Characterization of Poly(dimethylsiloxane)s by Time-of-Flight Secondary Ion Mass Spectrometry...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
...Properties of analytical techniques including energy dispersive x-ray spectroscope (EDS) in the SEM or STEM (with thin samples), wavelength dispersive x-ray spectroscopy (WDS), Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS, also knows as ESCA), secondary ion mass...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030147
EISBN: 978-1-62708-349-2
..., Measurement of the Distribution of Water in a Graphite Epoxy by Precision Abrasion Mass Spectrometry , Resins for Aerospace , ACS Symposium Series , Vol 132 , Aug 28, 1980 , p 449 – 457 10.1021/bk-1980-0132.ch032 10. Hayes B.S. , Seferis J.C. , and Edwards R.R. , Self-Adhesive...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780159
EISBN: 978-1-62708-281-5
... many standard analytical techniques, including infrared analysis, gas chromatography, mass spectrometry, and ion-selective electrodes. Toxicological studies generally involve the exposure of rats or mice to the gaseous products of decomposition and/or combustion under controlled conditions. Test...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420239
EISBN: 978-1-62708-310-2
... phases present in the reaction zone of diffusion couples can be detected simply using an optical microscope. Different measurement techniques can be used to determine the chemical compositions on both sides of the interfaces. These are Auger electron spectroscopy (AES), secondary ion mass spectrometry...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
... constituents Detection limits from 10 ppb to 1%. Detects all elements from lithium (atomic weight, 7) to uranium (atomic weight, 238) and, with specialized equipment, H, N, O, etc. in metals Requires expensive and specialized equipment. Accuracy ±5% of detected level C.5 Emission/mass spectrometry...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
...) and (c). Figure 2 STEM images of a silicide spike causing junction leakage. (a) High angle annular dark field (HAADF) or mass contrast image from a planar sample and, (b) HAADF and Bright Field (BF) images from a cross-section sample extracted from the planar sample. Figure 6 (a) SEM...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230107
EISBN: 978-1-62708-298-3
...Abstract Abstract This chapter describes the procedures and processes used to chemically analyze beryllium samples. It discusses gravimetric, volumetric, colorimetric, and fluorometric techniques, radiochemical separation and assay, and the use of emission spectrometry and polarographic methods...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780105
EISBN: 978-1-62708-281-5
... distribution (MWD) of polymers. The methods are referred to as gel permeation chromatography (GPC) and high-performance liquid chromatography (HPLC). The analysis of polymers by conventional gas chromagraphy/mass spectrometry is normally not possible because polymers are typically high-molecular-weight...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780146
EISBN: 978-1-62708-281-5
... chemicals in plastics, since the chemical is adsorbed, it can usually be extracted in some way and identified. In some cases, simply heating the plastic will drive off the chemical, which can be collected and fed into a gas chromatograph (GC) or a GC/mass spectrometry (GC/MS) analysis. Sometimes extraction...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... – 1436 10.31399/asm.hb.mhde2.a0003253 4. Jenkins R. , Gould R. , and Gedcke D. , Quantitative X-Ray Spectrometry , Dekker , 1981 , p 16 5. Materials Characterization , Vol 10 , ASM Handbook , ASM International , 1986 10.31399/asm.hb.v10.9781627081788 X-ray...
Series: ASM Technical Books
Publisher: ASM International
Published: 30 April 2020
DOI: 10.31399/asm.tb.bpapp.t59290085
EISBN: 978-1-62708-319-5
... and homogenization of the mixture. Once the critical solids loading is exceeded, the excessive solids loading results in an unstable mixing torque. Fig. 5.10 Conceptual outline of how water immersion is used to measure feedstock density. A sequence of dry and wet mass determinations is used to measure...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1983
DOI: 10.31399/asm.tb.mlt.t62860343
EISBN: 978-1-62708-348-5
... and mass transfer coefficients History of metal Condition of surface Oxide film thickness Specific surface area (cm 2 /g) Total mass of metal Presence of other metals (eutectic formation or thermite reaction possible) Presence of contaminants a m = metal; mo = metal oxide...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.mnm2.9781627082617
EISBN: 978-1-62708-261-7