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machine learning

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Published: 01 November 2023
Fig. 1 Artificial intelligence (AI), machine learning (ML), and deep learning (DL) ( Ref 1 ). More
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Published: 01 November 2023
Fig. 3 Machine Learning vs Deep Learning ( Ref 1 ). More
Image
Published: 01 November 2019
Figure 9 LIT analysis using machine learning algorithms: (A) amplitude image at the fundamental frequency of TRTR data and (B) parametric image of the weighting coefficients of a principal component of the TRTR-data set. Two separated thermal sources can be identified (denoted by the arrows). More
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Published: 01 November 2023
Fig. 2 Traditional programming vs machine learning ( Ref 2 ). More
Series: ASM Technical Books
Publisher: ASM International
Published: 30 November 2023
DOI: 10.31399/asm.tb.ciktmse.t56080001
EISBN: 978-1-62708-460-4
... models, and various methods for characterizing corrosion damage and protective surface films. It also discusses typical applications, industry trends, and the emerging role of high-throughput experimentation, quantitative modeling, and machine learning in the development of cleaner and more effective...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090131
EISBN: 978-1-62708-462-8
... fault isolation machine learning neural networks sample handling stacking tool life Introduction to Packaging Technology The semiconductor industry is now relying on breakthrough innovation and investment in advanced packaging as silicon technology scaling encounters barriers moving forward...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090155
EISBN: 978-1-62708-462-8
... automation and will benefit from machine learning. Better discipline across functional areas and perhaps standardization of design for FA is going to become more critical as the fab-less model continues to grow, having been embraced by the world’s top semiconductor companies in providing and, at the same...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270059
EISBN: 978-1-62708-301-0
... Abstract This chapter discusses some of the ways that the lessons learned from failures have benefitted society, leading to improved product designs, better materials, safer industrial processes, and more robust codes and standards. It also provides several examples of how the technology...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090069
EISBN: 978-1-62708-462-8
... diagnosis analysis is to leverage the volume of scan diagnosis data ( Ref 10 – 12 ). Here, the commonality of scan diagnosis results can be leveraged to expose systematic failure mechanisms, while advanced machine learning algorithms can also be applied to extract valuable root-cause information...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.9781627084628
EISBN: 978-1-62708-462-8
Series: ASM Technical Books
Publisher: ASM International
Published: 30 November 2023
DOI: 10.31399/asm.tb.ciktmse.9781627084604
EISBN: 978-1-62708-460-4
Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2011
DOI: 10.31399/asm.tb.cfw.t52860081
EISBN: 978-1-62708-338-6
... fabrication attempts. The functional requirements of the unit necessitated that the cylindrical body have close tolerance limits. Here, it was found that the thermal stresses imparted during cure at 350 °F (177 °C) resulted in unacceptable warping when the cylinder was machined. Curing at a lower temperature...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.aceg.t68410253
EISBN: 978-1-62708-280-8
.... Analysis of variance, monitoring, and control 2. Process capability study 3. Machining feedback and corrections 4. Ramp up to run multi-­stations in the cell 5. Run at rate confirmation Phase 5. Continuous improvement 1. Things gone right and things gone wrong 2. Lessons learned for future 3. Customer...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180001
EISBN: 978-1-62708-256-3
... a learning platform for personnel from all disciplines: materials, design, manufacturing, quality, and management. Challenges Faced by Failure Analysts Increasingly, failure investigation is becoming a public forum. As evidenced by recent television shows, our society is interested in criminal...
Series: ASM Technical Books
Publisher: ASM International
Published: 30 April 2021
DOI: 10.31399/asm.tb.tpsfwea.t59300001
EISBN: 978-1-62708-323-2
... to make just about everything. This book will define and describe many forms of wear and many processes that are commingled with wear. Wear has been studied since prehistoric times. Early humans learned that foot coverings made from saber-tooth tiger skin lasted longer than those made from the hide...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780141
EISBN: 978-1-62708-268-6
... (including machines and workbenches) can become contaminated and pass the contamination on to other products. People can contaminate products with skin oils, perspiration, breath moisture, or contaminants from other sources when handling products. In cases where the potential for human-transferred...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180029
EISBN: 978-1-62708-256-3
... and latent factors. Failures may also involve multiple parts, entire machines, or processes of any size and shape. The chapter examines the unique aspects of many failures and explains how they can sometimes be traced to systemic issues. It also covers the reasons why products fail, including improper...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.mnm2.t53060001
EISBN: 978-1-62708-261-7
..., was ten times greater on Monday than on Saturday morning. Subsequently, it was learned that maximum properties were obtained with the passage of four or five days. The discovery was accidental—a common occurrence due to the manner in which research was conducted in those days—and Wilm was unable...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.aceg.t68410009
EISBN: 978-1-62708-280-8
... for the application. The product design engineer benefits from this information about the process and alloy options and determines what is the best fit for the function. The casting engineer learns about the part function, quality expectations, and the environment to which the part is exposed. 2.2 Engineering...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110219
EISBN: 978-1-62708-247-1
... signal analysis approaches. While conventional analysis is based on filtering or decomposing transformations, novel approaches based on machine learning algorithms may also be applicable. Currently, ongoing research investigates the application of principal component analysis (PCA) for the separation...