1-20 of 47 Search Results for

low-energy ion-scattering spectroscopy

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... this charging phenomenon, low-energy electrons or a combination of electron and ion floods ( Ref 5 ) may be added to the sample surface. All peaks are then referenced to a peak of known energy, such as carbon, because hydrocarbons are present on most surfaces. This charge correction method allows one to obtain...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... scattered electrons are used to form an image. TEM based elemental analysis techniques utilize X-ray photons in energy dispersive spectroscopy (EDS) [1 - 2] and inelastically scattered electrons or the ‘energy-loss’ electron in electron energy loss spectroscopy (EELS) and Energy-filtered transmission...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... on spectroscopy principles such as optical emission spectroscopy, energy dispersive spectroscopy (EDS), wavelength dispersive spectroscopy, x-ray fluorescence spectroscopy (XRF), and x-ray photoelectron spectroscopy (XPS). Techniques based on diffraction principles such as x-ray diffraction (XRD), electron...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430204
EISBN: 978-1-62708-253-2
... surface showed numerous pits. The morphology of the pit contours was indicative of a tunneling effect ( Fig. 6.69 ). Fig. 6.69 SEM image of the OD surface showing scattered pits with tunneling effect, 1000× Energy dispersive spectroscopy analysis on the outer surface of the tube showed...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
... and emitted x-rays and the methods used to access it, namely wavelength and energy dispersive spectroscopy and electron backscattering diffraction techniques. It also describes the role of focused ion beam milling in sample preparation and provides information on atom probes, atomic force microscopes...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
... of the specimen from the primary beam to measure the inelastically scattered electrons that pass through the specimen. The detector measures the energy loss of the electrons passing through the specimen. The technique is called energy loss spectroscopy, or EELS. From an EELS spectrum, one can detect light...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
... for SEMs and permit simultaneous viewing and chemical analysis of a surface. To detect the elements in extremely thin surface layers, Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), Mössbauer spectroscopy, secondary ion mass spectroscopy (SIMS), low-energy ion-scattering...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... analysis. For example, if a defect is in the top 0.1 micron of the sample surface, it may be best to use low beam energy (> 5 keV) so that the x-rays are mostly from the area of the sample near the defect. This will also reduce the lateral electron scattering in the sample and improve the lateral...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.9781627082921
EISBN: 978-1-62708-292-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.9781627082532
EISBN: 978-1-62708-253-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230361
EISBN: 978-1-62708-298-3
.... The depositing species have relatively moderate energies (on the order of 20 eV). Relatively high energies (on the order of 100 eV) can be obtained with accelerated species such as in ion plating, where only relatively low or moderate deposition rates are attainable. Ion Plating Ion plating is a process...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110413
EISBN: 978-1-62708-247-1
... be improved, especially at low voltage. [2] Beam-Sample Interactions When a primary electron beam enters a sample, the electrons are scattered laterally and gradually lose energy due to collisions with atoms in the sample. The overall result is that the electron energy is deposited in a tear-drop...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780343
EISBN: 978-1-62708-281-5
... Gel permeation chromatography (GPC) Weight-average molecular weight, M ¯ w ; molecular weight distribution, MWD Polymer MWD with soluble polymers Low-angle light scattering M ¯ w , MWD M ¯ w for homopolymers, interactions...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430351
EISBN: 978-1-62708-253-2
... 0.473 4.0 0.10 0.91 0.463 At ID 0.0620 0.930 0.463 Energy dispersive spectroscopy analysis on the inner surface showed the presence of oxygen, aluminum, silicon, chlorine (as chloride), calcium and potassium, whereas EDS on the outer surface revealed carbon, oxygen, magnesium...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2017
DOI: 10.31399/asm.tb.sccmpe2.t55090191
EISBN: 978-1-62708-266-2
..., and data are normalized using reactor operating time (i.e., percentage of components with intergranular cracks divided by months of online exposure). The scatter in Fig. 6.4(a) was attributed to variations influence and specific ion chemistry, as well as to limitations in the resolution of underwater...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... of the scanning electron microscopy (SEM) can be found in several books. However, the key aspects of SEM that distinguish it from other analytical techniques are the depth of field of the equipment and the ability to obtain chemical composition information using energy-dispersive x-ray spectroscopy (EDS...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 30 September 2023
DOI: 10.31399/asm.tb.stmflw.t59390145
EISBN: 978-1-62708-459-8
... ( Fig. 7.2 ). Wire can be drawn in the laboratory, even on a tension testing machine. Thus, low speed wiredrawing has been used for evaluating lubricant substitution and brass rolling emulsions and the order of merit was correctly predicted. Obviously, success must have been due to the very limited aim...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400245
EISBN: 978-1-62708-258-7
... a glazed appearance. Auger electron spectroscopy (AES). A technique for chemical analysis of surface layers that identi es the atoms present in a layer by measuring the characteristic energies of their Auger electrons. ausforming. Hot deformation of metastable austenite within controlled ranges...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230459
EISBN: 978-1-62708-298-3
... oxides that form on the surface of beryllium and their ability to withstand acids, bases, and corrosive agents found in rain and seawater. It explains how carbides, inclusions, ions, and impurities contribute to corrosion damage, particularly pitting, and how corrosion reduces the ductility and fracture...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2017
DOI: 10.31399/asm.tb.sccmpe2.t55090067
EISBN: 978-1-62708-266-2
..., are found to promote the incidence of SCC in such steels. The two commercially important types of steel with yield strengths (i.e., 0.2% proof stress; the term yield strength is used in the engineering sense) greater than 1240 MPa are quenched and tempered low-alloy steels and maraging steels...