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laser microscopy

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Image
Published: 01 November 2019
Figure 44 X-ray radiographic inspection (A) and scanning laser acoustic microscopy (SLAM) (B) of IC packages. More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110042
EISBN: 978-1-62708-247-1
... and concludes with laser microscopy techniques such as thermal induced voltage alteration and external induced voltage alteration. brightfield illumination darkfield illumination failure analysis infrared microscopy laser microscopy optical microscopy solid immersion lenses ultraviolet microscopy...
Image
Published: 01 December 2015
Fig. 5 Conceptual model of biofilm structure as determined by confocal scanning laser microscopy. The metal is shown crosshatched. Note the nearly continuous base film upon which sits a series of cauliflower-like cell clusters separated by voids through which bulk water can flow (arrows More
Image
Published: 01 August 2018
Fig. 8.22 A steel with 0.14% C subjected to a temperature gradient of 4 K/mm and cooled through its solidification range with a rate of 20 K/min. Confocal laser microscopy. Between times (a) t = 0 and (b) t = 1/30 s, corresponding to 1495 °C (2725 °F), the peritectic reaction was completed More
Image
Published: 01 August 2018
Fig. 8.23 A steel with 0.14% C subjected to a temperature gradient of 4 K/mm and cooled through its solidification range with a rate of 10 K/min. Confocal laser microscopy. Between times (a) t = 0 and (b) t = 1/30 s, it is possible to follow the peritectic reaction. At (c) 2/30 s the reaction More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110196
EISBN: 978-1-62708-247-1
... Abstract This article reviews the basic physics behind active photon injection for local photocurrent generation in silicon and thermal laser stimulation along with standard scanning optical microscopy failure analysis tools. The discussion includes several models for understanding the local...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110485
EISBN: 978-1-62708-247-1
... to bright transitions; going from left to right. Scanning Surface Photo Voltage Microscopy (SSPVM) SSPVM is a technique that was developed for the purpose of mapping local mechanical stress in semiconductor devices at the nanometer scale [22 , 23 , 24] . In SSPVM, stimuli are provided using lasers...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090003
EISBN: 978-1-62708-462-8
... Abstract This chapter assesses the capabilities and limitations of electric fault isolation (EFI) technology, the measurement challenges associated with new device architectures, and the pathways for improvement in emission microscopy, laser stimulation, and optical probing. It also assesses...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030089
EISBN: 978-1-62708-349-2
... of microscopy. It is common that thermosetting carbon fiber composites and thermoplastic-matrix composite materials have microcracks that cannot be observed with bright- and dark-field illumination or polarized light ( Fig. 5.10a ). These microcracks can be easily identified with commercially available laser...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220001
EISBN: 978-1-62708-259-4
... 100 nm–1000 µm Scanning electron microscopy Atom force microscopy 1–1000 µm Optical microscopy Confocal laser microscopy 1–1000 mm Macrography 1.5 Chemical Composition of Steels Besides carbon, which is not always a desirable alloying element, many chemical elements may be present...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
..., and laser scanning microscopes. atom probe tomography atomic force microscopy laser scanning confocal microscopy metallography scanning electron microscopy scanning transmission electron microscopy transmission electron microscopy Although optical microscopy is based on the interaction...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110524
EISBN: 978-1-62708-247-1
... Abstract Optoelectronic components can be readily classified as active light-emitting components (such as semiconductor lasers and light emitting diodes), electrically active but non-emitting components, and inactive components. This chapter focuses on the first category, and particularly...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090131
EISBN: 978-1-62708-462-8
... as a fiducial and aids the FA engineer when doing PFA. However, one must ensure the laser mark does not induce any internal damage. For NDT techniques that are sensitive to the silicon die finish, such as CSAM and laser scanning microscopy, laser marking may cause imaging artifacts if they are not done properly...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.9781627084628
EISBN: 978-1-62708-462-8
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090109
EISBN: 978-1-62708-462-8
..., microscopy, FIB circuit edit, and scanning probe microscopy. delayering dopant profiling FIB circuit edit FinFET transistors gate-all-around field-effect transistor nanoprobing sample preparation scanning probe microscopy spatial resolution transmission electron microscopy Introduction...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110550
EISBN: 978-1-62708-247-1
... at the fail location. Photon Emission Microscopy and Laser Stimulation Photon Emission microscopy (PEM) and laser scanning microscopy (LSM) based fault isolation techniques are inhibited by many intrinsic obstacles of advanced packaging form factors. Dies buried in a die stack on 2.5D and 3D designs...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110001
EISBN: 978-1-62708-247-1
... type, common laboratory bench analyzers is sufficient to reveal the anomaly as well. Fault localization (FI) then interrogates the device using localization techniques, typically using photon or laser-based techniques, to isolate possible fail sites. Once the suspected locations are identified...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110153
EISBN: 978-1-62708-247-1
... lapping, laser assisted chemical etch, plasma reactive ion etch, and CNC based milling and polishing. The article discusses the general characteristics, key principles, advantages, and disadvantages of these processes. It also contains case studies that illustrate the application of these processes...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110563
EISBN: 978-1-62708-247-1
... generate particles, generate shocks that can move particles, or cause breakage that will confuse the FA process. Finding the particle through the package is ideal. If the cap over the MEMS is Si and not too heavily doped or too thick, and the particle is big enough, IR confocal scanning laser microscopy...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110244
EISBN: 978-1-62708-247-1
... Abstract Laser Voltage Probing (LVP) is a key enabling technology that has matured into a well-established and essential analytical optical technique that is crucial for observing and evaluating internal circuit activity. This article begins by providing an overview on LVP history and LVP...