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ion-scattering spectroscopy

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Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... Abstract This article covers common techniques for surface characterization, including the modern scanning electron microscopy and methods for the chemical characterization of surfaces by Auger electron spectroscopy, X-ray photoelectron spectroscopy, and time-of-flight secondary ion mass...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... based on focused ion beam milling used for TEM sample preparation. It describes the principles behind commonly used imaging modes in semiconductor failure analysis and how these operation modes can be utilized to selectively maximize signal from specific beam-specimen interactions to generate useful...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... categories into which different material characterization techniques are grouped are ( Ref 5.1 ): Techniques based on microscopy principles such as optical microscopy, scanning electron microscopy (SEM), transmission electron microscopy (TEM), and focused ion beam microscopy. Techniques based...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430204
EISBN: 978-1-62708-253-2
... by reducing the activity of both hydroxyl ions and hydrogen ions (i.e., by maintaining a neutral pH). Boiler tubes also fail due to corrosion in the presence of dissolved oxygen or carbon dioxide, and therefore it is also necessary to control the amount of dissolved oxygen in BFW. Overall low pH...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
... for SEMs and permit simultaneous viewing and chemical analysis of a surface. To detect the elements in extremely thin surface layers, Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), Mössbauer spectroscopy, secondary ion mass spectroscopy (SIMS), low-energy ion-scattering...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
... device. Another thinning technique is called ion milling, or ion bombardment thinning. In this device, a beam of energetic, positively charged ions, such as argon (Ar + ), is used to thin the specimen. The technique is extremely slow but produces a smooth surface without grain-boundary etching or etching...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780343
EISBN: 978-1-62708-281-5
... reflectance (ATR) Surface functional groups Molecular information Nuclear magnetic resonance (NMR) spectroscopy Chemical shift of nuclei Molecular structure, functional group determination, sequence distribution Mass spectroscopy Mass/charge of ions produced Molecular structure X-ray...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
... and emitted x-rays and the methods used to access it, namely wavelength and energy dispersive spectroscopy and electron backscattering diffraction techniques. It also describes the role of focused ion beam milling in sample preparation and provides information on atom probes, atomic force microscopes...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.9781627082921
EISBN: 978-1-62708-292-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.9781627082532
EISBN: 978-1-62708-253-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... (with thin samples), wavelength dispersive x-ray spectroscopy (WDS), Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS, also knows as ESCA), secondary ion mass spectrometry (SIMS), Rutherford backscattering spectrometry (RBS), Fourier transform infrared spectroscopy (FTIR), and total...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... coatings. The techniques covered are optical microscopy, X-Ray diffraction, scanning electron microscopy, focused ion beam machining, electron probe microanalysis, transmission electron microscopy, and electron backscattered diffraction. The techniques also include electron channeling contrast imaging, X...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 30 September 2023
DOI: 10.31399/asm.tb.stmflw.t59390145
EISBN: 978-1-62708-459-8
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230361
EISBN: 978-1-62708-298-3
... Abstract This chapter discusses coating technologies that are applicable to beryllium, including physical and chemical vapor deposition, thermal evaporation, electroplating, sputtering, ion plating, and plasma arc spraying. It describes the advantages and disadvantages of each method...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110413
EISBN: 978-1-62708-247-1
.... Figure 16 SEM cross-section of an integrated circuit following a junction stain. Alternately, a circuit can be delayered from the top-down by plasma etch, wet etch, or planar polishing. Examples of RIE (reactive ion etch) deprocessing and wet chemical deprocessing are shown in Figures 17...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230459
EISBN: 978-1-62708-298-3
... oxides that form on the surface of beryllium and their ability to withstand acids, bases, and corrosive agents found in rain and seawater. It explains how carbides, inclusions, ions, and impurities contribute to corrosion damage, particularly pitting, and how corrosion reduces the ductility and fracture...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430351
EISBN: 978-1-62708-253-2
... the penetration in two locations and the weld pool showed spillage on the ID surface. The improper weld quality forming undercuts and excessive weld projection caused an accumulation of corrodents by the formation of a localized stagnant zone—both at the OD and ID surfaces. The alkali and sulfur ion contaminants...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400245
EISBN: 978-1-62708-258-7
.... A chemical substance that yields hydrogen ions (H ) when dissolved in water. Compare with base. acid embrittlement. A form of hydrogen embrittlement that may be induced in some metals by acid treatment. acid extraction. Removal of phases by dissolution of the matrix metal in an acid or other corrosive...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2017
DOI: 10.31399/asm.tb.sccmpe2.t55090191
EISBN: 978-1-62708-266-2
..., and data are normalized using reactor operating time (i.e., percentage of components with intergranular cracks divided by months of online exposure). The scatter in Fig. 6.4(a) was attributed to variations influence and specific ion chemistry, as well as to limitations in the resolution of underwater...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 1999
DOI: 10.31399/asm.tb.caaa.t67870191
EISBN: 978-1-62708-299-0
... is cut. When necessary, the cathodic component of a couple should be coated. (e) Ion transfer through a fluid can result in galvanic attack of less noble metals. In the example shown at left, copper ions from the copper heater coil could deposit on the aluminum stirrer. A nonmetallic stirrer would...